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    • 6. 发明授权
    • Buried contact structure in semiconductor device and method of making the same
    • 半导体器件中的掩埋接触结构及其制造方法
    • US06589837B1
    • 2003-07-08
    • US09688275
    • 2000-10-12
    • Hyo-Dong BanYoung-Hun Park
    • Hyo-Dong BanYoung-Hun Park
    • H01L218242
    • H01L27/10855H01L27/10811H01L27/10814
    • A first interlayer insulating layer is formed over a semiconductor substrate having a semiconductor element. A first line is formed on the first interlayer insulating layer and is connected to the semiconductor element via a contact hole. A second interlayer insulating layer is formed over the first line and the first interlayer insulating layer. An etch barrier layer is formed on the second interlayer insulating layer. A buried contract hole extends through the etch barrier layer and the first and second interlayer insulating layers. An insulating spacer is formed on the side walls of the buried contact hole. A second line is formed on the etch barrier layer and connected to the semiconductor element via the buried contact hole. The buried contact hole has a substantially vertical profile at a top end thereof to provide a sufficient misalignment margin between the buried contact hole and the second line.
    • 在具有半导体元件的半导体衬底上形成第一层间绝缘层。 第一线形成在第一层间绝缘层上,并通过接触孔与半导体元件连接。 在第一线和第一层间绝缘层上形成第二层间绝缘层。 在第二层间绝缘层上形成蚀刻阻挡层。 掩埋的合金孔延伸穿过蚀刻阻挡层和第一和第二层间绝缘层。 在埋入式接触孔的侧壁上形成绝缘间隔物。 第二线形成在蚀刻阻挡层上,并通过埋入接触孔与半导体元件连接。 埋置的接触孔在其顶端处具有基本垂直的轮廓,以在埋入的接触孔和第二线之间提供足够的未对准余量。
    • 7. 发明授权
    • Methods for fabricating microelectronic device interconnects with spun-on glass regions
    • 用纺丝玻璃区域制造微电子器件互连的方法
    • US06346473B1
    • 2002-02-12
    • US09550363
    • 2000-04-19
    • Seung-hyun ChangSuck-tae KimYoung-hun Park
    • Seung-hyun ChangSuck-tae KimYoung-hun Park
    • H01L214763
    • H01L21/76819
    • An interconnect in a microelectronic device is formed by forming a first mesa on a substrate. A first insulation layer is then formed on the substrate, the first insulation layer covering the first mesa to define a step at an edge thereof A second mesa is formed on the first insulation layer adjacent the step, the second mesa being lower than the step. A second insulation layer is formed on the substrate, covering the second mesa and forming a step in the second insulation layer overlying the step in the first insulation layer. A spun-on-glass (SOG) layer on the second insulation layer, and then is planarized to expose a first portion of the second insulation layer at the step in the second insulation layer and to expose a second portion of the second insulation layer overlying the second mesa, thereby defining a planarized SOG region between the step and the second mesa. A third insulation layer is formed on the substrate, covering the planarized SOG region, and portions of the second and third insulation layers overlying the second mesa are then removed to expose a portion of the second mesa. An interconnecting region is formed n the second insulation layer which extends through the second and third insulation layers to contact the exposed portion of the second mesa. Microelectronic devices so formed are also discussed.
    • 微电子器件中的互连通过在衬底上形成第一台面而形成。 然后在基板上形成第一绝缘层,第一绝缘层覆盖第一台面以限定其边缘处的台阶。第二绝缘层形成在与台阶相邻的第一绝缘层上,第二台面低于台阶。 第二绝缘层形成在衬底上,覆盖第二台面,并且在第二绝缘层中形成覆盖第一绝缘层中的台阶的台阶。 在第二绝缘层上的旋涂玻璃(SOG)层,然后被平坦化以在第二绝缘层中的台阶处露出第二绝缘层的第一部分,并暴露第二绝缘层的第二部分 第二台面,从而在步骤和第二台面之间限定平坦化的SOG区域。 在基板上形成覆盖平坦化的SOG区域的第三绝缘层,然后去除覆盖在第二台面上的第二绝缘层和第三绝缘层的部分以露出第二台面的一部分。 互连区形成在第二绝缘层上,第二绝缘层延伸穿过第二和第三绝缘层以接触第二台面的暴露部分。 还讨论了如此形成的微电子器件。
    • 10. 发明授权
    • Methods of forming electrically interconnected lines using ultraviolet
radiation as an organic compound cleaning agent
    • 使用紫外线辐射作为有机化合物清洗剂形成电互连线的方法
    • US6043165A
    • 2000-03-28
    • US890578
    • 1997-07-09
    • Young-hun ParkSung-hoon KoJong-seob Lee
    • Young-hun ParkSung-hoon KoJong-seob Lee
    • H01L21/3205H01L21/3105H01L21/311H01L21/768H01L23/522H01L21/31H01L21/469
    • H01L21/31055H01L21/31133Y10S438/94Y10S438/963
    • Methods of forming electrically interconnected lines using organic compound cleaning agents include the steps of forming a first electrically conductive line on a substrate and then forming a first electrically insulating layer on the first electrically conductive line to electrically isolate the first conductive line from adjacent regions and lines. An organic spin-on-glass (SOG) passivation layer is then formed as a planarization layer on the first electrically insulating layer. The organic SOG layer is then etched-back to define a first etched surface thereon, using a carbon-fluoride gas which also preferably contains argon. The organic SOG layer may even be sufficiently etched back to expose an upper surface of the first electrically insulating layer. The first etched surface is then exposed to an organic compound cleaning agent so that organic residues can be removed from the etched surface so that layers subsequently formed on the etched surface are less susceptible to lift-off and flaking. The organic compound cleaning agents preferably consist of ultraviolet radiation and/or an oxygen containing plasma. After the first etched surface has been cleaned, the first electrically insulating layer is patterned to define a via therein which exposes an underlying portion of the first electrically conductive line. A second electrically conductive line (e.g., second level metallization) is then preferably formed in ohmic contact with the exposed portions of the first electrically conductive line and the ohmic contact therebetween is preferably free of organic residues which might adversely affect contact reliability and resistance.
    • 使用有机化合物清洁剂形成电互连线的方法包括以下步骤:在衬底上形成第一导电线,然后在第一导电线上形成第一电绝缘层,以将第一导电线与相邻区域和线电隔离 。 然后在第一电绝缘层上形成有机旋涂玻璃(SOG)钝化层作为平坦化层。 然后使用也优选含有氩的氟化碳气体将有机SOG层回蚀刻以限定其上的第一蚀刻表面。 有机SOG层甚至可以被充分地回蚀刻以暴露第一电绝缘层的上表面。 然后将第一蚀刻表面暴露于有机化合物清洁剂,使得可以从蚀刻表面除去有机残留物,使得随后在蚀刻表面上形成的层不易剥离和剥落。 有机化合物清洗剂优选由紫外线辐射和/或含氧等离子体组成。 在第一蚀刻表面已经被清洁之后,第一电绝缘层被图案化以限定其中暴露第一导电线的下面部分的通孔。 优选地,第二导电线(例如,第二级金属化)与第一导电线的暴露部分欧姆接触形成,并且其之间的欧姆接触优选不含可能不利地影响接触可靠性和电阻的有机残余物。