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    • 8. 发明申请
    • MEASUREMENT APPARATUS AND METHOD
    • 测量装置和方法
    • US20100020300A1
    • 2010-01-28
    • US12506481
    • 2009-07-21
    • Willem Jan BoumanHeine Melle MulderWilfred Edward EndendijkRob Otte
    • Willem Jan BoumanHeine Melle MulderWilfred Edward EndendijkRob Otte
    • G03B27/54
    • G03B27/54G03F7/70075G03F7/70091G03F7/7085
    • According to an aspect of the present invention, a method of controlling a measurement apparatus for determining a property of an individually controllable element of an array of individually controllable elements, the array of individually controllable elements being capable of controlling a distribution of a beam of radiation, is disclosed. The method includes, for a sequence of a plurality of individually controllable elements: directing a measurement beam of radiation at an individually controllable element of the plurality of individually controllable elements; and detecting the measurement beam once it has been re-directed by the individually controllable element, wherein the sequence in which the method is undertaken for the plurality of individually controllable elements is related to the orientation of the plurality of individually controllable elements when the plurality of individually controllable elements are oriented to control a distribution of a beam of radiation.
    • 根据本发明的一个方面,一种控制测量装置的方法,所述测量装置用于确定独立可控元件阵列的独立可控元件的特性,所述独立可控元件的阵列能够控制辐射束的分布 ,被披露。 该方法包括:对于多个独立可控元件的序列:将测量光束射向多个独立可控元件的独立可控元件; 并且一旦所述测量光束被所述可独立控制的元件重新引导,就检测所述测量光束,其中,所述多个独立可控元件进行所述方法的顺序与所述多个独立可控元件的取向相关, 独立可控元件被定向成控制辐射束的分布。