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1. 发明授权

US07087446B2 Method of mounting optoelectronic devices on an optical element and article 失效
标题翻译：将光电器件安装在光学元件和制品上的方法
公开(公告)号：US07087446B2
公开(公告)日：2006-08-08
申请号：US10415532
申请日：2001-11-16
申请人： Armin Plichta , Peter Brix , Klaus Gerstner , Dirk Schlatterbeck , Michael Weisser , Robert A. Rubino , Jeffrey A. Bonja , Richard Strack , Martin Sommer
发明人： Armin Plichta , Peter Brix , Klaus Gerstner , Dirk Schlatterbeck , Michael Weisser , Robert A. Rubino , Jeffrey A. Bonja , Richard Strack , Martin Sommer
IPC分类号： H01L21/00
CPC分类号： H01L21/67121 , H01L21/67092
摘要： A method of mounting electro-optical devices on an optical element using an auxiliary substrate is provided herein. Electro-optical fiber optic assemblies are also described herein.
摘要翻译：本文提供了使用辅助基板将电光装置安装在光学元件上的方法。这里还描述了电光纤组件。

2. 发明授权

US07308807B2 Method of manufacturing a leached fiber bundle 有权
标题翻译：沥滤纤维束的制造方法
公开(公告)号：US07308807B2
公开(公告)日：2007-12-18
申请号：US10416897
申请日：2001-11-16
申请人： Klaus Gerstner , Armin Plichta , Dirk Schlatterbeck , Michael Weisser , Peter Brix , Martin Sommer , Robert A. Rubino, Jr. , Jeffrey A. Bonja , Richard Strack , Inka Henze , Paul Arsenault
发明人： Klaus Gerstner , Armin Plichta , Dirk Schlatterbeck , Michael Weisser , Peter Brix , Martin Sommer , Robert A. Rubino, Jr. , Jeffrey A. Bonja , Richard Strack , Inka Henze , Paul Arsenault
IPC分类号： C03B37/028
CPC分类号： G02B6/06 , A61B1/00165 , C03B37/028 , C03C25/66 , C03C2218/355 , G02B6/04 , Y02P40/57
摘要： A mesh (36) is placed around a bundle (32) of fused glass fibers. The bundle is then immersed in a leaching bath (44). The ends of the bundle are protected from the bath fluid by furrules (34). Some of the glass of the bundle is leached out, so as to provide a flexible fiber bundle.
摘要翻译：将网状物（36）放置在熔融玻璃纤维束（32）周围。然后将该束浸入浸出浴（44）中。束的端部通过毛边（34）保护免于浴液。将一些玻璃杯浸出，以提供柔性的纤维束。

3. 发明申请

US20100258533A1 METHOD AND APPARATUS FOR THE PROCESSING, IN PARTICULAR THE SEPARATING, OF WORKPIECES 审中-公开
标题翻译：特别是分离工作的方法和装置
公开(公告)号：US20100258533A1
公开(公告)日：2010-10-14
申请号：US12753490
申请日：2010-04-02
申请人： Dirk Foertsch , Albrecht Seidl , Klaus Gerstner , Thorsten Grahl
发明人： Dirk Foertsch , Albrecht Seidl , Klaus Gerstner , Thorsten Grahl
IPC分类号： B23H1/00 , B23K26/38
CPC分类号： C30B33/04 , B23K26/0006 , B23K26/03 , B23K26/40 , B23K2103/50 , B23K2103/56 , C30B15/34 , C30B29/06 , H01L31/182 , Y02P70/521
摘要： Methods and apparatus for separating of parts from workpieces is provided, in which at least one part is separated from a workpiece by means of radiation, in particular by means of laser radiation, and in which the radiation acts on the workpiece in a zone of interaction in such a way that regions of the workpiece are abraded, changed in their shape and/or are separated; in which the light intensity is received from the interaction zone and/or its vicinity and is transformed into electrical signals by a photoelectric sensor, and in which, with use of the electrical signals, it is determined when the processing procedure is to be terminated.
摘要翻译：提供了用于从工件分离零件的方法和装置，其中通过辐射，特别是通过激光辐射将至少一个部件与工件分离，并且其中辐射在相互作用区域作用在工件上以使工件的区域磨损，形状变化和/或分离的方式; 其中从相互作用区域和/或其附近接收光强度，并通过光电传感器转换成电信号，并且其中使用电信号确定何时终止处理过程。

4. 发明授权

US09157869B2 Method and device for detecting cracks in semiconductor substrates 有权
标题翻译：用于检测半导体衬底中的裂纹的方法和装置
公开(公告)号：US09157869B2
公开(公告)日：2015-10-13
申请号：US13504289
申请日：2010-08-13
申请人： Andreas Ortner , Klaus Gerstner , Hilmar Von Campe , Michael Stelzl
发明人： Andreas Ortner , Klaus Gerstner , Hilmar Von Campe , Michael Stelzl
IPC分类号： G01N21/00 , G01N21/95
CPC分类号： G01N21/9505
摘要： A method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells, are provided. The method and apparatus are based on the detection of light deflected at a crack.
摘要翻译：提供了一种用于检测硅晶片和太阳能电池等半导体基板中的裂纹的方法和装置。该方法和装置基于在裂纹处偏转的光的检测。

5. 发明申请

US20120307236A1 METHOD AND DEVICE FOR DETECTING CRACKS IN SEMICONDUCTOR SUBSTRATES 有权
标题翻译：用于检测半导体衬底中的裂纹的方法和装置
公开(公告)号：US20120307236A1
公开(公告)日：2012-12-06
申请号：US13504289
申请日：2010-08-13
申请人： Andreas Ortner , Klaus Gerstner , Hilmar Von Campe , Michael Stelzl
发明人： Andreas Ortner , Klaus Gerstner , Hilmar Von Campe , Michael Stelzl
IPC分类号： G01N21/958
CPC分类号： G01N21/9505
摘要： The invention relates to a method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells. The method and apparatus are based on the detection of light deflected at a crack.
摘要翻译：本发明涉及一种用于检测诸如硅晶片和太阳能电池的半导体衬底中的裂纹的方法和装置。该方法和装置基于在裂纹处偏转的光的检测。

6. 发明授权

US06927848B2 Method and apparatus for detecting defects in a continuously moving strip of transparent material 有权
标题翻译：用于检测连续移动的透明材料条中的缺陷的方法和装置
公开(公告)号：US06927848B2
公开(公告)日：2005-08-09
申请号：US10435952
申请日：2003-05-12
申请人： Klaus Gerstner , Joachim Weber
发明人： Klaus Gerstner , Joachim Weber
IPC分类号： G01B11/30 , G01N21/896 , G01N21/958 , G01N21/00 , G01N21/84
CPC分类号： G01N21/896
摘要： To detect defects in a continuously moving strip of transparent material, especially a wide thin glass strip, a narrow monochromatic light beam is guided transverse to the motion direction of the moving strip and is coupled into the moving strip, preferably through an edge region of the moving strip, by a transparent liquid arranged between the moving strip and the light source producing the monochromatic light beam. In a first embodiment the monochromatic light beam is inclined to an upper surface of the moving strip through which it passes and is coupled into the moving strip by a transparent liquid whose index of refraction is greater than that of the atmosphere surrounding the moving strip. In a second embodiment the monochromatic light beam is parallel to the upper surface of the strip and is coupled into an edge surface of the continuously moving strip by a transparent liquid whose index of refraction is about equal to that of the moving material. In the first embodiment the light guide system for the light beam includes a prism, whose light outlet surface is parallel to the upper surface of the glass strip. The transparent liquid is arranged between the prism and the glass strip, which is supported on rolls.
摘要翻译：为了检测连续移动的透明材料带，特别是宽的薄玻璃条带中的缺陷，窄的单色光束横向于移动条的运动方向被引导，并且优选地通过移动条的边缘区域通过布置在移动条和光源之间的透明液体产生单色光束。在第一实施例中，单色光束倾斜到其通过的移动条的上表面，并且通过透明液体耦合到移动条中，透明液体的折射率大于围绕移动条带的气氛的折射率。在第二实施例中，单色光束平行于条带的上表面，并通过透明液体耦合到连续移动的条带的边缘表面，透明液体的折射率大约等于移动材料的折射率。在第一实施例中，用于光束的光导系统包括其出射表面平行于玻璃条的上表面的棱镜。透明液体布置在棱镜和玻璃带之间，玻璃带被支撑在辊上。

7. 发明申请

US20110189379A1 METHOD FOR THE THERMOGRAPHIC INSPECTION OF NONMETALLIC MATERIALS, PARTICULARLY COATED NONMETALLIC MATERIALS, AS WELL AS METHOD FOR THE PRODUCTION THEREOF AND AN OBJECT PRODUCED ACCORDING TO THE METHOD 审中-公开
标题翻译：非特异性材料的非线性材料的热成型检查方法，特别是涂覆的非金属材料，以及其生产方法和根据该方法生产的对象
公开(公告)号：US20110189379A1
公开(公告)日：2011-08-04
申请号：US12935221
申请日：2009-04-13
申请人： Andreas Ortner , Klaus Gerstner , Ralph Neubecker
发明人： Andreas Ortner , Klaus Gerstner , Ralph Neubecker
IPC分类号： G01N25/72 , C23C14/54 , C23C14/28 , B05D3/02
CPC分类号： G01N25/72
摘要： A method for the thermographic inspection of nonmetallic materials, particularly coated nonmetallic materials, is provided. The method includes heating at least one part of the surface of the nonmetallic material, preferably a part of the surface furnished with a nonmetallic coating, by a short energy pulse, preferably a light pulse, or by periodic input of heat, and recording the temporal and spatial temperature profile at least at a plurality of successive time points.
摘要翻译：提供了一种用于非金属材料，特别是涂覆的非金属材料的热成像检查的方法。该方法包括通过短能量脉冲，优选光脉冲或通过周期性输入加热非金属材料的表面的至少一部分，优选地是具有非金属涂层的表面的一部分，并记录时间和至少在多个连续时间点的空间温度分布。

8. 发明授权

US07292332B2 Method and apparatus for detecting faults in transparent material 有权
标题翻译：检测透明材料故障的方法和装置
公开(公告)号：US07292332B2
公开(公告)日：2007-11-06
申请号：US10812161
申请日：2004-03-29
申请人： Klaus Gerstner , Clemens Ottermann , Thomas Zimmermann , Josef Droste
发明人： Klaus Gerstner , Clemens Ottermann , Thomas Zimmermann , Josef Droste
IPC分类号： G01N21/00
CPC分类号： G01N21/896 , G01N2021/1772 , G01N2021/8845 , G01N2021/8962
摘要： The method for detecting faults in transparent material includes irradiating a definite partial volume in the material with a first radiation source and coupling light into the material from a second source so that its optical path in the partial volume extends in the interior of the material. A fault in the partial volume is detected by light scattering, bright field absorption, and/or deflection of light of the first radiation source by the fault. The apparatus for detecting faults includes a first radiation source for illuminating a definite partial volume of the material, a detector for detecting light from this partial volume, and a second radiation source. The second radiation source is arranged in relation to the material so that the associated optical path in the partial volume passes exclusively in the interior of the material.
摘要翻译：用于检测透明材料中的故障的方法包括用第一辐射源照射材料中的确定的部分体积，并将光从第二源耦合到材料中，使得其部分体积中的光路在材料的内部延伸。部分体积的故障通过故障的第一辐射源的光的散射，亮场吸收和/或偏转来检测。用于检测故障的装置包括用于照射材料的确定部分体积的第一辐射源，用于检测来自该部分体积的光的检测器和第二辐射源。第二辐射源相对于材料布置，使得部分体积中的相关联的光路仅在材料的内部通过。

9. 发明授权

US07187817B2 Awg coupler for separating electromagnetic radiation of various wavelength regions, and a telecommunications system 失效
标题翻译：用于分离各种波长区域的电磁辐射的Awg耦合器，以及电信系统
公开(公告)号：US07187817B2
公开(公告)日：2007-03-06
申请号：US10471397
申请日：2002-03-08
申请人： Andrea Anton , Tobias Kälber , Detlef Wolff , Manfred Lohmeyer , Matthias Brinkmann , Klaus Gerstner
发明人： Andrea Anton , Tobias Kälber , Detlef Wolff , Manfred Lohmeyer , Matthias Brinkmann , Klaus Gerstner
IPC分类号： G02B6/34 , C03B37/018 , H04J14/02
CPC分类号： G02B6/12014 , G02B6/12021 , G02B6/2808
摘要： A single free-beam region for coupling electromagnetic radiation in and out is provided in order in the case of an AWG coupler for spectrally separating electromagnetic radiation to achieve a more stable thermal characteristic and a space-saving layout.
摘要翻译：在用于光谱分离电磁辐射的AWG耦合器的情况下，依次提供用于耦合电磁辐射的单个自由度区域，以实现更稳定的热特性和节省空间的布局。

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