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    • 3. 发明授权
    • Apparatus and method for enhanced degassing of semiconductor wafers for increased throughput
    • 用于增强半导体晶片脱气的装置和方法,以增加生产量
    • US06497734B1
    • 2002-12-24
    • US10037026
    • 2002-01-02
    • Kenneth K. BarberMark FisselSoo Yun JohMukul KhoslaKarl B. LevyRobert MartinsonMichael MeyersDhairya Shrivastava
    • Kenneth K. BarberMark FisselSoo Yun JohMukul KhoslaKarl B. LevyRobert MartinsonMichael MeyersDhairya Shrivastava
    • H01L21324
    • H01L21/67757H01L21/67017Y10S438/908Y10S438/909Y10T29/41
    • A multi-level shelf degas station relying on at least two heaters integrated within wafer holding shelves or slots, where the semiconductor wafers do not have direct contact with the heater shelves. The heaters provide conduction heating. In order to degas a wafer, the heater and wafer holder assembly is positioned in a sequential manner through each wafer slot to the next available slot. If a degassed wafer exists in the slot, a transfer chamber arm removes it. A loader arm then places a wafer in the available, empty slot and the stage is moved upwards to receive the wafer from the loader arm. The transfer chamber arm removes an individual wafer from the heater and wafer holder assembly allowing the removed wafer to be individually processed while the other wafers remain in the heater and wafer holder assembly. In some instances, a loader arm may also remove wafers. The remaining wafers in the heater and wafer holder assembly are subjected to further degas treatment while the wafer(s) removed by the transfer chamber arm are exposed to other process steps. Air-cooling chambers are employed to facilitate cooling the wafer slots for ease of removal and maintenance.
    • 依赖于集成在晶片保持架或狭槽内的至少两个加热器的多级货架脱气站,其中半导体晶片不与加热器搁架直接接触。 加热器提供传导加热。 为了使晶片脱气,加热器和晶片保持器组件以顺序的方式定位成通过每个晶片槽到下一个可用的槽。 如果在槽中存在脱气的晶片,则传送室臂将其移除。 然后,装载臂将晶片放置在可用的空槽中,并且台架向上移动以从装载臂接收晶片。 传送室臂从加热器和晶片保持器组件移除单个晶片,允许将移除的晶片单独处理,而其它晶片保留在加热器和晶片保持器组件中。 在一些情况下,装载臂也可以移除晶片。 在加热器和晶片保持器组件中的剩余晶片经受进一步的脱气处理,同时通过转移室臂移除的晶片暴露于其它工艺步骤。 采用空气冷却室以便于冷却晶片槽以便于去除和维护。