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    • 2. 发明授权
    • Photoelectric gas analyzer
    • 光电气体分析仪
    • US4326807A
    • 1982-04-27
    • US189620
    • 1980-09-22
    • Michael Zochbauer
    • Michael Zochbauer
    • G01N21/33G01J3/48
    • G01N21/33
    • An analyzer for measuring the combined NO and NO.sub.2 concentrations includes a hollow cathode lamp with nitrogen/oxygen filling emitting radiation which is alternatingly passed through two narrow-band interference filters, one having a transmission range clearly outside any NO absorption bands and its NO.sub.2 absorption equals the difference of the absorption coefficients for NO and NO.sub.2 in the transmission band of the other filter. These two beams pass through a measuring gas cell and are photoelectrically detected for further processing.
    • 用于测量组合的NO和NO 2浓度的分析仪包括具有氮/氧填充发射辐射的空心阴极灯,其交替地穿过两个窄带干涉滤光器,一个具有清楚地在任何NO吸收带之外的透射范围,并且其NO 2吸收等于 其他滤波器的传输频带中NO和NO2的吸收系数的差异。 这两束光通过测量气体池,并进行光电检测以进一步处理。
    • 7. 发明授权
    • Method for spectroscopy using two Fabry-Perot interference filters
    • 使用两个法布里 - 珀罗干涉滤光片的光谱法
    • US5357340A
    • 1994-10-18
    • US838771
    • 1992-03-10
    • Michael Zochbauer
    • Michael Zochbauer
    • G01J3/12G01J3/26G01J3/45G01B9/02
    • G01J3/26G01J2003/1269G01J2003/262
    • The invention relates to a process for Fabry-Perot spectroscopy using a spectrometer in the radiation path of which there is a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a blend of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter F1 is set to a given value and the optical layer thickness of the second Fabry-Perot filter F2 is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector D is converted by a mathematically transformation into a spectrum as a function of wave numbers.
    • PCT No.PCT / DE90 / 00747 Sec。 371日期:1992年3月10日 102(e)1992年3月10日PCT PCT 1990年10月1日PCT公布。 公开号WO91 / 05988 日期:1991年5月2日。本发明涉及一种法布里 - 珀罗光谱法,该方法使用辐射路径中的光谱仪,其具有辐射源,辐射通过的两个连续的法布里 - 珀罗干涉滤光器,物质的混合物 被检查和一个检测器。 将第一法布里 - 珀罗滤光器F1的光学层厚度设定为给定值,并调制第二法布里 - 珀罗滤光片F2的光学层厚度。 作为层厚度的函数的所得干涉图是待检查物质的特征。 在检测器D处接收到的干涉图被数学变换转换为作为波数的函数的频谱。