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    • 3. 发明授权
    • Differential circuits with adjustable propagation timing
    • 差分电路具有可调传播时间
    • US5999028A
    • 1999-12-07
    • US995886
    • 1997-12-22
    • Ulrich KnochThorsten KruegerBarbara DuffnerRonnie OwensCharles Moore
    • Ulrich KnochThorsten KruegerBarbara DuffnerRonnie OwensCharles Moore
    • H03K19/0944H03F3/45H03K5/24H03K5/12G06G7/10
    • H03F3/45771H03F3/45479H03K5/2481H03F2203/45624H03F2203/45646H03F2203/45702
    • Described is a circuit for receiving a differential input signal at two substantially symmetrically built up current paths and for providing an output signal therefrom. At least one current path comprises means for adjusting the timing information of the input signal to the timing information of the output signal. The adjustment can be accomplished by modifying a voltage level in the respective current path until the timing information of the output signals at least substantially represents the timing information of the input signal, e.g. by modifying an impedance or a current in the respective current path. The adjusting of the timing information is executed by applying a defined input signal with a known timing information, comparing the timing information of the resulting output signal with the timing information of the input signal, and modifying at least one voltage level in at least one of the current paths until the timing information of the output and input signals at least substantially match.
    • 描述了一种用于在两个基本上对称构建的电流路径处接收差分输入信号并用于从其提供输出信号的电路。 至少一个电流路径包括用于将输入信号的定时信息调整为输出信号的定时信息的装置。 可以通过修改相应电流路径中的电压电平来实现调整,直到输出信号的定时信息至少基本上表示输入信号的定时信息,例如, 通过修改各个电流路径中的阻抗或电流。 通过用已知的定时信息应用定义的输入信号来执行定时信息的调整,将所得到的输出信号的定时信息与输入信号的定时信息进行比较,并修改至少一个电压电平 直到输出和输入信号的定时信息至少基本匹配的电流路径。
    • 6. 发明授权
    • Testing unit with testing information divided into redundancy-free
information and redundancy information
    • 具有测试信息的测试单元分为无冗余信息和冗余信息
    • US06065144A
    • 2000-05-16
    • US42442
    • 1998-03-13
    • Ulrich Knoch
    • Ulrich Knoch
    • G01R31/3183G01R31/00G01R31/319G01R31/28
    • G01R31/31921
    • A circuit for applying a testing data to a DUT for testing the DUT comprises a buffer memory for receiving and buffering a redundancy-free information as information which is substantially free of redundancy but might also comprise some redundant information to a certain extent, a redundancy memory for storing a redundancy information as information comprising a certain amount of redundancy, and a processing unit for generating the testing data by processing the redundancy-free information in association with the redundancy information. Further, includes a method for applying a testing data to the DUT for testing the DUT includes the steps of receiving and buffering the redundancy-free information, fetching in accordance with the received redundancy-free information the redundancy information, and generating the testing data by processing the redundancy-free information in association with the redundancy information.
    • 用于将测试数据应用于DUT的用于测试DUT的电路包括缓冲存储器,用于接收和缓冲无冗余信息,作为基本上不存在冗余的信息,但也可能在一定程度上包括一些冗余信息,冗余存储器 用于存储冗余信息作为包括一定量的冗余度的信息;以及处理单元,用于通过与冗余信息相关联地处理无冗余信息来生成测试数据。 此外,还包括将测试数据应用于被测试用于测试DUT的方法,包括接收和缓冲无冗余信息的步骤,根据接收的无冗余信息取出冗余信息,并通过以下步骤生成测试数据: 处理与冗余信息相关联的无冗余信息。