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    • 1. 发明授权
    • Phase-changeable memory device and read method thereof
    • 相变存储器件及其读取方法
    • US07391644B2
    • 2008-06-24
    • US11605212
    • 2006-11-29
    • Woo-Yeong ChoByung-Gil ChoiDu-Eung KimHyung-Rok OhBeak-Hyung ChoYu-Hwan Ro
    • Woo-Yeong ChoByung-Gil ChoiDu-Eung KimHyung-Rok OhBeak-Hyung ChoYu-Hwan Ro
    • G11C11/00
    • G11C8/10G11C13/0004G11C13/004G11C2013/0054G11C2213/72
    • Disclosed is a phase-changeable memory device and a related method of reading data. The memory device is comprised of memory cells, a high voltage circuit, a precharging circuit, a bias circuit, and a sense amplifier. Each memory cell includes a phase-changeable material and a diode connected to a bitline. The high voltage circuit provides a high voltage from a power source. The precharging circuit raises the bitline up to the high voltage after charging the bitline up to the power source voltage. The bias circuit supplies a read current to the bitline by means of the high voltage. The sense amplifier compares a voltage of the bitline with a reference voltage by means of the high voltage, and reads data from the memory cell. The memory device is able to reduce the burden on the high voltage circuit during the precharging operation, thus assuring a sufficient sensing margin during the sensing operation.
    • 公开了一种可变相存储器件和读取数据的相关方法。 存储器件包括存储器单元,高压电路,预充电电路,偏置电路和读出放大器。 每个存储单元包括相位可变材料和连接到位线的二极管。 高压电路从电源提供高电压。 预充电电路将位线充电至电源电压后,将位线升高至高电压。 偏置电路通过高电压向位线提供读取电流。 读出放大器通过高电压将位线的电压与参考电压进行比较,并从存储单元读取数据。 存储器件能够减少在预充电操作期间对高压电路的负担,从而在感测操作期间确保足够的感测余量。
    • 5. 发明申请
    • Phase-changeable memory device and read method thereof
    • 相变存储器件及其读取方法
    • US20070133271A1
    • 2007-06-14
    • US11605212
    • 2006-11-29
    • Woo-Yeong ChoByung-Gil ChoiDu-Eung KimHyung-Rok OhBeak-Hyung ChoYu-Hwan Ro
    • Woo-Yeong ChoByung-Gil ChoiDu-Eung KimHyung-Rok OhBeak-Hyung ChoYu-Hwan Ro
    • G11C11/00
    • G11C8/10G11C13/0004G11C13/004G11C2013/0054G11C2213/72
    • Disclosed is a phase-changeable memory device and a related method of reading data. The memory device is comprised of memory cells, a high voltage circuit, a precharging circuit, a bias circuit, and a sense amplifier. Each memory cell includes a phase-changeable material and a diode connected to a bitline. The high voltage circuit provides a high voltage from a power source. The precharging circuit raises the bitline up to the high voltage after charging the bitline up to the power source voltage. The bias circuit supplies a read current to the bitline by means of the high voltage. The sense amplifier compares a voltage of the bitline with a reference voltage by means of the high voltage, and reads data from the memory cell. The memory device is able to reduce the burden on the high voltage circuit during the precharging operation, thus assuring a sufficient sensing margin during the sensing operation.
    • 公开了一种可变相存储器件和读取数据的相关方法。 存储器件包括存储器单元,高压电路,预充电电路,偏置电路和读出放大器。 每个存储单元包括相位可变材料和连接到位线的二极管。 高压电路从电源提供高电压。 预充电电路将位线充电至电源电压后,将位线升高至高电压。 偏置电路通过高电压向位线提供读取电流。 读出放大器通过高电压将位线的电压与参考电压进行比较,并从存储单元读取数据。 存储器件能够减少在预充电操作期间对高压电路的负担,从而在感测操作期间确保足够的感测余量。