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    • 2. 发明授权
    • Preconditioning process for treating deposition chamber prior to
deposition of tungsten silicide coating on active substrates therein
    • 在将钨硅化物涂层沉积在其上的活性基底上之前处理沉积室的预处理过程
    • US6090706A
    • 2000-07-18
    • US140818
    • 1998-08-26
    • Susan Weiher TelfordMichio ArugaMei Chang
    • Susan Weiher TelfordMichio ArugaMei Chang
    • C23C16/42C23C16/44H01L21/44
    • C23C16/4404C23C16/42Y10S438/906
    • A process is disclosed for preconditioning surfaces of a tungsten silicide deposition chamber, after a previous step of cleaning the chamber, and prior to depositing tungsten silicide on active substrates in the chamber, which first comprises treating the chamber surfaces with a gaseous silicon source, such as silane, and a tungsten-bearing gas, such as WF.sub.6, to form a first deposition of a silane-based tungsten silicide on the chamber surfaces. In a preferred embodiment, the preconditioning process further comprises subsequently treating the already coated chamber surfaces in a second step with a mixture of a tungsten-bearing gas, such as WF.sub.6, and a chlorine-substituted silane such as dichlorosilane (SiH.sub.2 Cl.sub.2), monochlorosilane (SiH.sub.3 Cl), or trichlorosilane (SiHCl.sub.3) to form a chlorine-substituted silane-based tungsten silicide deposition over the previous deposited tungsten silicide, prior to commencement of depositing tungsten silicide on active substrates in the deposition chamber.
    • 公开了一种用于预处理硅化钨沉积室的表面的方法,在先前的清洁腔室之后,以及在室中的有源衬底上沉积钨硅化物之前,首先包括用气态硅源处理室表面, 作为硅烷和含钨气体,例如WF 6,以在室表面上形成硅烷基硅化钨的第一次沉积。 在优选的实施方案中,预处理方法还包括随后在第二步中用含钨气体(例如WF 6)和氯取代的硅烷如二氯硅烷(SiH 2 Cl 2),一氯硅烷(SiCl 2) SiHCl 3)或三氯硅烷(SiHCl 3),以在淀积室中的活性基底上沉积钨硅化物之前,在先前沉积的硅化钨上形成氯取代的硅烷基硅化钨沉积物。