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    • 1. 发明授权
    • Lithographic apparatus and device manufacturing method
    • 平版印刷设备和器件制造方法
    • US07684009B2
    • 2010-03-23
    • US11647426
    • 2006-12-29
    • Pieter Willem Herman De JagerCheng-Qun GuiPeter SpitEduard Hoeberichts
    • Pieter Willem Herman De JagerCheng-Qun GuiPeter SpitEduard Hoeberichts
    • G03B27/52
    • G03F7/70275G03F7/70291G03F7/70916G03F7/70983
    • A lithographic apparatus and method in which an illumination system supplies a projection beam, a patterning system imparts to the beam a pattern in its cross section, and a projection system projects the patterned beam onto a target portion of a substrate. The projection system comprises an array of lenses spaced from the substrate such that each lens in the array focuses part of the patterned beam onto the substrate. A displacement system causes displacement between the lens array and the substrate. A particle detector detects particles on the substrate which are approaching the lens array. A free working distance control system increases the spacing between the lens array and the substrate in response to detection of a particle. The lens array is moved away from the substrate as the detected particle passes the lens array. Thus damage to the lens array can be avoided.
    • 一种光刻设备和方法,其中照明系统提供投影光束,图案化系统在其横截面中赋予光束图案,并且投影系统将图案化的光束投射到基板的目标部分上。 投影系统包括与衬底间隔开的透镜阵列,使得阵列中的每个透镜将图案化束的一部分聚焦到衬底上。 位移系统导致透镜阵列和基板之间的位移。 颗粒检测器检测正在接近透镜阵列的基板上的颗粒。 响应于颗粒的检测,自由工作距离控制系统增加了透镜阵列和基板之间的间隔。 当检测到的颗粒通过透镜阵列时,透镜阵列移动离开基板。 因此可以避免对透镜阵列的损坏。
    • 3. 发明授权
    • Lithographic apparatus, device manufacturing method, and device manufactured thereby
    • 平版印刷设备,器件制造方法和由此制造的器件
    • US07375795B2
    • 2008-05-20
    • US11018930
    • 2004-12-22
    • Joeri LofJeroen FluitBernardus Antonius Johannes LuttikhuisPeter Spit
    • Joeri LofJeroen FluitBernardus Antonius Johannes LuttikhuisPeter Spit
    • G03B27/42
    • G03F7/70791G03F7/70291
    • Substrate processing apparatus includes a lithographic apparatus which comprises an illumination system for supplying a projection beam of radiation, an array of individually controllable elements serving to impart the projection beam with a pattern in its cross-section, and a projection system for projecting the patterned beam onto a target portion of a substrate. The processing apparatus also includes a substrate supply arranged to output at least one unbroken length of substrate, and a substrate conveying system arranged to convey each outputted unbroken length of substrate from the substrate supply and past the projection system such that the projection system is able to project the patterned beam onto a series of target portions along each unbroken length of substrate. In certain embodiments, long lengths of substrate are supplied from a roll, but alternatively a series of separate sheets can be supplied.
    • 基板处理装置包括光刻设备,该光刻设备包括用于提供投射辐射束的照明系统,用于使投影光束在其横截面上具有图案的独立可控元件的阵列,以及投影系统, 到基板的目标部分上。 处理装置还包括布置成输出至少一个不间断长度的基板的基板供给源,以及基板输送系统,其布置成将基板的每个输出的不间断长度从基板供给输送并经过投影系统,使得投影系统能够 沿着每个不间断长度的衬底将图案化的光束投影到一系列目标部分上。 在某些实施例中,长的基底是从卷筒供应的,但也可以提供一系列单独的片材。
    • 5. 发明申请
    • Lithographic apparatus and device manufacturing method
    • 平版印刷设备和器件制造方法
    • US20070109510A1
    • 2007-05-17
    • US11647426
    • 2006-12-29
    • Pieter Willem De JagerCheng-Qun GuiPeter SpitEduard Hoeberichts
    • Pieter Willem De JagerCheng-Qun GuiPeter SpitEduard Hoeberichts
    • G03B27/52
    • G03F7/70275G03F7/70291G03F7/70916G03F7/70983
    • A lithographic apparatus and method in which an illumination system supplies a projection beam, a patterning system imparts to the beam a pattern in its cross section, and a projection system projects the patterned beam onto a target portion of a substrate. The projection system comprises an array of lenses spaced from the substrate such that each lens in the array focuses part of the patterned beam onto the substrate. A displacement system causes displacement between the lens array and the substrate. A particle detector detects particles on the substrate which are approaching the lens array. A free working distance control system increases the spacing between the lens array and the substrate in response to detection of a particle. The lens array is moved away from the substrate as the detected particle passes the lens array. Thus damage to the lens array can be avoided.
    • 一种光刻设备和方法,其中照明系统提供投影光束,图案化系统在其横截面中赋予光束图案,并且投影系统将图案化的光束投射到基板的目标部分上。 投影系统包括与衬底间隔开的透镜阵列,使得阵列中的每个透镜将图案化束的一部分聚焦到衬底上。 位移系统导致透镜阵列和基板之间的位移。 颗粒检测器检测正在接近透镜阵列的基板上的颗粒。 响应于颗粒的检测,自由工作距离控制系统增加了透镜阵列和基板之间的间隔。 当检测到的颗粒通过透镜阵列时,透镜阵列移动离开基板。 因此可以避免对透镜阵列的损坏。
    • 7. 发明申请
    • Lithographic apparatus, device manufacturing method, and device manufactured thereby
    • 平版印刷设备,器件制造方法和由此制造的器件
    • US20060132735A1
    • 2006-06-22
    • US11018930
    • 2004-12-22
    • Joeri LofJeroen FluitBernardus LuttikhuisPeter Spit
    • Joeri LofJeroen FluitBernardus LuttikhuisPeter Spit
    • G03B27/42
    • G03F7/70791G03F7/70291
    • Substrate processing apparatus includes a lithographic apparatus which comprises an illumination system for supplying a projection beam of radiation, an array of individually controllable elements serving to impart the projection beam with a pattern in its cross-section, and a projection system for projecting the patterned beam onto a target portion of a substrate. The processing apparatus also includes a substrate supply arranged to output at least one unbroken length of substrate, and a substrate conveying system arranged to convey each outputted unbroken length of substrate from the substrate supply and past the projection system such that the projection system is able to project the patterned beam onto a series of target portions along each unbroken length of substrate. In certain embodiments, long lengths of substrate are supplied from a roll, but alternatively a series of separate sheets can be supplied.
    • 基板处理装置包括光刻设备,该光刻设备包括用于提供投射辐射束的照明系统,用于使投影光束在其横截面上具有图案的独立可控元件的阵列,以及投影系统, 到基板的目标部分上。 处理装置还包括布置成输出至少一个不间断长度的基板的基板供给源,以及基板输送系统,其布置成将基板的每个输出的不间断长度从基板供给输送并经过投影系统,使得投影系统能够 沿着每个不间断长度的衬底将图案化的光束投影到一系列目标部分上。 在某些实施例中,长的基底是从卷筒供应的,但也可以提供一系列单独的片材。
    • 8. 发明申请
    • Lithographic apparatus and device manufacturing method
    • 平版印刷设备和器件制造方法
    • US20060001847A1
    • 2006-01-05
    • US10880435
    • 2004-06-30
    • Pieter De JagerCheng-Qun GuiPeter SpitEduard Hoeberichts
    • Pieter De JagerCheng-Qun GuiPeter SpitEduard Hoeberichts
    • G03B27/52
    • G03F7/70275G03F7/70291G03F7/70916G03F7/70983
    • A lithographic apparatus and method in which an illumination system supplies a projection beam of radiation, a patterning system imparts to the beam a pattern in its cross section, and a projection system projects the patterned beam onto a target portion of a substrate supported on a substrate table. The projection system comprises an array of lenses located at a spacing from the substrate such that each lens in the array focuses a respective part of the patterned beam onto the substrate. A displacement system causes relative displacement between the lens array and the substrate. A particle detector is positioned to detect particles on the substrate which are approaching the lens array as a result of relative displacement between the lens array and the substrate. A free working distance control system is arranged to increase the spacing between the lens array and the substrate in response to detection of a particle by the detector such that the lens array is moved away from the substrate as relative displacement causes the detected particle to pass the lens array. Thus damage to the lens array as a result of for example scratching by particles carried on the substrate surface can be avoided.
    • 一种光刻设备和方法,其中照明系统提供投影辐射束,图案化系统将光束赋予其横截面中的图案,并且投影系统将图案化的光束投影到支撑在衬底上的衬底的目标部分上 表。 投影系统包括位于与衬底间隔的透镜阵列,使得阵列中的每个透镜将图案化束的相应部分聚焦到衬底上。 位移系统导致透镜阵列和基底之间的相对位移。 定位粒子检测器以检测由于透镜阵列和基底之间的相对位移而正在接近透镜阵列的基底上的颗粒。 布置一个自由的工作距离控制系统以响应于检测器检测到的颗粒而增加透镜阵列和基板之间的间距,使得透镜阵列相对于基板移动离开基板,因为相对位移导致检测到的颗粒通过 镜头阵列 因此,可以避免由于例如由承载在基板表面上的颗粒划伤而导致的透镜阵列的损坏。