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    • 2. 发明授权
    • Device for manufacturing large-surface, tape-shaped silicon bodies for
solar cells
    • 用于制造太阳能电池的大面积,带状硅体的装置
    • US4563976A
    • 1986-01-14
    • US512733
    • 1983-07-11
    • Helmut FoellJosef GrabmaierRichard Falckenberg
    • Helmut FoellJosef GrabmaierRichard Falckenberg
    • C30B15/06C30B15/00C30B29/06B05C3/15B05C11/02
    • C30B15/007Y10S117/903Y10T117/1048Y10T117/1056
    • In an exemplary embodiment, tape-shaped silicon bodies for solar cells are formed by continuous coating of a carrier body having a mesh structure. A melt bath receives the silicon melt and has a floor part with capillary openings therein for supplying the melt, the capillary openings leading perpendicularly toward the exterior of the vat and proceeding parallel to one another, and wherein a channel for the guidance of the carrier body proceeding in a horizontal direction is disposed below the melt vat in the region of the capillary openings. The guide channel for the carrier body can also be disposed above a body with capillaries proceeding parallel in a vertical direction, the body being partially immersed in the vat containing the silicon melt for the purpose of supplying the melt via the capillaries. The devices enable continuous tape drawing from a silicon melt wherein convection currents are avoided in the melt.
    • 在一个示例性实施例中,用于太阳能电池的带状硅体通过具有网状结构的载体主体的连续涂覆而形成。 熔体槽容纳硅熔体并且具有用于供应熔体的毛细管开口的底部部件,毛细管开口垂直朝向槽的外部引导并且彼此平行地延伸,并且其中用于引导载体主体的通道 沿着水平方向延伸设置在毛细管开口区域内的熔体槽的下方。 用于承载体的引导通道也可以设置在主体上方,毛细管沿垂直方向平行地延伸,该主体部分地浸入含有硅熔体的槽中,以便通过毛细管供应熔体。 这些装置能够从硅熔体连续地进行拉制,其中在熔体中避免对流。
    • 4. 发明授权
    • Method for determining the recombination rate of minority carriers at
boundary surfaces between semiconductors and other substances
    • 用于确定少数载体在半导体与其他物质之间的边界表面的重组速率的方法
    • US5130643A
    • 1992-07-14
    • US617588
    • 1990-11-26
    • Helmut FoellVolker Lehmann
    • Helmut FoellVolker Lehmann
    • G01N21/00G01R31/265H01L21/66
    • G01R31/2656
    • For a two-stage measuring method, a respective cell having an electrode therein is applied to the front surface and to the rear surface of a semiconductor wafer, whereby only the cell as the rear surface is filled with an electrolyte in the first measuring step. The minority carrier photo current I.sub.2 ' flowing between the electrode and the semiconductor surface in the rear cell, given illumination of the front cell of the semiconductor crystal wafer, is dependent on the recombination speed S at the front surface. In the second measuring step, the front cell is also filled with electrolyte and both the rear surface photo current I.sub.2, given what is now a negligible influence of the value S as well as the front surface photo current I.sub.1 are measured. The recombination speed S can be calculated from the measure photo currents with the assistance of a mathematical equation. Given point-by-point illumination and scanning over the crystal wafer, the topical distribution of the recombination speed is obtained.
    • 对于两级测量方法,其中具有电极的各个单元被施加到半导体晶片的前表面和后表面,由此在第一测量步骤中仅仅将电池作为后表面填充有电解质。 在半导体晶体晶片的正面单元的照明下,在电池中的电极和半导体表面之间流动的少数载流子光电流I2'取决于前表面的复合速度S. 在第二测量步骤中,前电池还充满电解质,并且测量了现在对值S以及前表面光电流I1可忽略的影响的背面光电流I2。 可以借助于数学方程式从测量光电流计算复合速度S. 通过逐点照明和晶片上的扫描,可获得复合速度的局部分布。
    • 8. 发明授权
    • Method and apparatus for large-area electrical contacting of a
semiconductor crystal body with the assistance of electrolytes
    • 电解质辅助半导体晶体的大面积电接触方法与装置
    • US5209833A
    • 1993-05-11
    • US527277
    • 1990-05-22
    • Helmut FoellVolker Lehmann
    • Helmut FoellVolker Lehmann
    • H01L21/66G01R31/265
    • G01R31/2656
    • A semiconductor crystal wafer is fixed between two electrolyte-filled cells so that the front surface and rear surface thereof are respectively in contact with an electrolyte. A respective electrode is located in the electrolyte, a DC voltage being applied between these electrodes so that the semiconductor-to-electrolyte contact of the one cell is polarized in the conducting direction and the other is polarized in the non-conducting direction. A current flow through the semiconductor crystal body is enabled in that the inhibiting surface of the semiconductor crystal is illuminated and charge carriers are generated as a result thereof. On the basis of the selection of suitable electrolytes and the intensity of illumination, high current density is possible even given high-impedance semiconductor crystal wafers as well as semiconductor crystal bodies having doping steps or pn junctions. The method is particularly simple in many semiconductor processing and analyses methods.
    • 将半导体晶体晶片固定在两个电解质填充单元之间,使其前表面和后表面分别与电解质接触。 相应的电极位于电解质中,在这些电极之间施加直流电压,使得一个电池的半导体与电解质的接触在导电方向上极化,另一个在非导通方向上极化。 通过半导体晶体的电流可以被实现,因为半导体晶体的抑制表面被照亮,因此产生电荷载流子。 在选择合适的电解质和照明强度的基础上,即使给出高阻抗半导体晶体晶片以及具有掺杂步骤或pn结的半导体晶体,也可以实现高电流密度。 该方法在许多半导体处理和分析方法中特别简单。
    • 9. 发明授权
    • Method and measuring instrument for identifying the diffusion length of
the minority charge carriers for non-destructive detection of flaws and
impurities in semiconductor crystal bodies
    • 用于识别少数电荷载体的扩散长度的方法和测量仪器用于半导体晶体中缺陷和杂质的非​​破坏性检测
    • US4841239A
    • 1989-06-20
    • US197603
    • 1988-05-20
    • Helmut FoellVolker Lehmann
    • Helmut FoellVolker Lehmann
    • G01N27/00G01R31/265H01L21/66
    • G01R31/265
    • Method and measuring instrument for identifying the diffusion length of minority charge carriers for non-destructive detection of flaws and impurities in semiconductor crystal bodies. The method provides that the semiconductor crystal body is positioned between two electrolyte-filled measuring chamber halves and that the minority charge carriers of the photocurrent that results at a front side of the semiconductor crystal body due to irradiation is detected by an applied constant voltage between a backside of the semiconductor crystal body and a rear electrolyte at the backside of the semiconductor crystal body. Taking the thickness (D) of the semiconductor crystal body into consideration, the diffusion length (L) can be calculated from a mathematical equation using the quotient of the minority charge carrier current I.sub.G I/.sub.O occurring at the backside and at the front side of the semiconductor crystal body. The method provides topically resolved measurements for irradiation of the semiconductor crystal body. A measuring instrument for the implementation of the method is disclosed. The method can be used for determining the quality of semiconductor crystals.
    • 用于识别少数电荷载体的扩散长度的方法和测量仪器用于半导体晶体中缺陷和杂质的非​​破坏性检测。 该方法提供半导体晶体位于两个电解质填充的测量室半部之间,并且通过施加的恒定电压来检测由于照射而导致半导体晶体的前侧的光电流的少数电荷载流子 半导体晶体的背面和半导体晶体的背面的后电解质。 考虑到半导体晶体的厚度(D),扩散长度(L)可以从数学方程式使用在后侧和前面出现的少数载流子电流IGI / O的商来计算 半导体晶体。 该方法提供用于半导体晶体的照射的局部分辨测量。 公开了一种用于实施该方法的测量仪器。 该方法可用于确定半导体晶体的质量。