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1. 发明授权

US09095291B2 Spectroscopic sensors 有权
标题翻译：光谱传感器
公开(公告)号：US09095291B2
公开(公告)日：2015-08-04
申请号：US13057617
申请日：2009-08-07
申请人： Babs R. Soller , John Coates , Ye Yang , Chunguang Jin
发明人： Babs R. Soller , John Coates , Ye Yang , Chunguang Jin
IPC分类号： A61B5/1455 , A61B5/145 , A61B5/00
CPC分类号： A61B5/1455 , A61B5/0082 , A61B5/145 , A61B5/14539 , A61B5/14552 , A61B5/412 , A61B5/6801 , A61B2562/0233 , A61B2562/0238 , A61B2562/0242 , A61B2562/04 , A61B2562/046
摘要： Disclosed herein are sensors that include: (a) a circuit board that includes an electronic processor; (b) a plurality of radiation sources, each source being attached to the circuit board; and (c) a spectral detector attached to the circuit board, the spectral detector being configured to analyze radiation derived from one or more of the plurality of radiation sources. During use, the sensors are configured to be worn on a portion of a body of a subject. The electronic processor is configured to cause two or more of the plurality of radiation sources to direct incident radiation to the subject, to cause the spectral detector to analyze radiation from the subject, and to determine one or more properties of the subject based on the radiation from the subject. Methods of making and using these sensors are also disclosed.
摘要翻译：这里公开的传感器包括：（a）包括电子处理器的电路板; （b）多个辐射源，每个源连接到电路板; 和（c）附着到电路板的光谱检测器，所述光谱检测器被配置为分析从多个辐射源中的一个或多个发射的辐射。在使用期间，传感器被配置成佩戴在被检体的身体的一部分上。电子处理器被配置为使得多个辐射源中的两个或更多个辐射源将入射辐射引导到对象，以使得光谱检测器分析来自对象的辐射，并且基于辐射来确定对象的一个或多个属性从主题。还公开了制造和使用这些传感器的方法。

2. 发明申请

US20110205535A1 SPECTROSCOPIC SENSORS 有权
标题翻译：光谱传感器
公开(公告)号：US20110205535A1
公开(公告)日：2011-08-25
申请号：US13057617
申请日：2009-08-07
申请人： Babs R. Soller , John Coates , Ye Yang , Chunguang Jin
发明人： Babs R. Soller , John Coates , Ye Yang , Chunguang Jin
IPC分类号： G01J3/42
CPC分类号： A61B5/1455 , A61B5/0082 , A61B5/145 , A61B5/14539 , A61B5/14552 , A61B5/412 , A61B5/6801 , A61B2562/0233 , A61B2562/0238 , A61B2562/0242 , A61B2562/04 , A61B2562/046
摘要： Disclosed herein are sensors that include: (a) a circuit board that includes an electronic processor; (b) a plurality of radiation sources, each source being attached to the circuit board; and (c) a spectral detector attached to the circuit board, the spectral detector being configured to analyze radiation derived from one or more of the plurality of radiation sources. During use, the sensors are configured to be worn on a portion of a body of a subject. The electronic processor is configured to cause two or more of the plurality of radiation sources to direct incident radiation to the subject, to cause the spectral detector to analyze radiation from the subject, and to determine one or more properties of the subject based on the radiation from the subject. Methods of making and using these sensors are also disclosed.
摘要翻译：这里公开的传感器包括：（a）包括电子处理器的电路板; （b）多个辐射源，每个源连接到电路板; 和（c）附着到电路板的光谱检测器，所述光谱检测器被配置为分析从多个辐射源中的一个或多个发射的辐射。在使用期间，传感器被配置成佩戴在被检体的身体的一部分上。电子处理器被配置为使得多个辐射源中的两个或更多个辐射源将入射辐射引导到对象，以使得光谱检测器分析来自对象的辐射，并且基于辐射来确定对象的一个或多个属性从主题。还公开了制造和使用这些传感器的方法。

3. 发明申请

US20110264411A1 SYSTEMS AND METHODS FOR CORRECTING OPTICAL REFLECTANCE MEASUREMENTS 有权
标题翻译：用于校正光学反射测量的系统和方法
公开(公告)号：US20110264411A1
公开(公告)日：2011-10-27
申请号：US13021065
申请日：2011-02-04
申请人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
发明人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
IPC分类号： G06F15/00
CPC分类号： G01N21/25 , A61B5/0075 , A61B5/14535 , A61B5/14539 , A61B5/14546 , A61B5/1455 , A61B5/14551 , A61B5/6824 , G01N21/274 , G01N21/359 , G01N21/49 , G01N21/55 , G01N21/59 , G01N2021/3155
摘要： We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.
摘要翻译：我们公开了测量系统和方法，用于测量样品目标区域中的分析物，还包括覆盖目标区域的特征。系统包括：（a）光源; （b）检测系统; （c）一组至少第一，第二和第三光端口，其将来自光源的光透射到样品并且将从样品反射的光接收并引导到检测系统，生成第一组数据，其包括对应于样本内的内部目标和覆盖内部目标的特征，以及包括对应于覆盖内部目标的特征的信息的第二组数据; 以及（d）处理器，被配置为使用所述第一和第二组数据从所述第一组数据中去除所述上覆特征的信息特征，以产生表示所述内部目标的校正信息。

4. 发明授权

US09057689B2 Methods and systems for analyte measurement 有权
标题翻译：分析物测量的方法和系统
公开(公告)号：US09057689B2
公开(公告)日：2015-06-16
申请号：US13011113
申请日：2011-01-21
申请人： Babs R. Soller , Fengmei Zou , Ye Yang , Randy Ross , Boyan Peshlov
发明人： Babs R. Soller , Fengmei Zou , Ye Yang , Randy Ross , Boyan Peshlov
IPC分类号： G01D18/00 , G01N21/3577 , G01N33/49
CPC分类号： G01N21/3577 , G01N33/4925
摘要： Methods are disclosed for determining a value associated with an analyte in a sample. The methods include: determining a set of spectra from a model for light attenuation in the sample, where the model includes contributions from at least two different sources of light attenuation in the sample; determining a set of spectral correction factors associated with the analyte in the sample based on the set of spectra; and using the set of spectral correction factors to determine the value associated with the analyte of interest.
摘要翻译：公开了用于确定与样品中的分析物相关的值的方法。这些方法包括：从样本中的光衰减模型确定一组光谱，其中模型包括来自样本中至少两种不同光衰减源的贡献; 基于所述一组光谱确定与所述样品中的分析物相关联的一组光谱校正因子; 并使用该组光谱校正因子来确定与感兴趣的分析物相关的值。

5. 发明授权

US07532919B2 Measuring tissue oxygenation 有权
标题翻译：测量组织氧合
公开(公告)号：US07532919B2
公开(公告)日：2009-05-12
申请号：US11755643
申请日：2007-05-30
申请人： Olusola O. Soyemi , Babs R. Soller , Ye Yang
发明人： Olusola O. Soyemi , Babs R. Soller , Ye Yang
IPC分类号： A61B5/1455
CPC分类号： A61B5/14551 , A61B5/412 , G01N21/35 , G01N33/4925 , G01N2021/3144
摘要： Methods and systems for calculating tissue oxygenation, e.g., oxygen saturation, in a target tissue are disclosed. In some embodiments, the methods include: (a) directing incident radiation to a target tissue and determining reflectance spectra of the target tissue by measuring intensities of reflected radiation from the target tissue at a plurality of radiation wavelengths; (b) correcting the measured intensities of the reflectance spectra to reduce contributions thereto from skin and fat layers through which the incident radiation propagates; (c) determining oxygen saturation in the target tissue based on the corrected reflectance spectra; and (d) outputting the determined value of oxygen saturation.
摘要翻译：公开了用于计算靶组织中的组织氧合例如氧饱和度的方法和系统。在一些实施例中，所述方法包括：（a）将入射辐射定向到目标组织，并通过测量来自多个辐射波长的来自目标组织的反射辐射的强度来确定目标组织的反射光谱; （b）校正反射光谱的测量强度，以减少由入射辐射传播的皮肤和脂肪层对其的贡献; （c）基于校正的反射光谱确定靶组织中的氧饱和度; 和（d）输出所确定的氧饱和度值。

6. 发明授权

US08873035B2 Systems and methods for correcting optical reflectance measurements 有权
标题翻译：用于校正光反射率测量的系统和方法
公开(公告)号：US08873035B2
公开(公告)日：2014-10-28
申请号：US13021065
申请日：2011-02-04
申请人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
发明人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
IPC分类号： G01J3/00 , A61B5/145 , A61B5/1455 , G01N21/27 , G01N21/49 , G01N21/35 , G01N21/31 , A61B5/00
CPC分类号： G01N21/25 , A61B5/0075 , A61B5/14535 , A61B5/14539 , A61B5/14546 , A61B5/1455 , A61B5/14551 , A61B5/6824 , G01N21/274 , G01N21/359 , G01N21/49 , G01N21/55 , G01N21/59 , G01N2021/3155
摘要： We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.
摘要翻译：我们公开了测量系统和方法，用于测量样品目标区域中的分析物，还包括覆盖目标区域的特征。系统包括：（a）光源; （b）检测系统; （c）一组至少第一，第二和第三光端口，其将来自光源的光透射到样品并且将从样品反射的光接收并引导到检测系统，生成第一组数据，其包括对应于样本内的内部目标和覆盖内部目标的特征，以及包括对应于覆盖内部目标的特征的信息的第二组数据; 以及（d）处理器，被配置为使用所述第一和第二组数据从所述第一组数据中去除所述上覆特征的信息特征，以产生表示所述内部目标的校正信息。

7. 发明申请

US20110184683A1 METHODS AND SYSTEMS FOR ANALYTE MEASUREMENT 有权
标题翻译：分析测量的方法和系统
公开(公告)号：US20110184683A1
公开(公告)日：2011-07-28
申请号：US13011113
申请日：2011-01-21
申请人： Babs R. Soller , Fengmei Zou , Ye Yang , Randy Ross , Boyan Peshlov
发明人： Babs R. Soller , Fengmei Zou , Ye Yang , Randy Ross , Boyan Peshlov
IPC分类号： G01R35/00
CPC分类号： G01N21/3577 , G01N33/4925
摘要： Methods are disclosed for determining a value associated with an analyte in a sample. The methods include: determining a set of spectra from a model for light attenuation in the sample, where the model includes contributions from at least two different sources of light attenuation in the sample; determining a set of spectral correction factors associated with the analyte in the sample based on the set of spectra; and using the set of spectral correction factors to determine the value associated with the analyte of interest.
摘要翻译：公开了用于确定与样品中的分析物相关的值的方法。这些方法包括：从样本中的光衰减模型确定一组光谱，其中模型包括来自样本中至少两种不同光衰减源的贡献; 基于所述一组光谱确定与所述样品中的分析物相关联的一组光谱校正因子; 并使用该组光谱校正因子来确定与感兴趣的分析物相关的值。

8. 发明申请

US20100123897A1 SYSTEMS AND METHODS FOR CORRECTING OPTICAL REFLECTANCE MEASUREMENTS 审中-公开
标题翻译：用于校正光学反射测量的系统和方法
公开(公告)号：US20100123897A1
公开(公告)日：2010-05-20
申请号：US12568363
申请日：2009-09-28
申请人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
发明人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
IPC分类号： G01J3/00 , G01N21/55
CPC分类号： G01N21/25 , A61B5/0075 , A61B5/14535 , A61B5/14539 , A61B5/14546 , A61B5/1455 , A61B5/14551 , A61B5/6824 , G01N21/274 , G01N21/359 , G01N21/49 , G01N21/55 , G01N21/59 , G01N2021/3155
摘要： We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.
摘要翻译：我们公开了测量系统和方法，用于测量样品目标区域中的分析物，还包括覆盖目标区域的特征。系统包括：（a）光源; （b）检测系统; （c）一组至少第一，第二和第三光端口，其将来自光源的光透射到样品并且将从样品反射的光接收并引导到检测系统，生成第一组数据，其包括对应于样本内的内部目标和覆盖内部目标的特征，以及包括对应于覆盖内部目标的特征的信息的第二组数据; 以及（d）处理器，被配置为使用所述第一和第二组数据从所述第一组数据中去除所述上覆特征的信息特征，以产生表示所述内部目标的校正信息。

9. 发明授权

US07616303B2 Systems and methods for correcting optical reflectance measurements 有权
标题翻译：用于校正光反射率测量的系统和方法
公开(公告)号：US07616303B2
公开(公告)日：2009-11-10
申请号：US11411538
申请日：2006-04-25
申请人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
发明人： Ye Yang , Babs R. Soller , Olusola O. Soyemi , Michael A. Shear
IPC分类号： G01J3/00
CPC分类号： G01N21/25 , A61B5/0075 , A61B5/14535 , A61B5/14539 , A61B5/14546 , A61B5/1455 , A61B5/14551 , A61B5/6824 , G01N21/274 , G01N21/359 , G01N21/49 , G01N21/55 , G01N21/59 , G01N2021/3155
摘要： We disclose measurement systems and methods for measuring analytes in target regions of samples that also include features overlying the target regions. The systems include: (a) a light source; (b) a detection system; (c) a set of at least first, second, and third light ports which transmit light from the light source to a sample and receive and direct light reflected from the sample to the detection system, generating a first set of data including information corresponding to both an internal target within the sample and features overlying the internal target, and a second set of data including information corresponding to features overlying the internal target; and (d) a processor configured to remove information characteristic of the overlying features from the first set of data using the first and second sets of data to produce corrected information representing the internal target.
摘要翻译：我们公开了测量系统和方法，用于测量样品目标区域中的分析物，还包括覆盖目标区域的特征。系统包括：（a）光源; （b）检测系统; （c）一组至少第一，第二和第三光端口，其将来自光源的光透射到样品并且将从样品反射的光接收并引导到检测系统，生成第一组数据，其包括对应于样本内的内部目标和覆盖内部目标的特征，以及包括对应于覆盖内部目标的特征的信息的第二组数据; 以及（d）处理器，被配置为使用所述第一和第二组数据从所述第一组数据中去除所述上覆特征的信息特征，以产生表示所述内部目标的校正信息。

10. 发明授权

US07714287B1 Apparatus and method for obtaining topographical dark-field images in a scanning electron microscope 有权
标题翻译：用于在扫描电子显微镜中获得地形暗视场图像的装置和方法
公开(公告)号：US07714287B1
公开(公告)日：2010-05-11
申请号：US12194153
申请日：2008-08-19
申请人： Edward M. James , Ye Yang , Mark Lin , Alexander J. Gubbens , Paul Petric
发明人： Edward M. James , Ye Yang , Mark Lin , Alexander J. Gubbens , Paul Petric
IPC分类号： H01J49/08 , G01N21/00 , G01N23/00
CPC分类号： H01J37/28 , H01J37/1472 , H01J37/244 , H01J2237/2443 , H01J2237/24465 , H01J2237/24485 , H01J2237/2449 , H01J2237/2803
摘要： An electron beam apparatus is configured for dark field imaging of a substrate surface. Dark field is defined as an operational mode where the image contrast is sensitive to topographical features on the surface. A source generates a primary electron beam, and scan deflectors are configured to deflect the primary electron beam so as to scan the primary electron beam over the substrate surface whereby secondary and/or backscattered electrons are emitted from the substrate surface, said emitted electrons forming a scattered electron beam. A beam separator is configured to separate the scattered electron beam from the primary electron beam. The apparatus includes a cooperative arrangement which includes at least a ring-like element, a first grid, and a second grid. The ring-like element and the first and second grids each comprises conductive material. A segmented detector assembly is positioned to receive the scattered electron beam after the scattered electron beam passes through the cooperative arrangement. Other embodiments, aspects and features are also disclosed. The apparatus is configured to yield good topographical contrast, high signal to noise ratio, and to accommodate a variety of scattered beam properties that result from different primary beam and scan geometry settings.
摘要翻译：电子束装置被配置用于对基板表面进行暗场成像。暗场定义为图像对比度对表面上的地形特征敏感的操作模式。源产生初级电子束，并且扫描偏转器被配置为偏转一次电子束，以便在衬底表面上扫描一次电子束，从而从衬底表面发射次级和/或反向散射电子，所述发射的电子形成散射电子束。分束器被配置为将散射的电子束与一次电子束分离。该装置包括至少包括环形元件，第一格栅和第二格栅的协作布置。环状元件和第一和第二栅极各自包括导电材料。分段检测器组件被定位成在散射电子束通过协作布置之后接收散射电子束。还公开了其它实施例，方面和特征。该装置被配置为产生良好的地形对比度，高信噪比，并且适应由不同的主波束和扫描几何设置引起的各种散射光束特性。

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