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1. 发明申请

US20120269385A1 SYSTEMS AND METHODS FOR OBJECT IMAGING 有权
标题翻译：用于对象成像的系统和方法
公开(公告)号：US20120269385A1
公开(公告)日：2012-10-25
申请号：US13091736
申请日：2011-04-21
申请人： Young Kyo Lee , Erik Edmund Magnuson , Yuri Alexeyevich Plotnikov
发明人： Young Kyo Lee , Erik Edmund Magnuson , Yuri Alexeyevich Plotnikov
IPC分类号： G06K9/00
CPC分类号： G06T11/006 , G06T2211/408
摘要： A method for imaging an object is provided. The method includes acquiring tomographic image data of the object at a plurality of frequencies, generating a composite image of the object at each of the plurality of frequencies using the acquired tomographic image data, determining a scaling factor for a first material at each of the plurality of frequencies, determining a scaling factor for a second material at each of the plurality of frequencies, and decomposing the composite images into a first discrete image and a second discrete image using the determined scaling factors, wherein the first discrete image contains any region of the object composed of the first material and the second discrete image contains any region of the object composed of the second material.
摘要翻译：提供了一种用于成像对象的方法。所述方法包括以多个频率获取所述对象的断层图像数据，使用所获取的断层图像数据在所述多个频率中的每个频率处生成所述对象的合成图像，确定所述多个频率中的每一个处的第一材料的缩放因子确定所述多个频率中的每个频率处的第二材料的缩放因子，以及使用所确定的缩放因子将所述合成图像分解成第一离散图像和第二离散图像，其中所述第一离散图像包含所述多个频率的任何区域，由第一材料和第二离散图像组成的物体包含由第二材料组成的物体的任何区域。

2. 发明授权

US06720775B2 Pulsed eddy current two-dimensional sensor array inspection probe and system 有权
标题翻译：脉冲涡流二维传感器阵列检测探头和系统
公开(公告)号：US06720775B2
公开(公告)日：2004-04-13
申请号：US09681824
申请日：2001-06-12
申请人： Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
发明人： Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
IPC分类号： G01R3128
CPC分类号： G01N27/904
摘要： A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
摘要翻译：用于导电部件检查的脉冲涡流二维传感器阵列探针包括邻近被检查结构设置的驱动线圈，连接到驱动线圈的脉冲发生器，可操作以脉冲方式激励驱动线圈传递瞬态电磁焊剂进入被检查的结构，以及布置成二维阵列并且基本上被驱动线圈包围的传感器阵列，可操作以感测和产生来自被检查结构中的瞬态电磁通量的输出信号。

3. 发明申请

US20130261989A1 FLAW DETECTION USING TRANSIENT THERMOGRAPHY 有权
标题翻译：使用瞬态热成像进行FLAW检测
公开(公告)号：US20130261989A1
公开(公告)日：2013-10-03
申请号：US13434607
申请日：2012-03-29
申请人： Yuri Alexeyevich Plotnikov , Harry Israel Ringermacher
发明人： Yuri Alexeyevich Plotnikov , Harry Israel Ringermacher
IPC分类号： G01N25/72 , G01K17/00
CPC分类号： G01N25/72
摘要： A method and system for inspecting an object is provided. In accordance with embodiments of the method, a thermal excitation pulse is applied to an object undergoing evaluation. A transient thermal signal from the object is detected in response to the thermal excitation pulse. Two or more orthogonal functions are applied to the transient thermal signal based on a defined time interval to generate two or more orthogonal components. The object is assessed for defects at different depths using the two or more orthogonal components.
摘要翻译：提供了一种用于检查物体的方法和系统。根据该方法的实施例，将热激励脉冲施加到正在进行评估的对象上。响应于热激发脉冲来检测来自物体的瞬态热信号。基于定义的时间间隔将两个或更多个正交函数应用于瞬态热信号，以产生两个或更多个正交分量。使用两个或更多个正交分量来评估不同深度的缺陷的对象。

4. 发明授权

US07911205B2 Electromagnetic resonance frequency inspection systems and methods 失效
标题翻译：电磁共振频率检测系统及方法
公开(公告)号：US07911205B2
公开(公告)日：2011-03-22
申请号：US11860629
申请日：2007-09-25
申请人： Nilesh Tralshawala , Yuri Alexeyevich Plotnikov
发明人： Nilesh Tralshawala , Yuri Alexeyevich Plotnikov
IPC分类号： G01R33/14 , G01R35/00 , G01N27/72
CPC分类号： G01N27/9046
摘要： A method of inspecting a test part is provided. The method includes positioning a coil on a surface of the test part and exciting the coil at a resonance frequency. The method also includes determining at least one of a resonance frequency shift and a quality factor of the coil and estimating an electrical conductivity of the test part based on at least one of the resonance frequency shift and the quality factor of the coil. The method further includes obtaining depth profile of residual stress using conductivity measurements at various resonance frequencies.
摘要翻译：提供了一种检查测试部件的方法。该方法包括将线圈定位在测试部件的表面上并以共振频率激励线圈。该方法还包括基于谐振频率偏移和线圈的品质因数中的至少一个来确定线圈的谐振频率偏移和品质因数中的至少一个并估计测试部分的电导率。该方法还包括使用各种共振频率下的电导率测量获得残余应力的深度分布。

5. 发明授权

US07389206B2 Inspection systems and methods of operation 有权
标题翻译：检查系统和操作方法
公开(公告)号：US07389206B2
公开(公告)日：2008-06-17
申请号：US11502199
申请日：2006-08-10
申请人： Yuri Alexeyevich Plotnikov
发明人： Yuri Alexeyevich Plotnikov
IPC分类号： G06F15/00
CPC分类号： G01N27/9046
摘要： A method for inspecting an object is provided. The method includes applying a pulsed excitation signal to the object and detecting a transient response signal to the pulsed excitation signal. The method also includes convolving the transient response signal with a plurality of orthogonal functions to generate a plurality of orthogonal components.
摘要翻译：提供了一种用于检查物体的方法。该方法包括将脉冲激励信号施加到对象并检测到脉冲激励信号的瞬态响应信号。该方法还包括用多个正交函数卷积瞬态响应信号以产生多个正交分量。

6. 发明授权

US07154265B2 Eddy current probe and inspection method 失效
公开(公告)号：US07154265B2
公开(公告)日：2006-12-26
申请号：US11019343
申请日：2004-12-21
申请人： Mottito Togo , Changting Wang , Yuri Alexeyevich Plotnikov , Shyamsunder Tondanur Mandayam , William Stewart McKnight , Walter Joseph Bantz , Ui Won Suh
发明人： Mottito Togo , Changting Wang , Yuri Alexeyevich Plotnikov , Shyamsunder Tondanur Mandayam , William Stewart McKnight , Walter Joseph Bantz , Ui Won Suh
IPC分类号： G01N27/90
CPC分类号： G01N27/904 , G01N27/902
摘要： An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

7. 发明授权

US07015690B2 Omnidirectional eddy current probe and inspection system 失效
标题翻译：全向涡流探头和检测系统
公开(公告)号：US07015690B2
公开(公告)日：2006-03-21
申请号：US10856381
申请日：2004-05-27
申请人： Changting Wang , Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , William Stewart McKnight , Gigi Olive Gambrell
发明人： Changting Wang , Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , William Stewart McKnight , Gigi Olive Gambrell
IPC分类号： G01N27/90 , G01N27/72
CPC分类号： G01N27/902 , G01N27/9033 , G01N27/904
摘要： An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
摘要翻译：全向涡流（EC）探针包括至少一个具有第一和第二感测线圈的EC通道，该第一和第二感测线圈在第一（x）和第二（y）方向上偏移并且在至少一个方向（x， y）。至少一个驱动线圈被配置为在感测线圈附近产生用于EC通道的探测场。全方位的EC检测系统包括一个包括多个EC通道和驱动线圈的全向EC阵列探针（ECAP）。每个EC通道包括具有相反极性的第一和第二感测线圈。驱动线圈具有交替极性。电气连接对相应的EC通道执行差分感测。纠正驱动线圈设置在EC通道的相应末端并产生探测场。涡流仪器连接到全向ECAP，并从EC通道接收差分感测信号。

8. 发明授权

US08436608B2 Eddy current inspection system and method 有权
标题翻译：涡流检测系统及方法
公开(公告)号：US08436608B2
公开(公告)日：2013-05-07
申请号：US12563403
申请日：2009-09-21
申请人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
发明人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
IPC分类号： G01N27/82 , G01R33/14 , G01R33/00
CPC分类号： G01N27/904
摘要： A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
摘要翻译：提供多频涡流（MFEC）检测系统，用于检查零件上的表面硬化深度。 MFEC检查系统包括被配置为产生一个或多个多频激励信号的发生器和被配置为设置在该部分的一侧的涡流探针。涡流探头包括一个或多个驱动器和一个或多个拾取传感器。一个或多个驱动器被配置为接收一个或多个多频率激励信号以在该部分中引起涡流。一个或多个拾取传感器被配置为检测部件的局部区域内的感应涡流以产生一个或多个多频响应信号。 MFEC系统还包括处理器，其被配置为接收一个或多个多频响应信号以进行处理以确定部件的局部区域的壳体硬化深度。还提出了脉冲涡流检测系统和涡流检测方法。

9. 发明申请

US20130106409A1 EDDY CURRENT ARRAY PROBE 有权
标题翻译： EDDY电流阵列探头
公开(公告)号：US20130106409A1
公开(公告)日：2013-05-02
申请号：US13286010
申请日：2011-10-31
申请人： Changting Wang , Yuri Alexeyevich Plotnikov , Mandar Diwakar Godbole , Aparna Chakrapani Sheila-Vadde
发明人： Changting Wang , Yuri Alexeyevich Plotnikov , Mandar Diwakar Godbole , Aparna Chakrapani Sheila-Vadde
IPC分类号： G01R33/12
CPC分类号： G01R33/028
摘要： Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.
摘要翻译：现有实施例包括具有能够检测测试样本中的长和短缺陷的差分线圈的涡流阵列探头，以及附加地或替代地，复用的驱动线圈。例如，涡流阵列探头可以包括布置在第一行中的第一组多个涡流通道和设置在第二排中的第二多个涡流通道。第一多个和第二多个涡流通道在第一方向上重叠，但在第二方向上不重叠。探头还包括靠近第一多个涡流通道和第二多个涡流通道设置的半圆形驱动线圈，并被配置为为涡流通道的每个感测线圈产生探测磁场。

10. 发明申请

US20110068784A1 EDDY CURRENT INSPECTION SYSTEM AND METHOD 有权
标题翻译： EDDY电流检测系统和方法
公开(公告)号：US20110068784A1
公开(公告)日：2011-03-24
申请号：US12563403
申请日：2009-09-21
申请人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
发明人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
IPC分类号： G01R33/06 , G01R1/06 , G01R33/00
CPC分类号： G01N27/904
摘要： A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
摘要翻译：提供多频涡流（MFEC）检测系统，用于检查零件上的表面硬化深度。 MFEC检查系统包括被配置为产生一个或多个多频激励信号的发生器和被配置为设置在该部分的一侧的涡流探针。涡流探头包括一个或多个驱动器和一个或多个拾取传感器。一个或多个驱动器被配置为接收一个或多个多频率激励信号以在该部分中引起涡流。一个或多个拾取传感器被配置为检测部件的局部区域内的感应涡流以产生一个或多个多频响应信号。 MFEC系统还包括处理器，其被配置为接收一个或多个多频响应信号以进行处理以确定部件的局部区域的壳体硬化深度。还提出了脉冲涡流检测系统和涡流检测方法。

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