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    • 2. 发明申请
    • Phase detector system with asynchronous output override
    • 具有异步输出覆盖的相位检测器系统
    • US20050111607A1
    • 2005-05-26
    • US10718206
    • 2003-11-20
    • Alvin LokeRobert BarnesJames Barnes
    • Alvin LokeRobert BarnesJames Barnes
    • H03D13/00H03L7/089H03L7/107H03D3/24
    • H03D13/004H03L7/0891H03L7/107
    • In one embodiment, the present invention provides a phase-locked loop comprising a charge-pump loop filter and a phase detector system. The charge-pump loop filter is configured to provide a control voltage having a voltage level based on a state of a first control signal and on a state of a second control signal. The phase detector system is configured to receive a first clock, a second clock, and a control signal defining a plurality of states including a first state and a second state. The phase detector system is further configured to provide the first control signal and the second control signal each having a state based on a phase difference between the first and second clocks when the control signal has the first state, and to provide the first control signal and second control signal each having a state asynchronously controlled by the control signal when the control signal has the second state.
    • 在一个实施例中,本发明提供一种包括电荷泵环路滤波器和相位检测器系统的锁相环。 电荷泵环路滤波器被配置为提供具有基于第一控制信号的状态和第二控制信号的状态的电压电平的控制电压。 相位检测器系统被配置为接收限定包括第一状态和第二状态的多个状态的第一时钟,第二时钟和控制信号。 相位检测器系统还被配置为当控制信号具有第一状态时,提供第一控制信号和第二控制信号,每个具有基于第一和第二时钟之间的相位差的状态,并且提供第一控制信号和 当所述控制信号具有所述第二状态时,所述第二控制信号具有由所述控制信号异步控制的状态。
    • 4. 发明申请
    • Delay-locked loop and a method of testing a delay-locked loop
    • 延迟锁定环路和测试延迟锁定环路的方法
    • US20050280407A1
    • 2005-12-22
    • US10869582
    • 2004-06-16
    • Alvin LokeMichael Joseph GilsdorfPeter MeierJeffrey R. Rearick
    • Alvin LokeMichael Joseph GilsdorfPeter MeierJeffrey R. Rearick
    • G01R23/175H03L7/06H03L7/07H03L7/081
    • H03L7/07H03L7/0812
    • A delay-locked loop (DLL) of an integrated circuit (IC) with testing circuitry and a method for testing a DLL. During test mode, a phase comparator of the DLL receives a test clock in place of the reference clock and determines the phase difference between the test clock and the clock fed back to the DLL from a clock buffer tree. A variable delay element of the DLL then shifts the reference clock in time by an amount that depends on that phase difference. The variable delay element can be exercised by varying the phase of the test clock with respect to the reference clock by a known phase offset to cause the variable delay element to produce a range of delays. Whether the variable delay element is functioning properly can be determined by checking whether the phase of the test clock is aligned with the phase of the feedback clock.
    • 具有测试电路的集成电路(IC)的延迟锁定环(DLL)和用于测试DLL的方法。 在测试模式期间,DLL的相位比较器代替参考时钟接收测试时钟,并从时钟缓冲器树中确定测试时钟与反馈到DLL的时钟之间的相位差。 然后,DLL的可变延迟元件将参考时钟在时间上移动取决于该相位差的量。 可以通过将测试时钟相对于参考时钟的相位改变已知的相位偏移来使可变延迟元件产生延迟范围来实现可变延迟元件。 可以通过检查测试时钟的相位是否与反馈时钟的相位对准来确定可变延迟元件是否正常工作。