会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 6. 发明授权
    • Method of generating test patterns for detecting small delay defects
    • 生成用于检测小延迟缺陷的测试模式的方法
    • US09201116B1
    • 2015-12-01
    • US14340572
    • 2014-07-25
    • Anurag JindalNaman GuptaSagar KatariaPragya Shukla
    • Anurag JindalNaman GuptaSagar KatariaPragya Shukla
    • G01R31/28G01R31/3177
    • G01R31/318328
    • A method of generating test patterns for testing a semiconductor processor for small delay defects (SDD) includes modifying interconnect delay values of interconnect paths by introducing values corresponding to (i) set-up and clock to Q delays of elements in the paths and (ii) latencies of associated clock networks. Critical nodes are selected and test patterns targeting the selected critical nodes are generated using timing slack resulting from the modified interconnect delays. A first selection of nodes that are critical in at-speed scan mode testing and a second selection of nodes that are critical in functional mode testing are made by static timing analysis (STA). Only the nodes featuring in both the first and second selections are selected for targeting small delay defects using at-speed scan test patterns.
    • 产生用于测试用于小延迟缺陷(SDD)的半导体处理器的测试图案的方法包括通过将对应于(i)设置和时钟的值引入到路径中的元素的Q延迟来修改互连路径的互连延迟值, )相关时钟网络的延迟。 选择关键节点,并使用由修改的互连延迟导致的定时松弛来生成针对所选关键节点的测试模式。 在速度扫描模式测试中关键的节点的第一选择和在功能模式测试中关键的节点的第二选择是通过静态时序分析(STA)进行的。 选择在第一和第二选择中特征的节点,以使用高速扫描测试图案来瞄准小的延迟缺陷。