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    • 2. 发明授权
    • High voltage lateral enhancement IGFET
    • 高电压横向增强IGFET
    • US5229633A
    • 1993-07-20
    • US822492
    • 1992-01-17
    • Carole A. FisherDavid H. PaxmanPhilip H. Bird
    • Carole A. FisherDavid H. PaxmanPhilip H. Bird
    • H01L21/8234H01L21/8236H01L27/07H01L27/088H01L29/06H01L29/423H01L29/78
    • H01L29/7802H01L21/31111H01L21/31144H01L21/32137H01L21/8234H01L21/8236H01L27/0727H01L27/0883H01L29/063H01L29/1095H01L29/66681H01L29/7801H01L29/7821H01L29/7823H01L29/7838H01L29/402H01L29/41741H01L29/42368
    • A method of manufacturing a semiconductor device including both an enhancement (1) insulated gate field effect transistor (IGFET) and a depletion (2) mode IGFET is described. Impurities are introduced into a first region or epitaxial layer (4) of one conductivity type adjacent a given surface (3a) of a semiconductor body (3) to provide, for both the enhancement mode (1) and for the depletion mode (2) IGFET, a second region (5) of the opposite conductivity type adjacent the given surface, a source region (9) of a first conductivity type adjacent the given surface (3a) and surrounded by the second region (5) and a drain region (10) of the first conductivity type having a relatively lightly doped drain extension region (11) adjacent the given surface and extending toward the source region (9). First and second insulated gates (12) are provided on first and second areas (31a) and (31b), respectively, of the given surface to provide a respective gate connection between each source region and the associated drain region (10). The relative doses of impurities introduced to provide the second regions (5) and the relatively lightly doped drain extensions (11) received by the first area (31a) and the second area (31b) are independently controlled so as to provide adjacent the first area (31a) a channel area (13) of a second conductivity type and adjacent the second area (31b) a channel area (13') of the first conductivity type.
    • 描述了包括增强(1)绝缘栅场效应晶体管(IGFET)和耗尽(2)模式IGFET两者的半导体器件的制造方法。 杂质被引入到与半导体本体(3)的给定表面(3a)相邻的一种导电类型的第一区域或外延层(4)中,以为增强模式(1)和耗尽模式(2)提供两者, IGFET是与给定表面相邻的相反导电类型的第二区域(5),与给定表面(3a)相邻并被第二区域(5)包围的第一导电类型的源极区域(9)和漏极区域 10),其具有与给定表面相邻并且朝向源极区域(9)延伸的相对轻掺杂的漏极延伸区域(11)。 第一和第二绝缘栅极(12)分别设置在给定表面的第一和第二区域(31a)和(31b)上,以在每个源极区域和相关联的漏极区域(10)之间提供相应的栅极连接。 导入以提供由第一区域(31a)和第二区域(31b)接收的第二区域(5)和相对轻掺杂的漏极延伸部分(11)的杂质的相对剂量被独立地控制,以便邻近第一区域 (31a)具有第二导电类型的沟道区域(13)并且邻近所述第二区域(31b)具有所述第一导电类型的沟道区域(13')。
    • 4. 发明授权
    • Motor speed control system
    • 电机调速系统
    • US4771223A
    • 1988-09-13
    • US40910
    • 1987-04-21
    • Desmond R. ArmstrongPhilip H. Bird
    • Desmond R. ArmstrongPhilip H. Bird
    • H02P25/04H02P23/00H02P25/14H02P27/02H02P5/40
    • H02P25/145H02P23/0077Y10S388/912
    • A speed control system for an a.c. electric motor (1) comprises a microcomputer (6) having an interrupt signal input (INT/TO) to which is coupled the outputs of a detector (10) for detecting zero-crossings of the a.c. supply voltage and a tachogenerator (11) driven by the motor. The microcomputer supplies firing pulses to a triac (2), connected in series with the motor, in response to an overflow of a clocked counter (CT). This counter is suitably preloaded at each zero-crossing. The counter is read each time a tachogenerator pulse occurs and the time which this reading indicates has elapsed since the immediately preceding zero-crossing is stored. A record is also kept in a register (ZCSLTA) of how many zero-crossings occur between each tachogenerator pulse and the next and from this, and the stored times relating to the relevant pulses, the period of the tachogenerator pulses and hence the actual speed of the motor is calculated. The preloading value for the counter is calculated from this and the required speed.
    • 一种速度控制系统。 电动机(1)包括具有中断信号输入(INT / TO)的微计算机(6),耦合到检测器(10)的输出端,用于检测交流的过零点。 电源电压和由电机驱动的测速发电机(11)。 微计算机响应时钟计数器(CT)的溢出,向与电动机串联连接的三端双向可控硅开关元件(2)提供点火脉冲。 该计数器在每个过零点处适当预加载。 每当发生测速发电机脉冲并且从紧接在前的过零点开始经过该读取指示的时间之后,读取计数器。 记录也保存在一个登记册(ZCSLTA)中,每个测速发电机脉冲和下一个测速发生器脉冲之间发生多少过零点,以及与相关脉冲相关的存储时间,测速发电机脉冲的周期以及因此的实际速度 的电机计算。 计数器的预加载值由此和所需速度计算。
    • 5. 发明授权
    • Duo-binary and/or binary data slicer
    • 二进制和/或二进制数据切片器
    • US5289278A
    • 1994-02-22
    • US838049
    • 1992-02-19
    • Philip H. Bird
    • Philip H. Bird
    • H03K5/08H04N7/083H04N7/08
    • H03K5/084H03K5/082H04N7/083
    • A duo-binary and/or binary data slicer has a data input (10) coupled via a capacitor (C1) to a d.c. restoring circuit (A2 to Q6 and Q9 to Q13) d.c. reference level is superimposed on the data signal. A sample and hold circuit (C2, Q15 to Q22) is arranged to sample the data signal and provide a voltage related to the upper and lower peak value. A divider (R16-R19) is coupled between the d.c. reference level and the voltage related to the upper and lower peak value and provides intermediate output voltages (DU, DL, B) relating to duo-binary and/or binary level for determining the slicing levels.
    • 二进制和/或二进制数据限幅器具有经由电容器(C1)耦合到直流电的数据输入端(10)。 恢复电路(A2至Q6和Q9至Q13)d.c. 参考电平叠加在数据信号上。 采样和保持电路(C2,Q15至Q22)被布置为对数据信号进行采样并提供与上下峰值相关的电压。 分频器(R16-R19)耦合在直流电源 参考电平和与上下峰值相关的电压,并提供与二进制和/或二进制电平相关的中间输出电压(DU,DL,B)以确定限幅电平。