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1. 发明授权

US08493057B2 Electromagnetic wave measuring apparatus, measuring method, program, and recording medium 有权
标题翻译：电磁波测量装置，测量方法，程序和记录介质
公开(公告)号：US08493057B2
公开(公告)日：2013-07-23
申请号：US12731483
申请日：2010-03-25
申请人： Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato , Kodo Kawase
发明人： Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato , Kodo Kawase
IPC分类号： G01S3/02
CPC分类号： G01J5/0285 , G01N21/3563 , G01N21/3581 , G01N21/8806
摘要： A detector detects an electromagnetic wave having a frequency of 0.01 THz≦f≦100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.
摘要翻译：检测器检测频率为0.01THz @ f @ 100THz的电磁波，并通过被测器件（DUT）传输。变换器相对于DUT来改变电磁波和DUT的光路的交点的相对位置。导出器基于检测器的检测结果导出电磁波的特征值，而特征值与假设的相对位置相关联，假设的相对位置是电磁波未被DUT折射的相对位置。校正器将假设的相对位置改变为实际的相对位置，如果考虑到DUT的电磁波的折射，则相对位置是相对位置。校正后的发生器基于校正器的输出导出与预定相对位置相关联的特征值。

2. 发明授权

US08330110B2 Container, container positioning method, and measuring method 有权
标题翻译：集装箱，集装箱定位方法和测量方法
公开(公告)号：US08330110B2
公开(公告)日：2012-12-11
申请号：US12617129
申请日：2009-11-12
申请人： Shigeki Nishina , Shigeaki Naitoh
发明人： Shigeki Nishina , Shigeaki Naitoh
IPC分类号： G01J5/02
CPC分类号： G01N21/3581 , G01N21/3563
摘要： A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1−0.1≦n2≦n1+0.1 holds where n2 is a refractive index of the enclosure portion, and n1 is a refractive index of the device under test. Further, the first flat surface portion intersects with a travel direction of the terahertz wave at the right angle.
摘要翻译：根据本发明的容器包含被太赫兹波测量装置测量的被测器件的至少一部分。容器包括内部配置被测设备的至少一部分的间隙部分和包括第一平坦表面部分和第二平坦表面部分的封闭部分，并且将间隙部分设置在第一平坦表面部分和第二平坦部分之间第二平坦表面部分，从而包围间隙部分。此外，关系n1-0.1＆nlE; n2＆nlE; n1 + 0.1成立，其中n2是封装部分的折射率，n1是被测器件的折射率。此外，第一平面部与直角的太赫兹波的行进方向交叉。

3. 发明授权

US08210035B2 Collection medium and collection amount measuring apparatus, and measuring method, program, and recording medium of the same 有权
标题翻译：收集介质和收集量测量装置及其测量方法，程序和记录介质
公开(公告)号：US08210035B2
公开(公告)日：2012-07-03
申请号：US12608282
申请日：2009-10-29
申请人： Motoki Imamura , Shigeki Nishina
发明人： Motoki Imamura , Shigeki Nishina
IPC分类号： G01M15/00
CPC分类号： G01N15/0625 , B01D46/0086 , B01D46/2429 , B01D46/2459 , B01D2046/2433 , F01N3/0222 , F01N9/002 , F01N2330/48 , F01N2560/12 , G01N21/3581 , Y02T10/20 , Y02T10/47
摘要： The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.
摘要翻译：本发明在收集废气中的PM的DPF中的PM的密度时精确地测量电磁波的特性值（例如吸收系数）。 DPF接收废气，并收集废气中的PM。 DPF包括第一孔部分，其在用于接收排气的一侧的第一端处开口，并且在与第一端相对的一侧的第二端处封闭，第二孔部分在第一端处封闭，并且是第一孔部分在第二端处开口，在第一端封闭的第三孔部。第一孔部分和第二孔部分彼此相邻。第三孔部彼此相邻。通过隔壁相邻的分隔第一孔部分和第二孔部分的分隔壁排出的废气被分隔壁收集。

4. 发明申请

US20110094300A1 COLLECTION MEDIUM AND COLLECTION AMOUNT MEASURING APPARATUS, AND MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM OF THE SAME 有权
标题翻译：收集中心和收集量测量装置及其测量方法，程序和记录介质
公开(公告)号：US20110094300A1
公开(公告)日：2011-04-28
申请号：US12608282
申请日：2009-10-29
申请人： Motoki IMAMURA , Shigeki NISHINA
发明人： Motoki IMAMURA , Shigeki NISHINA
IPC分类号： G01N9/36 , B01D59/40
CPC分类号： G01N15/0625 , B01D46/0086 , B01D46/2429 , B01D46/2459 , B01D2046/2433 , F01N3/0222 , F01N9/002 , F01N2330/48 , F01N2560/12 , G01N21/3581 , Y02T10/20 , Y02T10/47
摘要： The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.
摘要翻译：本发明在收集废气中的PM的DPF中的PM的密度时精确地测量电磁波的特性值（例如吸收系数）。 DPF接收废气，并收集废气中的PM。 DPF包括：第一端部，其在用于接收排气的一侧的第一端处开口，并且在与第一端相反的一侧的第二端处封闭，第二孔部分在第一端处封闭，并且是第一孔部分在第二端处开口，在第一端封闭的第三孔部。第一孔部分和第二孔部分彼此相邻。第三孔部彼此相邻。通过隔壁相邻的分隔第一孔部分和第二孔部分的分隔壁排出的废气被分隔壁收集。

5. 发明申请

US20110057103A1 CONTAINER, CONTAINER POSITIONING METHOD, AND MEASURING METHOD 有权
标题翻译：集装箱，集装箱定位方法和测量方法
公开(公告)号：US20110057103A1
公开(公告)日：2011-03-10
申请号：US12617129
申请日：2009-11-12
申请人： Shigeki NISHINA , Shigeaki NAITOH
发明人： Shigeki NISHINA , Shigeaki NAITOH
IPC分类号： G01J5/00 , G01R31/26
CPC分类号： G01N21/3581 , G01N21/3563
摘要： A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1→0.1≦n2≦n1+0.1 holds where n2 is a refractive index of the enclosure portion, and n1 is a refractive index of the device under test. Further, the first flat surface portion intersects with a travel direction of the terahertz wave at the right angle.
摘要翻译：根据本发明的容器包含被太赫兹波测量装置测量的被测器件的至少一部分。容器包括内部配置被测设备的至少一部分的间隙部分和包括第一平坦表面部分和第二平坦表面部分的封闭部分，并且将间隙部分设置在第一平坦表面部分和第二平坦部分之间第二平坦表面部分，从而包围间隙部分。此外，n1→0.1＆nlE; n2＆nlE; n1 + 0.1的关系成立，其中n2是外壳部分的折射率，n1是被测器件的折射率。此外，第一平面部与直角的太赫兹波的行进方向交叉。

6. 发明授权

US06411382B1 Monochromator and spectrometric method 失效
标题翻译：单色器和光谱法
公开(公告)号：US06411382B1
公开(公告)日：2002-06-25
申请号：US09548581
申请日：2000-04-13
申请人： Shigeki Nishina
发明人： Shigeki Nishina
IPC分类号： G01J318
CPC分类号： G01J3/1804
摘要： The monochromator and the spectrometric method are disclosed wherein the measured beam converted into a parallel beam by a first collimator is diffracted by a plane diffraction grating, then the diffracted beam is returned so that the diffracted beam after the return is separated from that before the return along rulings of the plane diffraction grating, the diffracted beam is diffracted again by the plane diffraction grating, then the beam condensed by a second collimator is allowed to pass through an exit slit.
摘要翻译：公开了单色仪和光谱测量方法，其中通过平面衍射光栅衍射由第一准直仪转换成平行光束的测量光束，然后衍射光束返回，使得返回之后的衍射光束与返回之前的衍射光束分离沿着平面衍射光栅的排列，衍射光束再次被平面衍射光栅衍射，则允许由第二准直器聚焦的光束通过出射狭缝。

7. 发明授权

US08378703B2 Container, a method for disposing the same, and a measurement method 有权
标题翻译：容器，其设置方法和测量方法
公开(公告)号：US08378703B2
公开(公告)日：2013-02-19
申请号：US12486178
申请日：2009-06-17
申请人： Akiyoshi Irisawa , Shigeki Nishina
发明人： Akiyoshi Irisawa , Shigeki Nishina
IPC分类号： G01R31/308 , G01R31/302
CPC分类号： G01N21/0303 , A61B6/03 , A61B6/035 , G01N21/3581
摘要： The present invention restrains adverse effects caused by refraction of a terahertz wave by a device under test when the terahertz wave is fed to the device under test for measurement. A container 10 contains at least part of a device under test 1 to be measured by a terahertz wave measurement device. The container 10 includes a gap portion 11 that internally arranges at least a part of the device under test 1, and an enclosure portion 12 that includes a first curved surface portion S1, and a second curved surface portion S2, and arranges the gap portion 11 between the first curved surface portion S1 and the second curved surface portion S2, thereby enclosing the gap portion 11. Moreover, a relationship n1
摘要翻译：本发明在将太赫兹波馈送到被测器件进行测量时，限制被测器件折射太赫兹波所产生的不利影响。容器10包含被太赫兹波测量装置测量的待测试装置1的至少一部分。容器10包括内部布置被测设备1的至少一部分的间隙部分11和包括第一弯曲表面部分S1和第二弯曲表面部分S2的外壳部分12，并且布置间隙部分11 在第一弯曲表面部分S1和第二曲面部分S2之间，由此包围间隙部分11.此外，关系n1

8. 发明授权

US07760344B2 Optical sampling apparatus 失效
标题翻译：光采样装置
公开(公告)号：US07760344B2
公开(公告)日：2010-07-20
申请号：US12036303
申请日：2008-02-25
申请人： Shigeki Nishina
发明人： Shigeki Nishina
IPC分类号： G01J11/00
CPC分类号： G01J11/00 , G02F1/3536
摘要： Provided is an optical sampling apparatus that samples light to be measured having a pulse waveform, including a sampling light output section that outputs a first sampling light and a second sampling light, both having pulse waveforms of a spectrum different from that of the light to be measured; a first sampling section that includes a first nonlinear optical medium, which causes a nonlinear optical effect by causing at least a portion of the light to be measured and the first sampling light to pass therethrough and outputs light generated by the nonlinear optical effect, and that outputs at least a portion of the light generated by the nonlinear optical effect as a first output light; and a second sampling section that includes a second nonlinear optical medium, which causes a nonlinear optical effect by causing at least a portion of the first output light and the second sampling light to pass therethrough with a temporal overlap in order to output light generated by the nonlinear optical effect, and that outputs at least a portion of the light generated by the nonlinear optical effect as a second output light.
摘要翻译：提供一种光采样装置，其对具有脉波波形的被测量光进行采样，该采样光输出部分输出具有不同于光的光谱的脉冲波形的第一采样光和第二采样光测量; 第一采样部分，其包括第一非线性光学介质，其通过使待测量的光的至少一部分和第一采样光通过并且输出由非线性光学效应产生的光而引起非线性光学效应，并且将由非线性光学效果产生的光的至少一部分输出为第一输出光; 以及第二采样部分，其包括第二非线性光学介质，其通过使第一输出光和第二采样光的至少一部分通过其中的时间重叠而引起非线性光学效应，以便输出由非线性光学效应，并且将由非线性光学效应产生的光的至少一部分输出为第二输出光。

9. 发明授权

US5969809A Light-measuring device for accurate and continuous measurement of light intensity 失效
标题翻译：光度测量装置，用于准确连续地测量光强度
公开(公告)号：US5969809A
公开(公告)日：1999-10-19
申请号：US126781
申请日：1998-07-31
申请人： Shigeki Nishina
发明人： Shigeki Nishina
IPC分类号： G01J1/20 , G01J1/42 , G01J1/44 , G01J1/40
CPC分类号： G01J1/20 , G01J1/42 , G01J1/44
摘要： A light-measuring device is disclosed for continuously and accurately measuring the intensity of light beams of from low intensity to high intensity. The intensity of a light beam to be measured is measured by a photodiode. A bias voltage is applied to the photodiode by a bias power source to improve the saturation characteristic. When the measured light beam is of high intensity, an analog switch and a photo MOS relay are switched on. When measuring a light beam with medium intensity, only the analog switch is turned off and a bias voltage is not applied to the photodiode. When measuring a light beam with low intensity, the bias voltage is not applied to the photodiode by switching off the photo MOS relay.
摘要翻译：公开了一种用于连续且精确地测量从低强度到高强度的光束的强度的光测量装置。通过光电二极管测量待测光束的强度。通过偏置电源将偏置电压施加到光电二极管以提高饱和特性。当测量光束强度高时，模拟开关和光电MOS继电器接通。当测量中等强度的光束时，只有模拟开关被关闭，偏置电压不会施加到光电二极管。当测量低强度的光束时，通过关闭光电MOS继电器，偏置电压不会施加到光电二极管。

10. 发明授权

US5867271A Michelson interferometer including a non-polarizing beam splitter 失效
标题翻译：包括非偏振分束器的迈克尔逊干涉仪
公开(公告)号：US5867271A
公开(公告)日：1999-02-02
申请号：US491907
申请日：1995-07-14
申请人： Isao Tokumoto , Shigeki Nishina
发明人： Isao Tokumoto , Shigeki Nishina
IPC分类号： G01J3/453 , G01B9/02
CPC分类号： G01J3/4535
摘要： A light power spectrum is accurately measured, in spite of the polarized light-dependency of the non-polarizing beam splitter 12. Incident light 11 is separated by a polarizing/separating element 31 into orthogonal polarized light components 11a and 11b. The orthogonal polarized light components have their polarizing directions rotated by 45 degrees in opposite directions with respect to their P wave components and S wave components at the reflecting/transmitting face of the non-polarizing beam splitter. The reflected and transmitted from the non-polarizing beam splitter 12 are reflected by a stationary reflector 16 and a moving reflector 17 back to the non-polarizing beam splitter 12 and are recombined to interfere with each other at the reflecting/transmitting face of the non-polarizing beam splitter. The resulting interference lights are received by a common light-receiver.
摘要翻译： PCT No.PCT / JP94 / 01905 Sec。 371 1995年7月14日第 102（e）日期1995年7月14日PCT 1994年11月11日提交PCT尽管非偏振分束器12具有偏振光依赖性，但是准确地测量了光功率谱。入射光11被偏振/ 将元件31分离为正交偏振光分量11a和11b。正交偏振光分量的偏振方向相对于非偏振光束分离器的反射/透射面处的P波分量和S波分量在相反方向上旋转45度。来自非偏振光束分离器12的反射和透射被固定反射器16和移动反射器17反射回非偏振光束分离器12，并被重新组合以在非偏振光束分离器12的反射/透射面处彼此干涉极化分束器。所产生的干扰光由普通的光接收器接收。

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