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    • 5. 发明授权
    • Drive laser for EUV light source
    • 驱动激光用于EUV光源
    • US07518787B2
    • 2009-04-14
    • US11452558
    • 2006-06-14
    • Alexander N. BykanovJerzy R. HoffmanIgor V. FomenkovWilliam N. Partlo
    • Alexander N. BykanovJerzy R. HoffmanIgor V. FomenkovWilliam N. Partlo
    • H01S4/00H01S3/22H01S3/223
    • H01S3/2316H01S3/0057H01S3/11H01S3/2232H01S3/225H05G1/54H05G2/008
    • A laser light source is disclosed having a laser oscillator producing an output beam; a first amplifier amplifying the output beam to produce a first amplified beam, and a second amplifier amplifying the first amplified beam to produce a second amplified beam. For the source, the first amplifier may have a gain medium characterized by a saturation energy (Es, 1) and a small signal gain (go, 1); and the second amplifier may have a gain medium characterized by a saturation energy (Es, 2) and a small signal gain (go, 2), with (go, 1)>(go, 2) and (Es, 2)>(Es, 1). In another aspect, a laser oscillator of a laser light source may be a cavity dumped laser oscillator, e.g. a mode-locked laser oscillator, q-switched laser oscillator and may further comprising a temporal pulse stretcher.
    • 公开了具有产生输出光束的激光振荡器的激光源; 放大所述输出光束以产生第一放大光束的第一放大器,以及放大所述第一放大光束以产生第二放大光束的第二放大器。 对于源,第一放大器可以具有以饱和能量(Es,1)和小信号增益(go,1)为特征的增益介质; 并且第二放大器可以具有特征在于饱和能量(Es,2)和小信号增益(go,2)的增益介质,其中(go,1)>(go,2)和(Es,2)>( Es,1)。 在另一方面,激光光源的激光振荡器可以是空腔倾覆的激光振荡器,例如。 模式锁定激光振荡器,q切换激光振荡器,并且还可以包括时间脉冲展开器。
    • 9. 发明授权
    • LPP EUV drive laser input system
    • LPP EUV驱动激光输入系统
    • US07402825B2
    • 2008-07-22
    • US11168785
    • 2005-06-28
    • Rodney D. SimmonsJohn W. ViatellaJerzy R. HoffmanR. Kyle WebbAlexander N. BykanovOleh Khodykin
    • Rodney D. SimmonsJohn W. ViatellaJerzy R. HoffmanR. Kyle WebbAlexander N. BykanovOleh Khodykin
    • G21G4/00
    • H05G2/001
    • A laser produced plasma (“LPP”) extreme ultraviolet (“EUV”) light source and method of operating same is disclosed which may comprise an EUV plasma production chamber having a chamber wall; a drive laser entrance window in the chamber wall; a drive laser entrance enclosure intermediate the entrance window and a plasma initiation site within the chamber and comprising an entrance enclosure distal end opening; at least one aperture plate intermediate the distal opening and the entrance window comprising at least one drive laser passage aperture. The at least one aperture plate may comprise at least two aperture plates comprising a first aperture plate and a second aperture plate defining an aperture plate interim space. The at least one drive laser aperture passage may comprise at least two drive laser aperture passages. The laser passage aperture may define an opening large enough to let the drive laser beam pass without attenuation and small enough to substantially reduce debris passing through the laser passage aperture in the direction of the entrance window.
    • 公开了一种激光产生的等离子体(“LPP”)极紫外(“EUV”)光源及其操作方法,其可以包括具有室壁的EUV等离子体生产室; 在室壁中的驱动激光入口窗口; 在入口窗口中间的驱动激光入口外壳和腔室内的等离子体起始位置,并且包括入口外壳远端开口; 在远端开口和入口窗之间的至少一个孔板包括至少一个驱动激光通道孔。 至少一个孔板可以包括至少两个孔板,其包括限定孔板中间空间的第一孔板和第二孔板。 至少一个驱动激光孔通道可以包括至少两个驱动激光孔通道。 激光通道孔可以限定足够大的开口,使得驱动激光束通过而不衰减,并且足够小以基本上减少通过入口窗口方向的穿过激光通道孔的碎屑。
    • 10. 发明授权
    • Systems and methods for EUV light source metrology
    • EUV光源计量系统和方法
    • US07394083B2
    • 2008-07-01
    • US11177501
    • 2005-07-08
    • Norbert R. BoweringJerzy R. Hoffman
    • Norbert R. BoweringJerzy R. Hoffman
    • G01J1/42
    • G03F7/7085B82Y10/00G21K2201/061
    • Systems and methods for EUV Light Source metrology are disclosed. In a first aspect, a system for measuring an EUV light source power output may include a photoelectron source material disposed along an EUV light pathway to expose the material and generate a quantity of photoelectrons. The system may further include a detector for detecting the photoelectrons and producing an output indicative of EUV power. In another aspect, a system for measuring an EUV light intensity may include a multi-layer mirror, e.g., Mo/Si, disposable along an EUV light pathway to expose the mirror and generate a photocurrent in the mirror. A current monitor may be connected to the mirror to measure the photocurrent and produce an output indicative of EUV power. In yet another aspect, an off-line EUV metrology system may include an instrument for measuring a light characteristic and MoSi2/Si multi-layer mirror.
    • 披露了EUV光源计量系统和方法。 在第一方面,用于测量EUV光源功率输出的系统可以包括沿着EUV光路设置的光电子源材料,以暴露材料并产生一定量的光电子。 该系统还可以包括用于检测光电子并产生指示EUV功率的输出的检测器。 在另一方面,用于测量EUV光强度的系统可以包括多层反射镜,例如Mo / Si,沿着EUV光路径可弃,以暴露反射镜并在反射镜中产生光电流。 电流监视器可以连接到反射镜以测量光电流并产生指示EUV功率的输出。 在另一方面,离线EUV测量系统可以包括用于测量光特性和MoSi 2 / Si多层反射镜的仪器。