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    • 8. 发明授权
    • Fast internal reference cell trimming for flash EEPROM memory
    • 用于快速EEPROM存储器的快速内部参考单元修整
    • US5608669A
    • 1997-03-04
    • US599123
    • 1996-02-09
    • James Q. MiJohnny JavanifardDennis Dilley
    • James Q. MiJohnny JavanifardDennis Dilley
    • G11C11/56G11C16/34G11C29/50G11C29/52G11C7/00G11C29/00
    • G11C16/3459G11C11/5621G11C11/5628G11C16/3454G11C29/50G11C29/52G06F2201/81G11C16/04G11C2029/5006G11C2211/5621G11C2211/5634
    • A method for storing a charge on memory devices which includes the steps of providing a first charging pulse to a memory device to charge the device to a first level less than a final level; testing the value of the charge to determine whether the charge is greater than the first level; if the value of the charge is less than the first level, providing a second set of charging pulses to the memory device, each of the pulses of the second set of pulses having a duration which is a fraction of the duration of the first pulse and a value sufficient to charge the device to the first level; testing the value of the charge to determine whether the charge is greater than the first level after each pulse of the second set of pulses; and once the charge has tested greater than the first level, providing a third set of charging pulses to terminals of the memory device, each of the pulses of the third set of pulses having a duration which is a fraction of the duration of the pulses of the second set of pulses and a value such that the charge furnished by each pulse is approximately equal to an allowable variation of the charge from the final value.
    • 一种用于在存储器件上存储电荷的方法,包括以下步骤:向存储器件提供第一充电脉冲,以将器件充电至小于最终电平的第一电平; 测试费用的价值以确定费用是否大于第一级; 如果所述电荷的值小于所述第一电平,则向所述存储器件提供第二组充电脉冲,所述第二组脉冲的每个脉冲的持续时间是所述第一脉冲持续时间的一部分, 足以将装置充电到第一级的值; 测试电荷的值以确定在第二组脉冲的每个脉冲之后电荷是否大于第一电平; 并且一旦所述电荷已经测试大于所述第一电平,则向所述存储器件的端子提供第三组充电脉冲,所述第三组脉冲的每个脉冲的持续时间是所述脉冲持续时间的一部分 第二组脉冲和使得由每个脉冲提供的电荷近似等于电荷与最终值的容许变化的值。