会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Method and apparatus for chemically-mechanically polishing semiconductor wafers
    • 用于化学机械抛光半导体晶片的方法和装置
    • US06261959B1
    • 2001-07-17
    • US09540385
    • 2000-03-31
    • Glenn TravisChristopher Pena
    • Glenn TravisChristopher Pena
    • H01L2100
    • B24B37/245B24B41/005
    • An apparatus for chemically-mechanically polishing a semiconductor wafer comprises a receiving surface attached with a frame; a loading mechanism in contact with the receiving surface, the loading mechanism being configured to load measured portions of a wafer-polishing member containing a fixed abrasive onto the receiving surface; a reciprocation device attached with at least a portion of the receiving surface, the reciprocation device being powered to move the receiving surface in a linear, bi-directional motion; and a wafer holder positioned to releasably hold a wafer adjacent to the receiving surface. Methods of chemically-mechanically polishing semiconductor wafers are also provided.
    • 一种用于化学机械抛光半导体晶片的设备包括:附接有框架的接收表面; 与接收表面接触的装载机构,所述装载机构构造成将包含固定磨料的晶片抛光构件的测量部分加载到所述接收表面上; 附接有所述接收表面的至少一部分的往复运动装置,所述往复运动装置被驱动以使所述接收表面以线性的双向运动移动; 以及定位成将晶片可靠地保持在与接收表面相邻的晶片保持架。 还提供了化学机械研磨半导体晶片的方法。