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1. 发明授权

US08493057B2 Electromagnetic wave measuring apparatus, measuring method, program, and recording medium 有权
标题翻译：电磁波测量装置，测量方法，程序和记录介质
公开(公告)号：US08493057B2
公开(公告)日：2013-07-23
申请号：US12731483
申请日：2010-03-25
申请人： Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato , Kodo Kawase
发明人： Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato , Kodo Kawase
IPC分类号： G01S3/02
CPC分类号： G01J5/0285 , G01N21/3563 , G01N21/3581 , G01N21/8806
摘要： A detector detects an electromagnetic wave having a frequency of 0.01 THz≦f≦100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.
摘要翻译：检测器检测频率为0.01THz @ f @ 100THz的电磁波，并通过被测器件（DUT）传输。变换器相对于DUT来改变电磁波和DUT的光路的交点的相对位置。导出器基于检测器的检测结果导出电磁波的特征值，而特征值与假设的相对位置相关联，假设的相对位置是电磁波未被DUT折射的相对位置。校正器将假设的相对位置改变为实际的相对位置，如果考虑到DUT的电磁波的折射，则相对位置是相对位置。校正后的发生器基于校正器的输出导出与预定相对位置相关联的特征值。

2. 发明授权

US08210035B2 Collection medium and collection amount measuring apparatus, and measuring method, program, and recording medium of the same 有权
标题翻译：收集介质和收集量测量装置及其测量方法，程序和记录介质
公开(公告)号：US08210035B2
公开(公告)日：2012-07-03
申请号：US12608282
申请日：2009-10-29
申请人： Motoki Imamura , Shigeki Nishina
发明人： Motoki Imamura , Shigeki Nishina
IPC分类号： G01M15/00
CPC分类号： G01N15/0625 , B01D46/0086 , B01D46/2429 , B01D46/2459 , B01D2046/2433 , F01N3/0222 , F01N9/002 , F01N2330/48 , F01N2560/12 , G01N21/3581 , Y02T10/20 , Y02T10/47
摘要： The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.
摘要翻译：本发明在收集废气中的PM的DPF中的PM的密度时精确地测量电磁波的特性值（例如吸收系数）。 DPF接收废气，并收集废气中的PM。 DPF包括第一孔部分，其在用于接收排气的一侧的第一端处开口，并且在与第一端相对的一侧的第二端处封闭，第二孔部分在第一端处封闭，并且是第一孔部分在第二端处开口，在第一端封闭的第三孔部。第一孔部分和第二孔部分彼此相邻。第三孔部彼此相邻。通过隔壁相邻的分隔第一孔部分和第二孔部分的分隔壁排出的废气被分隔壁收集。

3. 发明申请

US20110094300A1 COLLECTION MEDIUM AND COLLECTION AMOUNT MEASURING APPARATUS, AND MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM OF THE SAME 有权
标题翻译：收集中心和收集量测量装置及其测量方法，程序和记录介质
公开(公告)号：US20110094300A1
公开(公告)日：2011-04-28
申请号：US12608282
申请日：2009-10-29
申请人： Motoki IMAMURA , Shigeki NISHINA
发明人： Motoki IMAMURA , Shigeki NISHINA
IPC分类号： G01N9/36 , B01D59/40
CPC分类号： G01N15/0625 , B01D46/0086 , B01D46/2429 , B01D46/2459 , B01D2046/2433 , F01N3/0222 , F01N9/002 , F01N2330/48 , F01N2560/12 , G01N21/3581 , Y02T10/20 , Y02T10/47
摘要： The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.
摘要翻译：本发明在收集废气中的PM的DPF中的PM的密度时精确地测量电磁波的特性值（例如吸收系数）。 DPF接收废气，并收集废气中的PM。 DPF包括：第一端部，其在用于接收排气的一侧的第一端处开口，并且在与第一端相反的一侧的第二端处封闭，第二孔部分在第一端处封闭，并且是第一孔部分在第二端处开口，在第一端封闭的第三孔部。第一孔部分和第二孔部分彼此相邻。第三孔部彼此相邻。通过隔壁相邻的分隔第一孔部分和第二孔部分的分隔壁排出的废气被分隔壁收集。

4. 发明申请

US20050052638A1 Polarization mode dispersion measuring device, method, recording medium 失效
标题翻译：极化模式色散测量装置，方法，记录介质
公开(公告)号：US20050052638A1
公开(公告)日：2005-03-10
申请号：US10491787
申请日：2002-10-09
申请人： Takeshi Ozeki , Tomoyu Yamashita , Motoki Imamura
发明人： Takeshi Ozeki , Tomoyu Yamashita , Motoki Imamura
IPC分类号： G01M11/02 , G01M11/00 , G01J4/00
CPC分类号： G01M11/333 , G01M11/336
摘要： A polarization mode dispersion measuring device reduced in time required to measure polarization mode dispersion τPMD. A polarization controller (12) allows a first (second) incident light to apply a synthetic incident light to an object to be measured (30) in line with a p-polarization axis (s-polarization axis) in a polarization separator (16). Accordingly, the phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first incident light component (second incident light component) in an output from the polarization separator (16) measured by a first measuring unit (20a) (second measuring unit (20b)) are respectively the phase shift equivalent value and amplitude equivalent value of a first column T11, T21 (second column T12, T22) when the transfer function matrix of the object to be measured (30) is a 2×2 matrix to thereby allow a control unit (2) to determine the polarization mode dispersion r PMD of the object to be measured (30). Since there is no need of switching the orientation setting of light output from the polarization controller (12) with the setting left fixed, time required to measure polarization mode dispersion τPMD can be shortened.
摘要翻译：偏振模色散测量装置减少测量偏振模色散τPMD所需的时间。偏振控制器（12）允许第一（第二）入射光根据偏振分离器（16）中的p偏振轴（s偏振轴）将合成入射光施加到待测量对象（30）。因此，由第一测量单元测量的偏振分离器（16）的输出中的第一入射光分量（第二入射光分量）的相移等效值（光学角度频率微分）和振幅等效值（平方值） 20a）（第二测量单元（20b））分别是当被测量对象（30）的传递函数矩阵为（30）时的第一列T11，T21（第二列T12，T22）的相移等效值和振幅当量值 2×2矩阵，从而允许控制单元（2）确定被测量物体的偏振模色散r PMD（30）。由于不需要将固定的偏振控制器（12）的光的输出的取向设置切换，所以可以缩短测量偏振模色散τPMD所需的时间。

5. 发明授权

US06519028B2 Optical characteristic measuring apparatus, the method thereof and recording medium 失效
标题翻译：光学特性测量装置，其方法和记录介质
公开(公告)号：US06519028B2
公开(公告)日：2003-02-11
申请号：US09900968
申请日：2001-07-10
申请人： Eiji Kimura , Motoki Imamura
发明人： Eiji Kimura , Motoki Imamura
IPC分类号： G01N2100
CPC分类号： G01M11/335 , G01M11/333 , G01M11/338
摘要： An apparatus for measuring optical characteristics includes a variable-wavelength light source for generating a variable-wavelength light, having an identification waveform when the wavelength changes, the identification waveform being distinguishable from a normal waveform before and after the wavelength changes, an optical modulator for modulating the variable-wavelength light at a predetermined frequency and inputting it to an optical fiber; and an identification waveform detector for detecting the identification waveform of light transmitted through the optical fiber, wherein since the identification waveform detector detects when the waveform starts to change, it is possible to obtain synchronization between an incidence side and an exit side of the optical fiber. Accordingly, it is possible to obtain synchronization between an incidence side and an exit side of a device-under-test even if the wavelength of light source is continuously swept, whereby characteristics such as chromatic dispersion and the like can be measured.
摘要翻译：一种用于测量光学特性的装置包括：用于产生可变波长光的可变波长光源，当波长变化时具有识别波形，识别波形与波长变化前后的正常波形区分开;光学调制器，以预定频率调制可变波长光并将其输入到光纤; 以及识别波形检测器，用于检测通过光纤传输的光的识别波形，其中由于识别波形检测器检测波形何时开始变化，可以获得光纤的入射侧和出射侧之间的同步。因此，即使光源的波长连续地扫过，也可以获得被测器件的入射侧和出射侧之间的同步，从而可以测量诸如色散等的特性。

6. 发明授权

US08969807B2 Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the same 有权
标题翻译：载体和附着量测量装置及其测量方法，程序和记录介质
公开(公告)号：US08969807B2
公开(公告)日：2015-03-03
申请号：US13679081
申请日：2012-11-16
申请人： Motoki Imamura , Shigeki Nishina
发明人： Motoki Imamura , Shigeki Nishina
IPC分类号： G01J5/02 , G01N21/17 , G01N21/3581 , G01N21/3504
CPC分类号： G01N21/17 , G01N21/3504 , G01N21/3581
摘要： A carrier includes attachment holes to which a catalyst attaches, and non-attachment holes to which the catalyst does not attach. An attachment quantity measurement device includes an electromagnetic wave output device that outputs a terahertz wave toward the carrier, an electromagnetic wave detector that detects the terahertz wave which has transmitted through the carrier, a reference value obtainer that obtains, based on a result detected by the electromagnetic wave detector, any one of an absorption rate, a group delay, and a dispersion of the terahertz wave in the non-attachment holes, and an attachment quantity obtainer that obtains, based on the result detected by the electromagnetic wave detector and the result obtained by the reference value obtainer, a weight or a density of the catalyst present in the attachment holes.
摘要翻译：载体包括催化剂附着的附着孔和催化剂不附着的不附着孔。安装量测量装置包括向载体输出太赫兹波的电磁波输出装置，检测通过载波传输的太赫兹波的电磁波检测器，基于由该载波检测到的结果获得的参考值获取器电磁波检测器，非附着孔中的太赫兹波的吸收率，群延迟和色散中的任一种，以及基于由电磁波检测器检测出的结果和结果获得的安装量获取器通过参考值获得器获得，存在于附接孔中的催化剂的重量或密度。

7. 发明授权

US08053733B2 Electromagnetic wave measuring apparatus 有权
标题翻译：电磁波测量仪
公开(公告)号：US08053733B2
公开(公告)日：2011-11-08
申请号：US12616992
申请日：2009-11-12
申请人： Shigeki Nishina , Motoki Imamura
发明人： Shigeki Nishina , Motoki Imamura
IPC分类号： G01J5/02
CPC分类号： G01N21/3581
摘要： A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] incident to a device under a test while decreasing a beam diameter of the electromagnetic wave to be measured, a scanning stage which rotates, about a line orthogonal to an optical axis of the incident lens as a rotational axis, the device under the test or the optical axis, and an electromagnetic wave detector which detects the electromagnetic wave to be measured which has transmitted through the device under the test, where a coordinate on the optical axis of a position which gives the minimum value d of the beam diameter is different from a coordinate on the optical axis of the rotational axis.
摘要翻译：测量时的期望空间分辨率可以通过使包含入射到被测器件的太赫兹波（其频率等于或大于0.01 [THz]，等于或小于100 [THz]）的电磁波来实现。电磁波测量装置包括入射透镜，该入射透镜使得测量的电磁波具有等于或大于在测试时入射到设备的0.01 [THz]且等于或小于100 [THz]的频率，同时减小光束要测量的电磁波的直径，围绕与入射透镜的光轴正交的线作为旋转轴旋转的扫描台，被测装置或光轴的电磁波检测器，以及检测通过测试中的装置传输的要测量的电磁波，其中给出光束直径的最小值d的位置的光轴上的坐标不同于旋转轴的光轴上的坐标。

8. 发明申请

US20110097649A1 CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM OF THE SAME 审中-公开
标题翻译：载体和粘合量测量装置及其测量方法，程序和记录介质
公开(公告)号：US20110097649A1
公开(公告)日：2011-04-28
申请号：US12608208
申请日：2009-10-29
申请人： Motoki IMAMURA , Shigeki NISHINA
发明人： Motoki IMAMURA , Shigeki NISHINA
IPC分类号： H01M4/64 , H01M4/88 , G06F19/00
CPC分类号： G01N21/17 , G01N21/3504 , G01N21/3581
摘要： The present invention measures a quantity of attachment (such as density) of a material (such as catalyst and promoter) attached to a carrier. A carrier 1 includes attachment holes 12 to which a catalyst 24 attaches, and non-attachment holes 14 to which the catalyst 24 does not attach, where extension directions of the attachment holes 12 and the non-attachment holes 14 are parallel with each other (perpendicular to a first end surface 1a), and are opened on the first end surface 1a and a second end surface 1b. An attachment quantity measurement device includes an electromagnetic wave output device 2 that outputs a terahertz wave at a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward the carrier 1, an electromagnetic wave detector 4 that detects the terahertz wave which has transmitted through the carrier 1, a reference value deriving unit 7 that derives, based on a result detected by the electromagnetic wave detector 4, any one of an absorption rate, a group delay, and a dispersion of the terahertz wave in the non-attachment holes 14, and an attachment quantity deriving unit 8 that derives, based on the result detected by the electromagnetic wave detector 4 and the result derived by the reference value deriving unit 7, a weight or a density of the catalyst 24 present in the attachment holes 12.
摘要翻译：本发明测量附着于载体的材料（如催化剂和助催化剂）的附着量（如密度）。载体1包括催化剂24附着的附接孔12和催化剂24未附着的未安装孔14，其中安装孔12和非安装孔14的延伸方向彼此平行（垂直于第一端面1a），并且在第一端面1a和第二端面1b上开口。安装量测量装置包括电磁波输出装置2，其以等于或大于0.01 [THz]且等于或小于100 [THz]的频率向载体1输出太赫兹波;电磁波检测器4，其检测通过载波1发送的太赫兹波;基准值导出单元7，其基于由电磁波检测器4检测到的结果导出太赫兹的吸收率，群延迟和色散中的任何一个基于由电磁波检测器4检测到的结果和由基准值导出单元7导出的结果导出催化剂的重量或密度的附着量导出单元8， 24存在于附接孔12中。

9. 发明申请

US20110075127A1 ELECTROMAGNETIC WAVE MEASURING APPARATUS 有权
标题翻译：电磁波测量装置
公开(公告)号：US20110075127A1
公开(公告)日：2011-03-31
申请号：US12616992
申请日：2009-11-12
申请人： Shigeki NISHINA , Motoki IMAMURA
发明人： Shigeki NISHINA , Motoki IMAMURA
IPC分类号： G01J3/00
CPC分类号： G01N21/3581
摘要： A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] incident to a device under a test while decreasing a beam diameter of the electromagnetic wave to be measured, a scanning stage which rotates, about a line orthogonal to an optical axis of the incident lens as a rotational axis, the device under the test or the optical axis, and an electromagnetic wave detector which detects the electromagnetic wave to be measured which has transmitted through the device under the test, where a coordinate on the optical axis of a position which gives the minimum value d of the beam diameter is different from a coordinate on the optical axis of the rotational axis.
摘要翻译：测量时的期望空间分辨率可以通过使包含入射到被测器件的太赫兹波（其频率等于或大于0.01 [THz]，等于或小于100 [THz]）的电磁波来实现。电磁波测量装置包括入射透镜，该入射透镜使得测量的电磁波具有等于或大于在测试时入射到设备的0.01 [THz]且等于或小于100 [THz]的频率，同时减小光束要测量的电磁波的直径，围绕与入射透镜的光轴正交的线作为旋转轴旋转的扫描台，被测装置或光轴的电磁波检测器，以及检测通过测试中的装置传输的要测量的电磁波，其中给出光束直径的最小值d的位置的光轴上的坐标不同于旋转轴的光轴上的坐标。

10. 发明授权

US06433865B1 Apparatus and method for measuring optical characteristics and recording medium 失效
标题翻译：用于测量光学特性和记录介质的装置和方法
公开(公告)号：US06433865B1
公开(公告)日：2002-08-13
申请号：US09975557
申请日：2001-10-12
申请人： Eiji Kimura , Motoki Imamura , Toshio Kawazawa , Satoru Nagumo
发明人： Eiji Kimura , Motoki Imamura , Toshio Kawazawa , Satoru Nagumo
IPC分类号： G01N2100
CPC分类号： G01M11/335 , G01M11/333 , G01M11/338
摘要： To provide an apparatus for measuring chromatic dispersion when modulating frequency of a variable wavelength light source is different from modulating frequency of a fixed wavelength light source for reference. This apparatus is provided with a variable wavelength light phase comparator 24 for obtaining a phase difference &phgr;x-&phgr;x′ between a variable wavelength light component and a signal having the first modulating frequency fmx, a fixed wavelength light phase comparator 25 for obtaining a phase difference between a phase difference &phgr;0-&phgr;0′ between a fixed wavelength light component and an electrical signal having the second modulating frequency fm0, a phase difference converter 26 for converting the phase difference &phgr;0-&phgr;0′ calculated by the fixed wavelength light phase comparator 25 into &phgr;ex, which corresponds to the first modulating frequency fmx, and a true phase difference calculator 27 for measuring a true phase difference &phgr; between the phase difference &phgr;x-&phgr;x′ calculated by the variable wavelength light phase comparator 24, and the converted result &phgr;ex of phase difference converter 26, and obtains the true phase difference &phgr; from which an affect of contraction/extension of a DUT 30 is removed when the first modulating frequency fmx and the second modulating frequency fm0 are different, thereby measuring wave dispersion.
摘要翻译：提供一种用于测量可变波长光源的调制频率时的色散的装置与用于参考的固定波长光源的调制频率不同。该装置设置有可变波长光相位比较器24，用于获得相位差phix- 可变波长光分量和具有第一调制频率fmx的信号之间的“phix”，固定波长光相位比较器25，用于获得固定波长光分量与具有第一调制频率fmx的电信号之间的相位差phi0-phi0'之间的相位差第二调制频率fm0，用于将由固定波长光相位比较器25计算出的相位差phi0-phi0'转换成对应于第一调制频率fmx的phiex的相位差转换器26和用于测量相位差phix-phix'ca之间的真相位差phi 由可变波长光相位比较器24计算的相位差转换器26的转换结果phix，并获得当第一调制频率fmx和第二调制频率fm0不同，从而测量波分散。

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