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    • 3. 发明授权
    • Polarization dependency identification
    • 极化依赖性识别
    • US07312858B2
    • 2007-12-25
    • US11024264
    • 2004-12-27
    • Ken G. Purchase
    • Ken G. Purchase
    • G01N21/00
    • H04J14/02G02B6/12019G02B6/12023H04J14/0201H04J14/06
    • Provided are a method, system, and device for passing a plurality of light beams though an array of waveguides wherein at least one waveguide is coupled to a test structure which exhibits an insertion loss dependent on a known polarization. For each of a plurality of adjacent waveguides of the array including the one waveguide, a first wavelength response associated with a first polarization, and a second wavelength response associated with a second polarization, may be measured. In one example, polarization may be identified as the known polarization if the peak value of one wavelength response of the test structure is less than the peak value of another wavelength response of the first test structure. In one embodiment, unknown polarizations in the polarization response of an optical component having multiple correlated outputs may be identified. Other embodiments are described and claimed.
    • 提供了一种用于使多个光束通过波导阵列的方法,系统和装置,其中至少一个波导耦合到测试结构,该测试结构表现出取决于已知极化的插入损耗。 对于包括一个波导的阵列的多个相邻波导中的每一个,可以测量与第一偏振相关联的第一波长响应和与第二偏振相关联的第二波长响应。 在一个示例中,如果测试结构的一个波长响应的峰值小于第一测试结构的另一个波长响应的峰值,则可以将极化识别为已知的极化。 在一个实施例中,可以识别具有多个相关输出的光学部件的偏振响应中的未知极化。 描述和要求保护其他实施例。