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1. 发明授权

US07911610B2 Optical measuring device 有权
标题翻译：光学测量装置
公开(公告)号：US07911610B2
公开(公告)日：2011-03-22
申请号：US11996057
申请日：2006-01-17
申请人： Naoji Moriya , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Kenji Takubo , Shinichiro Totoki
发明人： Naoji Moriya , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Kenji Takubo , Shinichiro Totoki
IPC分类号： G01N21/00
CPC分类号： G01N15/0211 , G01N21/4788 , G01N2021/1721
摘要： The present invention relates to an optical measuring device which includes container for storing a sample, and an electrode pair for generating an electric field distribution upon impression of a voltage by an electrical power supply, thereby generating or extinguishing diffraction grating formed by a density modulation of particles within the sample. The particles within the sample are evaluated based upon a temporal change of an intensity of a diffracted light beam obtained by irradiating a light beam upon the diffraction grating formed by the density modulation of the particles. The electrodes constituting the electrode pair are configured to have a comb-like electrode teeth that are parallel with each other and are arranged such that the electrode teeth of one electrode are inserted between the electrode teeth of the other electrode. From such configuration, an optical measuring device of a high sensitivity and excellent S/N ratio can be obtained.
摘要翻译：本发明涉及一种光学测量装置，该光学测量装置包括用于存储样品的容器和用于通过电源印制电压而产生电场分布的电极对，由此产生或熄灭由密度调制形成的衍射光栅样品内的颗粒。基于通过对通过颗粒的密度调制形成的衍射光栅照射光束而获得的衍射光束的强度的时间变化来评估样品内的颗粒。构成电极对的电极被构造为具有彼此平行的梳状电极齿，并且被布置成使得一个电极的电极齿插入另一个电极的电极齿之间。由此，可以得到灵敏度高，S / N比优异的光学测量装置。

2. 发明授权

US07760356B2 Optical measuring device and method, and nanoparticle measuring method and device 有权
标题翻译：光学测量装置及方法及纳米颗粒测量方法及装置
公开(公告)号：US07760356B2
公开(公告)日：2010-07-20
申请号：US11661492
申请日：2005-07-15
申请人： Naoji Moriya , Shinichro Totoki , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Makiko Masutomi
发明人： Naoji Moriya , Shinichro Totoki , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Makiko Masutomi
IPC分类号： G01N15/02
CPC分类号： G01N21/4788 , G01N15/0211 , G01N15/0227 , G01N2013/003 , G01N2015/0038 , G01N2015/0294
摘要： The invention provides an optical measuring device capable of performing measuring using a transient diffraction grating by only adjusting probe light, and a nanoparticle measuring device using the same principle as the optical measuring device. An optical measuring device includes: a power supply 15; a container 11 that stores a sample; a pair of electrodes 13 and 14 that generate an electric force line distribution in which areas having high electric force line density and areas having low electric force line density are regularly arranged; a dielectrophoresis control unit 19 that controls the generation of a transient diffraction grating using dielectrophoresis of particles in the sample caused by applying the voltage to the pair of electrodes 13 and 14 and a variation in the transient diffraction grating due to the diffusion of the particles in the sample according to a variation in the applied voltage; a light source 16 emitting light to the transient diffraction grating; and a plurality of photodetectors 18 detecting diffracted light generated by the transient diffraction grating. In the optical measuring device, the particles are evaluated on the basis of a variation in the intensity of the diffracted light generated by the transient diffraction grating. Further, for example, the particle diameter of a nanoparticle is measured by the same principle as the optical measuring device uses. As a result, it is possible to increase the intensity of a signal and to improve the sensitivity and the S/N ratio, as compared to a dynamic scattering method.
摘要翻译：本发明提供一种光学测量装置，该光学测量装置能够仅通过调节探测光来进行使用瞬态衍射光栅的测量，以及使用与光学测量装置相同原理的纳米粒子测量装置。光学测量装置包括：电源15; 存储样品的容器11; 产生电力线分布的一对电极13,14，其中规定排列具有高电力线密度的区域和具有低电力线密度的区域; 介电电泳控制单元19，其使用通过向一对电极13和14施加电压引起的样品中的颗粒的介电电泳，以及由于颗粒的扩散引起的瞬态衍射光栅的变化来控制瞬态衍射光栅的产生样品根据施加电压的变化; 将光发射到瞬态衍射光栅的光源16; 以及检测由瞬变衍射光栅产生的衍射光的多个光检测器18。在光学测量装置中，基于由瞬变衍射光栅产生的衍射光的强度的变化来评估颗粒。此外，例如，通过与光学测量装置使用的原理相同的原理来测量纳米颗粒的粒径。结果，与动态散射方法相比，可以增加信号的强度并提高灵敏度和S / N比。

3. 发明申请

US20090251695A1 OPTICAL MEASURING DEVICE 有权
标题翻译：光学测量装置
公开(公告)号：US20090251695A1
公开(公告)日：2009-10-08
申请号：US11996057
申请日：2006-01-17
申请人： Naoji Moriya , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Kenji Takubo , Shinichiro Totoki
发明人： Naoji Moriya , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Kenji Takubo , Shinichiro Totoki
IPC分类号： G01N15/02 , G01N21/47
CPC分类号： G01N15/0211 , G01N21/4788 , G01N2021/1721
摘要： Within a container 1 which is storing a sample is generated a regularly arranged electric field distribution by an impression of a voltage upon an electrode pair 2 provided within the container 1, thereby generating diffraction grating formed by a density modulation of particles within the sample within the container 1, there is obtained information upon a diffusion of the particles based upon a temporal change in an extinction process of an intensity of a diffracted light beam obtained by irradiating a light beam upon the diffraction grating formed by the density modulation of the particles, the electrodes 21, 22 constituting the electrode pair 2 are configured to have multiple linear electrode teeth 21a, 22a parallel with each other, the electrodes 21, 22 are arranged such that the electrode teeth 21a of one electrode 21 are inserted between the electrode teeth 22a of the other electrode 22, thereby increasing the width of the diffraction grating formed by the density modulation of the particles, and a ratio of a component of the diffracted light beam thereof included in an entire diffracted light beam is increased to increase sensitivity of a measurement. As a result, there is provided an optical measuring device which can measure the information upon the diffusion of the particles movably dispersed within a medium at a high sensitivity and with an excellent S/N ratio.
摘要翻译：在存储样品的容器1内通过设置在容器1内的电极对2上的电压印制产生规则排列的电场分布，从而产生通过在样品内的颗粒的密度调制形成的衍射光栅容器1根据粒子的密度调制形成的衍射光栅照射光束而获得的衍射光束的强度的消光处理中的时间变化，获得了粒子扩散的信息，构成电极对2的电极21,22被配置为具有彼此平行的多个线状电极齿21a，22a，电极21,22被布置成使得一个电极21的电极齿21a插入到电极齿22a 另一个电极22，从而增加由t的密度调制形成的衍射光栅的宽度并且包括在整个衍射光束中的衍射光束的分量的比率增加，以增加测量的灵敏度。结果，提供了一种光学测量装置，其可以以高灵敏度和良好的S / N比来测量可移动地分散在介质中的颗粒的扩散的信息。

4. 发明申请

US20080192252A1 Optical Measuring Device and Method, and Nanoparticle Measuring Method and Device 有权
标题翻译：光学测量装置及方法及纳米粒子测量方法及装置
公开(公告)号：US20080192252A1
公开(公告)日：2008-08-14
申请号：US11661492
申请日：2005-07-15
申请人： Naoji Moriya , Shinichiro Totoki , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Makiko Masutomi
发明人： Naoji Moriya , Shinichiro Totoki , Yuzo Nagumo , Yukihisa Wada , Naofumi Sakauchi , Fujio Inoue , Masahiro Takebe , Makiko Masutomi
IPC分类号： G01N21/00
CPC分类号： G01N21/4788 , G01N15/0211 , G01N15/0227 , G01N2013/003 , G01N2015/0038 , G01N2015/0294
摘要： The invention provides an optical measuring device capable of performing measuring using a transient diffraction grating by only adjusting probe light, and a nanoparticle measuring device using the same principle as the optical measuring device. An optical measuring device includes: a power supply 15; a container 11 that stores a sample; a pair of electrodes 13 and 14 that generate an electric force line distribution in which areas having high electric force line density and areas having low electric force line density are regularly arranged; a dielectrophoresis control unit 19 that controls the generation of a transient diffraction grating using dielectrophoresis of particles in the sample caused by applying the voltage to the pair of electrodes 13 and 14 and a variation in the transient diffraction grating due to the diffusion of the particles in the sample according to a variation in the applied voltage; a light source 16 emitting light to the transient diffraction grating; and a plurality of photodetectors 18 detecting diffracted light generated by the transient diffraction grating. In the optical measuring device, the particles are evaluated on the basis of a variation in the intensity of the diffracted light generated by the transient diffraction grating. Further, for example, the particle diameter of a nanoparticle is measured by the same principle as the optical measuring device uses. As a result, it is possible to increase the intensity of a signal and to improve the sensitivity and the S/N ratio, as compared to a dynamic scattering method.
摘要翻译：本发明提供一种光学测量装置，该光学测量装置能够仅通过调节探测光来进行使用瞬态衍射光栅的测量，以及使用与光学测量装置相同原理的纳米粒子测量装置。光学测量装置包括：电源15; 存储样品的容器11; 产生电力线分布的一对电极13,14，其中规定排列具有高电力线密度的区域和具有低电力线密度的区域; 介电电泳控制单元19，其使用通过向一对电极13和14施加电压引起的样品中的颗粒的介电电泳，以及由于颗粒的扩散引起的瞬态衍射光栅的变化来控制瞬态衍射光栅的产生样品根据施加电压的变化; 将光发射到瞬态衍射光栅的光源16; 以及检测由瞬变衍射光栅产生的衍射光的多个光检测器18。在光学测量装置中，基于由瞬变衍射光栅产生的衍射光的强度的变化来评估颗粒。此外，例如，通过与光学测量装置使用的原理相同的原理来测量纳米颗粒的粒径。结果，与动态散射方法相比，可以增加信号的强度并提高灵敏度和S / N比。

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