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    • 2. 发明申请
    • SLIDING ROOF SYSTEM
    • 滑动屋顶系统
    • US20140054934A1
    • 2014-02-27
    • US13970166
    • 2013-08-19
    • Stefan VogelStefan KunkelRainer Arnold
    • Stefan VogelStefan KunkelRainer Arnold
    • B60J7/043B60J7/19
    • B60J7/043B60J7/192
    • A sliding roof system is shown having a pair of guide rails, a slide in each guide rail, the slide being displaceably mounted therein, a functional component which is displaceably received in the guide rail and can be fixed in a raised position by means of a latching hook, the latching hook being shiftable between a release position and a latching position, the latching hook when in the latching position engaging in an opening of the guide rail, and a cover which can be opened from a closed position by displacement of the slide, a retaining member being provided which can mechanically hold the latching hook in the latching position, wherein the retaining lever is adapted to be pivoted about a pivot pin between the release position and the retaining position.
    • 滑动车顶系统被示为具有一对导轨,每个导轨中的滑块,可移动地安装在其中的滑块,可移动地容纳在导轨中的功能部件,并且可以通过 所述闩锁钩可在释放位置和锁定位置之间移动,所述闩锁钩处于与所述导轨的开口啮合的所述闩锁位置时,所述闩锁钩可以通过所述滑块的位移从关闭位置打开 设置有能够将闩锁钩机械地保持在闩锁位置的保持构件,其中,保持杆适于在释放位置和保持位置之间围绕枢转销枢转。
    • 9. 发明申请
    • Particle Beam System
    • 粒子束系统
    • US20120025077A1
    • 2012-02-02
    • US13247979
    • 2011-09-28
    • Hubert MantzRainer ArnoldMichael Albiez
    • Hubert MantzRainer ArnoldMichael Albiez
    • H01J37/26
    • H01J37/28H01J37/05H01J37/222H01J37/244H01J37/256
    • A particle beam system comprises a particle beam source 5 for generating a primary particle beam 13, an objective lens 19 for focusing the primary particle beam 13 in an object plane 23; a particle detector 17; and an X-ray detector 47 arranged between the objective lens and the object plane. The X-ray detector comprises plural semiconductor detectors, each having a detection surface 51 oriented towards the object plane. A membrane is disposed between the object plane and the detection surface of the semiconductor detector, wherein different semiconductor detectors have different membranes located in front, the different membranes differing with respect to a secondary electron transmittance.
    • 粒子束系统包括用于产生一次粒子束13的粒子束源5,用于将一次粒子束13聚焦在物平面23中的物镜19; 粒子检测器17; 以及布置在物镜和物平面之间的X射线检测器47。 X射线检测器包括多个半导体检测器,每个半导体检测器具有朝向物体平面的检测表面51。 膜位于物体平面和半导体检测器的检测表面之间,其中不同的半导体检测器具有位于前面的不同的膜,不同的膜相对于二次电子透射率不同。