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    • 1. 发明授权
    • Stage control with reduced synchronization error and settling time
    • 减少同步误差和稳定时间的舞台控制
    • US06260282B1
    • 2001-07-17
    • US09049801
    • 1998-03-27
    • Bausan YuanSusumu MakinouchiHideyaki Hashimoto
    • Bausan YuanSusumu MakinouchiHideyaki Hashimoto
    • H01L2168
    • G03F7/70358G03F7/70725
    • A positioning system used, by way of example, for lithography, uses the position of the wafer stage as the trajectory command for the reticle fine stage control circuit. The reticle fine stage position is combined with the position of the wafer stage to generate a synchronous error. The reticle fine stage control circuit uses a Jacobian differential transformation to convert the synchronous error into an positional error for the center of gravity of the reticle fine stage. Thus, any inaccuracies due to measurement errors caused by rotation of reticle fine stage are avoided. A controller filter circuit uses the positional error for the center of gravity to calculate the force on the center of gravity that will minimize the synchronous error. The controller filter circuit includes saturation limited integration behavior that minimizes the settling time. A feedforward loop also generates a feedforward force, which reduces settling time, and is combined with the force signal from the controller filter. A force coordinate transformation circuit receives the summed forces and calculates the forces to be generated by the actuators connected to reticle fine stage that will drive reticle fine stage to the desired position to reduce the synchronous error.
    • 作为示例,用于光刻的定位系统使用晶片台的位置作为标线片精细级控制电路的轨迹指令。 标线片精细位置与晶片台的位置相结合以产生同步误差。 光栅精细级控制电路使用雅可比差分变换将同步误差转换为光罩精细级的重心的位置误差。 因此,避免了由于光罩精细台的旋转引起的测量误差导致的任何不准确。 控制器滤波器电路使用重心的位置误差来计算重心的力,这将使同步误差最小化。 控制器滤波器电路包括使稳定时间最小化的饱和有限积分行为。 前馈回路还产生一个前馈力,这减少了建立时间,并与来自控制器滤波器的力信号相结合。 力坐标变换电路接收累加力并计算由连接到标线片精细台的致动器产生的力,该致动器能将光栅精细级驱动到所需位置以减小同步误差。
    • 8. 发明授权
    • Exposure apparatus
    • 曝光装置
    • US5907392A
    • 1999-05-25
    • US682992
    • 1996-07-18
    • Susumu Makinouchi
    • Susumu Makinouchi
    • G03B27/42G03F7/20G01N21/86
    • G03F7/70358G03B27/42G03F7/70725G03F7/70775
    • A scanning type exposure apparatus includes a mask stage position-measuring unite a substrate stage position-measuring unit, an arithmetic processing unit, and a control unit. The arithmetic processing unit multiplies results of measurement (WX, WY, W.theta.) by the substrate position-measuring unit by a conversion vector including components containing a magnification of a projection optical system and an angle of rotation between a mask and a substrate to determine a target vector quantity (RX*, RY*, R.theta.*) of a mask stage. An error vector is determined by subtracting, from the target vector quantity, results of measurement (RX, RY, R.theta.) by the mask stage position-measuring unit. The controller controls the mask stage so that the error vector becomes zero. The exposure apparatus includes correcting sections for correcting time lags in measurement by the respective position-measuring units. The arithmetic processing unit uses corrected positional information. The mask stage can accurately follow a substrate stage.
    • 扫描型曝光装置包括掩模台位置测量,联合基板台位置测量单元,运算处理单元和控制单元。 算术处理单元通过包括投影光学系统的放大率和掩模与基板之间的旋转角度的分量的转换矢量将测量结果(WX,WY,Wθ)相乘,以确定 掩模台的目标矢量(RX *,RY *,Rθ*)。 通过从掩模台位置测量单元从目标矢量量中减去测量结果(RX,RY,Rθ)来确定误差向量。 控制器控制掩模级,使得误差向量变为零。 曝光装置包括用于通过各个位置测量单元来校正测量中的时间滞后的校正部分。 算术处理单元使用校正的位置信息。 掩模阶段可以准确地跟随衬底阶段。
    • 9. 发明授权
    • Projection optical apparatus
    • 投影光学仪器
    • US4801977A
    • 1989-01-31
    • US198688
    • 1988-05-24
    • Shoji IshizakaHideo MizutaniSusumu MakinouchiAkikazu Tanimoto
    • Shoji IshizakaHideo MizutaniSusumu MakinouchiAkikazu Tanimoto
    • H01L21/30G03F7/20H01L21/027G03B27/52G03B27/74G03B27/80
    • G03F7/706G03F7/70241G03F7/70858G03F7/70883
    • A projection optical apparatus comprises a projection optical system for projecting the image of an object onto a substrate, data collecting means for obtaining data regarding a factor which causes a variation in the optical characteristic of the projection optical system, adjusting means for adjusting the relation between the substrate and the image of the object relative to the variation in the optical characteristic of the projection optical system, means for determining the amount of adjustment by the adjusting means in accordance with a model formula using a predetermined parameter on the basis of the data obtained by the data collecting means, means for independently measuring the variation in the optical characteristic of the projection optical system, and means for correcting the parameter of the model formula on the basis of the result measured by the measuring means.
    • 投影光学装置包括用于将物体的图像投影到基板上的投影光学系统,用于获得关于引起投影光学系统的光学特性变化的因素的数据的数据收集装置,用于调整投影光学系统的光学特性之间的关系的调整装置 基板和物体相对于投影光学系统的光学特性的变化的图像,用于根据获得的数据使用预定参数根据模型公式确定调节装置的调整量的装置 通过数据采集装置,用于独立地测量投影光学系统的光学特性的变化的装置,以及用于基于由测量装置测量的结果来校正模型公式的参数的装置。