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1. 发明授权

US07186973B2 Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method 有权
标题翻译：离子阱/飞行时间质量分析仪和质量分析方法
公开(公告)号：US07186973B2
公开(公告)日：2007-03-06
申请号：US11149263
申请日：2005-06-10
申请人： Yasushi Terui , Toyoharu Okumoto , Tsukasa Shishika , Shinji Nagai , Masaru Tomioka
发明人： Yasushi Terui , Toyoharu Okumoto , Tsukasa Shishika , Shinji Nagai , Masaru Tomioka
IPC分类号： B01D59/44
CPC分类号： H01J49/424 , H01J49/0009 , H01J49/0031 , H01J49/004 , H01J49/40 , H01J49/427
摘要： An “ion trap-TOF/MS” capable of calibrating the observed mass for each of an ion trap and a TOF. In the ion trap-TOF/MS, sample ions having known mass numbers and ionized by an ion source are trapped within an ion trap. Auxiliary AC voltages having a frequency component ω are applied to the end cap electrodes of the ion trap to expel unwanted ions out of the ion trap. A measurement process is carried out by applying DC voltages to the ring electrode and the end cap electrodes to expel an ion remaining within the ion trap, and measuring the mass number of the expelled ion by the time-of-flight mass spectrometer. The measurement process is repeated while changing the frequency component ω, and the ion signal intensity measured by the time-of-flight mass spectrometer is compared with a previously stored threshold, thereby making calibration of the frequency component ω for the ion having the known mass number. Thus, the calibrating of the observed mass can be realized for each of the ion trap and the TOF.
摘要翻译：能够校准每个离子阱和TOF的观察质量的“离子阱TOF / MS”。在离子阱TOF / MS中，已知质量数和离子源电离的样品离子被捕获在离子阱内。具有频率分量ω的辅助AC电压被施加到离子阱的端盖电极以将不需要的离子排出离子阱。通过向环形电极和端盖电极施加直流电压以排出留在离子阱内的离子，并且通过飞行时间质谱仪测量排出的离子的质量数来进行测量处理。在改变频率分量ω时重复测量过程，并将通过飞行时间质谱仪测量的离子信号强度与先前存储的阈值进行比较，从而对具有已知质量的离子进行频率分量ω的校准数。因此，可以为每个离子阱和TOF实现观察到的质量的校准。

2. 发明授权

US5763877A Analyzer using plasma and analysis method using plasma, interface used for the same and sample introducing component used for the same 失效
标题翻译：使用等离子体分析仪和使用等离子体的分析方法，用于相同的界面和用于相同的样品引入组分
公开(公告)号：US5763877A
公开(公告)日：1998-06-09
申请号：US715587
申请日：1996-09-18
申请人： Konosuke Oishi , Masamichi Tsukada , Toyoharu Okumoto , Takashi Iino
发明人： Konosuke Oishi , Masamichi Tsukada , Toyoharu Okumoto , Takashi Iino
IPC分类号： G01N27/62 , G01N21/73 , H01J49/04 , H01J49/10
CPC分类号： H01J49/105 , G01N21/73
摘要： In an analyzer in which plasma is generated, a sample is supplied to the plasma though an aerosol guide tube and analyzed by a quadrapole mass filter, the top end portion of the aerosol guide tube is made of sapphire.
摘要翻译：在其中产生等离子体的分析仪中，通过气溶胶引导管将样品供应到等离子体，并通过四极质量过滤器分析，气溶胶引导管的顶端部分由蓝宝石制成。

3. 发明授权

US5104220A Atomic absorption spectrophotometer and analyzing method 失效
标题翻译：原子吸收光谱仪和分析方法
公开(公告)号：US5104220A
公开(公告)日：1992-04-14
申请号：US316964
申请日：1989-02-28
申请人： Toyoharu Okumoto , Katsuhito Harada , Konosuke Oishi
发明人： Toyoharu Okumoto , Katsuhito Harada , Konosuke Oishi
IPC分类号： G01N21/31 , G01N21/74
CPC分类号： G01N21/74
摘要： An atomic absorption spectrophotometer comprising means for setting the ashing temperature for that of the element having the lowest ashing temperature; means for setting the atomizing temperature for that of the element having the highest atomizing temperature; and means for effecting background correction utilizing Zeeman effect.
摘要翻译：一种原子吸收分光光度计，包括用于设定具有最低灰度温度的元件的灰度温度的装置; 用于设定具有最高雾化温度的元件的雾化温度的装置; 以及利用塞曼效应进行背景校正的方法。

4. 发明授权

US4840484A Atomic absorption spectrophotometer with furnace at pressure equal or near light source pressure 失效
标题翻译：原子吸收分光光度计，炉内压力等于或接近光源压力
公开(公告)号：US4840484A
公开(公告)日：1989-06-20
申请号：US175320
申请日：1988-03-30
申请人： Konosuke Oishi , Toyoharu Okumoto , Hayato Tobe , Masamichi Tsukada
发明人： Konosuke Oishi , Toyoharu Okumoto , Hayato Tobe , Masamichi Tsukada
IPC分类号： G01N21/31 , G01N21/74
CPC分类号： G01N21/74 , G01N2021/745
摘要： In an atomic absorption spectrophotometer including an electric furnace for drying and ashing a liquid sample to be analyzed and then atomizing the sample to generate atomic vapor, a low-pressure lamp for emitting light having a spectrum of an element to be analyzed onto the atomic vapor atomized in the electric furnace, a monochromator for splitting the transmitted light from the electric furnace and selecting a wavelength of an atomic absorption line absorbed by the element to be analyzed, and a signal processing unit for performing signal processing on the light having the selected wavelength supplied from the monochromator, the electric furnace is an airtight mechanism for maintaining airtightness of the inside of the electric furnace and an evacuation unit for evacuating the inside of the electric furnace to a pressure equal to the pressure inside the lamp.
摘要翻译：在包括用于干燥和灰化待分析的液体样品的电炉，然后将样品雾化以产生原子蒸气的原子吸收分光光度计中的低压灯，用于将具有待分析元素的光谱发射到原子蒸气上的光在电炉中雾化的单色仪，用于分离来自电炉的透射光并选择待分析元件吸收的原子吸收线的波长的单色仪，以及对具有所选波长的光进行信号处理的信号处理单元电炉是用于保持电炉内部的气密性的气密机构和用于将电炉的内部抽空至与灯内的压力相等的压力的排气单元。

5. 发明申请

US20070069121A1 Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate mass 审中-公开
标题翻译：离子阱/飞行时间质谱仪和离子精确质量的测量方法
公开(公告)号：US20070069121A1
公开(公告)日：2007-03-29
申请号：US11606046
申请日：2006-11-30
申请人： Tadao Mimura , Yoshiaki Kato , Toyoharu Okumoto
发明人： Tadao Mimura , Yoshiaki Kato , Toyoharu Okumoto
IPC分类号： H01J49/00
CPC分类号： H01J49/42 , H01J49/0009 , H01J49/004 , H01J49/40
摘要： An ion trap/time-of-flight mass spectrometer, which can perform accurate mass measurement of a product ion based on MS/MS and MSn has an ion source for ionizing a sample, an ion trap capable of temporarily trapping ions, and a time-of-flight mass spectrometer. The ion source produces ions of the sample as a measurement target and ions of a reference sample each having a known mass value. A precursor ion is selected from among the ions of the measurement target sample, and the selected precursor ion is excited and fragmented in the ion trap to produce a product ion. The reference sample ions are introduced to and trapped in the ion trap. The trapped product ion and reference sample ions are expelled out of the ion trap and introduced to the time-of-flight mass spectrometer, thereby obtaining a mass spectrum.
摘要翻译：离子阱/飞行时间质谱仪可以基于MS / MS和MS进行产物离子的精确质量测量具有离子源，用于离子化样品，离子阱能力暂时捕获离子和飞行时间质谱仪。离子源产生样品的离子作为测量对象，每个参考样品的离子具有已知的质量值。从测量对象样品的离子中选择前体离子，并且将所选择的前体离子在离子阱中激发并碎裂以产生产物离子。将参考样品离子引入并捕获在离子阱中。捕获的产物离子和参考样品离子从离子阱中排出并引入飞行时间质谱仪，从而获得质谱。

6. 发明授权

US5793039A Mass spectrometer, skimmer cone assembly, skimmer cone and its manufacturing method 失效
标题翻译：质谱仪，撇渣锥组件，撇渣器及其制造方法
公开(公告)号：US5793039A
公开(公告)日：1998-08-11
申请号：US605572
申请日：1996-02-22
申请人： Konosuke Oishi , Masamichi Tsukada , Toyoharu Okumoto , Takashi Iino
发明人： Konosuke Oishi , Masamichi Tsukada , Toyoharu Okumoto , Takashi Iino
IPC分类号： G01N27/62 , G21K1/02 , H01J49/04 , H01J49/26 , G01D59/44 , H01J49/00
CPC分类号： H01J49/067
摘要： Disclosed is a structure comprising; (a) Plasma gas is supplied to torch tube 8 from inert pressure vessel 1. (b) Nebulizer 3 absorbs sample 4 to vaporize the sample as aerosol and to introduce it into plasma 5. (c) Plasma 5 touches sampling cone 10 having an opening at the apex and a conical surface, whereby an ion stream is extracted through the opening of the sampling cone whose pressure is reduced at the rear face thereof. (d) The extracted ion stream further touches skimmer cone 12 of the conical surface having a small hole at the apex, and is absorbed into vacuum chamber 13 where the pressure is further reduced at the rear face. (e) The ion stream is flowed into quadruple pole filter 18 to carry out the mass spectrometry analysis of the ion stream.
摘要翻译：公开了一种结构，包括：（a）将等离子体气体从惰性压力容器1供应给割炬管8.（b）雾化器3吸收样品4以使气溶胶蒸发，并将其引入等离子体5.（c）等离子体5接触采样锥10，在顶点处开口并具有锥形表面，由此通过其后面压力减小的取样锥体的开口提取离子流。（d）提取的离子流进一步接触顶点处具有小孔的圆锥形表面的撇渣器锥体12，并被吸收到真空室13中，在该真空室13中后面进一步减小压力。（e）离子流流入四极过滤器18，进行离子流的质谱分析。

7. 发明授权

US5308977A Plasma mass spectrometer 失效
标题翻译：等离子体质谱仪
公开(公告)号：US5308977A
公开(公告)日：1994-05-03
申请号：US25139
申请日：1993-03-02
申请人： Konosuke Oishi , Masataka Koga , Hiromi Yamashita , Takashi Iino , Toyoharu Okumoto , Tsuyoshi Nishitarumizu
发明人： Konosuke Oishi , Masataka Koga , Hiromi Yamashita , Takashi Iino , Toyoharu Okumoto , Tsuyoshi Nishitarumizu
IPC分类号： G01N27/62 , H01J49/10 , H01J49/26 , H01J49/36
CPC分类号： H01J49/105
摘要： A plasma mass spectrometer generates an aerosol of a sample, by dissolving the sample in a liquid solvent, and spraying the liquid into a spray chamber via a nebulizer. The solvent condenses in the spray chamber and an aerosol of the sample then passes through a supply tube to a plasma torch. Microwave power from an output on the plasma torch converts the aerosol to a plasma, and the plasma passes to an analyzer. If microwave radiation reached the spray chamber, it would cause heating of the solvent which may evaporate it so that the solvent would be present in the plasma. Therefore, there is a wall between the spray chamber and the plasma torch and microwave output which blocks such microwave radiation.
摘要翻译：等离子体质谱仪通过将样品溶解在液体溶剂中并通过喷雾器将液体喷射到喷雾室中而产生样品气溶胶。溶剂在喷雾室中冷凝，然后样品的气溶胶通过供应管到等离子体焰炬。来自等离子体焰炬上的输出的微波功率将气溶胶转换成等离子体，并且等离子体传递到分析器。如果微波辐射到达喷雾室，则会引起溶剂的加热，这可能使其蒸发，使得溶剂将存在于等离子体中。因此，喷雾室和等离子体焰炬和微波输出之间存在阻挡这种微波辐射的壁。

8. 发明授权

US4890919A Atomic absorption spectrophotometer 失效
标题翻译：原子吸收分光光度计
公开(公告)号：US4890919A
公开(公告)日：1990-01-02
申请号：US140715
申请日：1988-01-04
申请人： Masamichi Tsukada , Konosuke Oishi , Katsuhito Harada , Toyoharu Okumoto
发明人： Masamichi Tsukada , Konosuke Oishi , Katsuhito Harada , Toyoharu Okumoto
IPC分类号： G01J5/00 , G01J5/60 , G01N21/31 , G01N21/74
CPC分类号： G01N21/74 , G01J5/601 , G01N2021/745
摘要： An atomic absorption spectrophotometer is disclosed in which, in order to detect the temperature of a graphite cuvette correctly on the basis of the radiation emitted from the inner wall of the graphite cuvette, the above radiation and the measuring light emitted from a hollow cathode lamp are both taken out by the same optical members, and then the radiation is separated from the measuring light, to be detected and used for measuring the temperature of the graphite cuvette.

9. 发明申请

US20090001052A1 Plasma processing apparatus and plasma processing method 审中-公开
标题翻译：等离子体处理装置和等离子体处理方法
公开(公告)号：US20090001052A1
公开(公告)日：2009-01-01
申请号：US12230460
申请日：2008-08-29
申请人： Akitaka Makino , Koichi Mishima , Takashi Kaneko , Toyoharu Okumoto
发明人： Akitaka Makino , Koichi Mishima , Takashi Kaneko , Toyoharu Okumoto
IPC分类号： C23F1/00
CPC分类号： H01L21/67253 , G01N21/68 , H01J37/32935 , H01J37/32972
摘要： A plasma processing method for processing a sample mounted on a sample stage in a decompressable processing chamber in which plasma is produced. The method includes detecting a distribution of a concentration of a substance over a surface of a sample in the processing chamber using both of (1) a result of receiving light emission of the plasma and in different directions along the surface of the sample inside the processing chamber, detecting on the respective directions a constituent of the plasma and providing outputs indicative thereof, respectively, and (2) a result of taking in gases in the processing chamber and determining a mass of a constituent of the gases, and adjusting an operation of the processing of the sample so as to adjust a distribution of the processing on the sample surface based on the detected distribution of the concentration of the substance.
摘要翻译：一种用于处理安装在其中产生等离子体的减压处理室中的样品台上的样品的等离子体处理方法。该方法包括使用（1）接收等离子体的发光和沿着处理中的样品表面的不同方向的结果，检测处理室中的样品表面上的物质浓度的分布分别在各个方向上检测等离子体的成分并分别提供其输出的输出，以及（2）在处理室中吸入气体并确定气体成分的质量的结果，并且调节根据检测到的物质浓度的分布，对样品进行处理，调整样品表面的处理分布。

10. 发明授权

US07161141B2 Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate mass 有权
公开(公告)号：US07161141B2
公开(公告)日：2007-01-09
申请号：US11128261
申请日：2005-05-13
申请人： Tadao Mimura , Yoshiaki Kato , Toyoharu Okumoto
发明人： Tadao Mimura , Yoshiaki Kato , Toyoharu Okumoto
IPC分类号： B01D59/44 , H01J49/00 , G01D18/00 , G12B13/00
CPC分类号： H01J49/42 , H01J49/0009 , H01J49/004 , H01J49/40
摘要： An ion trap/time-of-flight mass spectrometer, which can perform accurate mass measurement of a product ion based on MS/MS and MSn has an ion source for ionizing a sample, an ion trap capable of temporarily trapping ions, and a time-of-flight mass spectrometer. The ion source produces ions of the sample as a measurement target and ions of a reference sample each having a known mass value. A precursor ion is selected from among the ions of the measurement target sample, and the selected precursor ion is excited and fragmented in the ion trap to produce a product ion. The reference sample ions are introduced to and trapped in the ion trap. The trapped product ion and reference sample ions are expelled out of the ion trap and introduced to the time-of-flight mass spectrometer, thereby obtaining a mass spectrum.

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