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热词
    • 3. 发明授权
    • Test chip, test board and reliability testing method
    • 测试芯片,测试板和可靠性测试方法
    • US09508617B2
    • 2016-11-29
    • US13411193
    • 2012-03-02
    • Shiang-Ruei SuLiang-Chen LinChia-Wei Tu
    • Shiang-Ruei SuLiang-Chen LinChia-Wei Tu
    • H01L21/66G01R31/28
    • G01R31/2856H01L21/4853H01L22/14H01L22/34H01L24/16H01L2224/16157H01L2924/0002H01L2924/00
    • A test board includes a first chip mounting area, a first input area, a second input area, a first output area, and a second output area. The test board also includes a first conductive pattern, a second conductive pattern, a third conductive pattern, and a fourth conductive pattern. The first conductive pattern electrically connects a first pin of the first input area and a first pin of the first chip mounting area. The second conductive pattern electrically connects a first pin of the second input area and a second pin of the first chip mounting area. The third conductive pattern electrically connects a first pin of the first output area and a third pin of the first chip mounting area. The fourth conductive pattern electrically connects a first pin of the second output area and a fourth pin of the first chip mounting area.
    • 测试板包括第一芯片安装区域,第一输入区域,第二输入区域,第一输出区域和第二输出区域。 测试板还包括第一导电图案,第二导电图案,第三导电图案和第四导电图案。 第一导电图形电连接第一输入区域的第一引脚和第一芯片安装区域的第一引脚。 第二导电图形电连接第二输入区域的第一引脚和第一芯片安装区域的第二引脚。 第三导电图形电连接第一输出区域的第一引脚和第一芯片安装区域的第三引脚。 第四导电图形电连接第二输出区域的第一引脚和第一芯片安装区域的第四引脚。