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1. 发明授权

US08053791B2 Structure of AC light-emitting diode dies 有权
标题翻译：交流发光二极管管芯的结构
公开(公告)号：US08053791B2
公开(公告)日：2011-11-08
申请号：US12424109
申请日：2009-04-15
申请人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
发明人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
IPC分类号： H01L33/00 , H01L33/62
CPC分类号： H01L25/0753 , H01L2924/0002 , H01L2924/00
摘要： A structure of light-emitting diode (LED) dies having an AC loop (a structure of AC LED dies), which is formed with at least one unit of AC LED micro-dies disposed on a chip. The unit of AC LED micro-dies comprises two LED micro-dies arranged in mutually reverse orientations and connected with each other in parallel, to which an AC power supply may be applied so that the LED unit may continuously emit light in response to a positive-half wave voltage and a negative-half wave voltage in the AC power supply. Since each AC LED micro-die is operated forwardly, the structure of AC LED dies also provides protection from electrical static charge (ESD) and may operate under a high voltage.
摘要翻译：具有设置在芯片上的至少一个AC LED微管芯单元形成的具有AC环路（AC LED管芯的结构）的发光二极管（LED）裸片的结构。交流LED微型模具的单元包括两个彼此相反取向并且彼此并联连接的LED微型模具，可以施加交流电源，使得LED单元响应于正向连续地发光 - 交流电源中的一次波电压和一个负半波电压。由于每个AC LED微型裸片都是正向运行的，所以AC LED芯片的结构也提供了防止静电荷（ESD）的保护，并且可以在高电压下工作。

2. 发明授权

US07888942B2 Devices and methods for LED life test 有权
标题翻译： LED寿命测试的设备和方法
公开(公告)号：US07888942B2
公开(公告)日：2011-02-15
申请号：US12275341
申请日：2008-11-21
申请人： Chiu-Ling Chen , Sheng-Pan Huang , Fei-Chang Hwang
发明人： Chiu-Ling Chen , Sheng-Pan Huang , Fei-Chang Hwang
IPC分类号： G01R31/00
CPC分类号： G01R31/2642 , G01R31/2635
摘要： A life test device comprises an oven, a current source, a voltage meter, a control module, and a process module. A light-emitting diode (LED) is disposed in the oven. The temperature of the oven is gradually changed in a first period and remains at a set temperature in a second period. The current source provides a first current and a second current to the LED. The voltage meter measures forward voltages of the LED. The control module controls the current source to output the first or second current to the LED and controls the voltage meter to measure the forward voltages of the LED. The process module calculates a junction temperature of the LED according to the forward voltages and a variation relationship formula between the forward voltages and the temperature of the oven.
摘要翻译：寿命测试装置包括烤箱，电流源，电压表，控制模块和处理模块。发光二极管（LED）设置在烤箱中。烘箱的温度在第一时间段内逐渐变化并且在第二时间段内保持在设定温度。电流源向LED提供第一电流和第二电流。电压表测量LED的正向电压。控制模块控制电流源将第一或第二电流输出到LED，并控制电压表来测量LED的正向电压。处理模块根据正向电压和正向电压与烘箱温度之间的变化关系式计算LED的结温。

3. 发明申请

US20100327872A1 Devices And Methods For LED Life Test 有权
标题翻译： LED寿命测试的设备和方法
公开(公告)号：US20100327872A1
公开(公告)日：2010-12-30
申请号：US12275341
申请日：2008-11-21
申请人： Chiu-Ling Chen , Sheng-Pan Huang , Fei-Chang Hwang
发明人： Chiu-Ling Chen , Sheng-Pan Huang , Fei-Chang Hwang
IPC分类号： G01R31/26
CPC分类号： G01R31/2642 , G01R31/2635
摘要： A life test device comprises an oven, a current source, a voltage meter, a control module, and a process module. A light-emitting diode (LED) is disposed in the oven. The temperature of the oven is gradually changed in a first period and remains at a set temperature in a second period. The current source provides a first current and a second current to the LED. The voltage meter measures forward voltages of the LED. The control module controls the current source to output the first or second current to the LED and controls the voltage meter to measure the forward voltages of the LED. The process module calculates a junction temperature of the LED according to the forward voltages and a variation relationship formula between the forward voltages and the temperature of the oven.
摘要翻译：寿命测试装置包括烤箱，电流源，电压表，控制模块和处理模块。发光二极管（LED）设置在烤箱中。烘箱的温度在第一时间段内逐渐变化并且在第二时间段内保持在设定温度。电流源向LED提供第一电流和第二电流。电压表测量LED的正向电压。控制模块控制电流源将第一或第二电流输出到LED，并控制电压表来测量LED的正向电压。处理模块根据正向电压和正向电压与烘箱温度之间的变化关系式计算LED的结温。

4. 发明申请

US20080218093A1 Structure of AC light-emitting diode dies 审中-公开
标题翻译：交流发光二极管管芯的结构
公开(公告)号：US20080218093A1
公开(公告)日：2008-09-11
申请号：US12149852
申请日：2008-05-09
申请人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
发明人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
IPC分类号： H05B37/02 , H05B41/24
CPC分类号： H01L25/0753 , H01L2924/0002 , H01L2924/00
摘要： A structure of light-emitting diode (LED) dies having an AC loop (a structure of AC LED dies), which is formed with at least one unit of AC LED micro-dies disposed on a chip. The unit of AC LED micro-dies comprises two LED micro-dies arranged in mutually reverse orientations and connected with each other in parallel, to which an AC power supply may be applied so that the LED unit may continuously emit light in response to a positive-half wave voltage and a negative-half wave voltage in the AC power supply. Since each AC LED micro-die is operated forwardly, the structure of AC LED dies also provides protection from electrical static charge (ESD) and may operate under a high voltage.
摘要翻译：具有设置在芯片上的至少一个AC LED微管芯单元形成的具有AC环路（AC LED管芯的结构）的发光二极管（LED）裸片的结构。交流LED微型模具的单元包括两个彼此相反取向并且彼此并联连接的LED微型模具，可以施加交流电源，使得LED单元响应于正向连续地发光 - 交流电源中的一次波电压和一个负半波电压。由于每个AC LED微型裸片都是正向运行的，所以AC LED芯片的结构也提供了防止静电荷（ESD）的保护，并且可以在高电压下工作。

5. 发明申请

US20110133769A1 INSPECTION APPARATUS AND METHOD FOR LED PACKAGE INTERFACE 审中-公开
标题翻译： LED封装接口的检查装置和方法
公开(公告)号：US20110133769A1
公开(公告)日：2011-06-09
申请号：US12823859
申请日：2010-06-25
申请人： Chiu Ling CHEN , Fei Chang Hwang , Chien Ping Wang , Sheng Pan Huang
发明人： Chiu Ling CHEN , Fei Chang Hwang , Chien Ping Wang , Sheng Pan Huang
IPC分类号： G01R31/26 , G01R31/02
CPC分类号： G01R31/2635
摘要： An LED package interface inspection apparatus for an LED device comprises a current source, a voltage measuring unit, and a testing control unit. The testing control unit provides at least one control signal to command the current source to output at least one current for the LED device. The testing control unit also provides at least two signals to command the voltage measuring unit to measure a first forward voltage of the LED device at a first time and a second forward voltage of the LED device at a second time. The testing control unit calculates a voltage difference between the first forward voltage and the second forward voltage, and determines that the LED device is defective if the voltage difference is larger than a predetermined threshold value.
摘要翻译：一种用于LED装置的LED封装接口检查装置，包括电流源，电压测量单元和测试控制单元。测试控制单元提供至少一个控制信号以命令电流源输出LED器件的至少一个电流。测试控制单元还提供至少两个信号以命令电压测量单元在第二时间测量LED器件的第一时间和第二正向电压。测试控制单元计算第一正向电压和第二正向电压之间的电压差，并且如果电压差大于预定阈值，则确定LED器件有故障。

6. 发明申请

US20090218580A1 STRUCTURE OF AC LIGHT-EMITTING DIODE DIES 有权
标题翻译：交流发光二极管的结构
公开(公告)号：US20090218580A1
公开(公告)日：2009-09-03
申请号：US12424109
申请日：2009-04-15
申请人： Ming-Te LIN , Fei-Chang Hwang , Chia-Tai Kuo
发明人： Ming-Te LIN , Fei-Chang Hwang , Chia-Tai Kuo
IPC分类号： H01L33/00
CPC分类号： H01L25/0753 , H01L2924/0002 , H01L2924/00
摘要： A structure of light-emitting diode (LED) dies having an AC loop (a structure of AC LED dies), which is formed with at least one unit of AC LED micro-dies disposed on a chip. The unit of AC LED micro-dies comprises two LED micro-dies arranged in mutually reverse orientations and connected with each other in parallel, to which an AC power supply may be applied so that the LED unit may continuously emit light in response to a positive-half wave voltage and a negative-half wave voltage in the AC power supply. Since each AC LED micro-die is operated forwardly, the structure of AC LED dies also provides protection from electrical static charge (ESD) and may operate under a high voltage.
摘要翻译：具有设置在芯片上的至少一个AC LED微管芯单元形成的具有AC环路（AC LED管芯的结构）的发光二极管（LED）裸片的结构。交流LED微型模具的单元包括两个彼此相反取向并且彼此并联连接的LED微型模具，可以施加交流电源，使得LED单元响应于正向连续地发光 - 交流电源中的一次波电压和一个负半波电压。由于每个AC LED微型裸片都是正向运行的，所以AC LED芯片的结构也提供了防止静电荷（ESD）的保护，并且可以在高电压下工作。

7. 发明授权

US07531843B2 Structure of AC light-emitting diode dies 有权
标题翻译：交流发光二极管管芯的结构
公开(公告)号：US07531843B2
公开(公告)日：2009-05-12
申请号：US10994361
申请日：2004-11-23
申请人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
发明人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
IPC分类号： H01L29/201 , H01L29/225
CPC分类号： H01L25/0753 , H01L2924/0002 , H01L2924/00
摘要： A structure of light-emitting diode (LED) dies having an AC loop (a structure of AC LED dies), which is formed with at least one unit of AC LED micro-dies disposed on a chip. The unit of AC LED micro-dies comprises two LED micro-dies arranged in mutually reverse orientations and connected with each other in parallel, to which an AC power supply may be applied so that the LED unit may continuously emit light in response to a positive-half wave voltage and a negative-half wave voltage in the AC power supply. Since each AC LED micro-die is operated forwardly, the structure of AC LED dies also provides protection from electrical static charge (ESD) and may operate under a high voltage.
摘要翻译：具有设置在芯片上的至少一个AC LED微管芯单元形成的具有AC环路（AC LED管芯的结构）的发光二极管（LED）裸片的结构。交流LED微型模具的单元包括两个彼此相反取向并且彼此并联连接的LED微型模具，可以施加交流电源，使得LED单元响应于正向连续地发光 - 交流电源中的一次波电压和一个负半波电压。由于每个AC LED微型裸片都是正向运行的，所以AC LED芯片的结构也提供了防止静电荷（ESD）的保护，并且可以在高电压下工作。

8. 发明申请

US20060044864A1 Structure of AC light-emitting diode dies 有权
公开(公告)号：US20060044864A1
公开(公告)日：2006-03-02
申请号：US10994361
申请日：2004-11-23
申请人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
发明人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
IPC分类号： G11C11/00
CPC分类号： H01L25/0753 , H01L2924/0002 , H01L2924/00
摘要： A structure of light-emitting diode (LED) dies having an AC loop (a structure of AC LED dies), which is formed with at least one unit of AC LED micro-dies disposed on a chip. The unit of AC LED micro-dies comprises two LED micro-dies arranged in mutually reverse orientations and connected with each other in parallel, to which an AC power supply may be applied so that the LED unit may continuously emit light in response to a positive-half wave voltage and a negative-half wave voltage in the AC power supply. Since each AC LED micro-die is operated forwardly, the structure of AC LED dies also provides protection from electrical static charge (ESD) and may operate under a high voltage.

9. 发明授权

US08803166B2 Structure of AC light-emitting diode dies 有权
标题翻译：交流发光二极管管芯的结构
公开(公告)号：US08803166B2
公开(公告)日：2014-08-12
申请号：US12861495
申请日：2010-08-23
申请人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
发明人： Ming-Te Lin , Fei-Chang Hwang , Chia-Tai Kuo
IPC分类号： H01L33/00
CPC分类号： H01L25/0753 , H01L2924/0002 , H01L2924/00
摘要： An arrangement of light emitting diodes including a first micro-die, a second micro-die, a first bridge, a second bridge and a substrate supporting the first micro-die and the second micro die. The first micro-die includes a first edge having a first end and a second end, a second edge opposite and not parallel to the first edge, a first connecting portion near the first end, and a second connecting portion near the second end.
摘要翻译：包括第一微型管芯，第二微型管芯，第一桥接器，第二桥接器和支撑第一微型管芯和第二微型管芯的衬底的发光二极管的布置。第一微型模头包括具有第一端和第二端的第一边缘，与第一边缘相对且不平行的第二边缘，靠近第一端的第一连接部分和靠近第二端部的第二连接部分。

10. 发明申请

US20110012137A1 STRUCTURE OF AC LIGHT-EMITTING DIODE DIES 有权
标题翻译：交流发光二极管的结构
公开(公告)号：US20110012137A1
公开(公告)日：2011-01-20
申请号：US12861495
申请日：2010-08-23
申请人： Ming-Te LIN , Fei-Chang Hwang , Chia-Tai Kuo
发明人： Ming-Te LIN , Fei-Chang Hwang , Chia-Tai Kuo
IPC分类号： H01L33/00
CPC分类号： H01L25/0753 , H01L2924/0002 , H01L2924/00
摘要： A structure of light-emitting diode (LED) dies having an AC loop (a structure of AC LED dies), which is formed with at least one unit of AC LED micro-dies disposed on a chip. The unit of AC LED micro-dies comprises two LED micro-dies arranged in mutually reverse orientations and connected with each other in parallel, to which an AC power supply may be applied so that the LED unit may continuously emit light in response to a positive-half wave voltage and a negative-half wave voltage in the AC power supply. Since each AC LED micro-die is operated forwardly, the structure of AC LED dies also provides protection from electrical static charge (ESD) and may operate under a high voltage.
摘要翻译：具有设置在芯片上的至少一个AC LED微管芯单元形成的具有AC环路（AC LED管芯的结构）的发光二极管（LED）裸片的结构。交流LED微型模具的单元包括两个彼此相反取向并且彼此并联连接的LED微型模具，可以施加交流电源，使得LED单元响应于正向连续地发光 - 交流电源中的一次波电压和一个负半波电压。由于每个AC LED微型裸片都是正向运行的，所以AC LED芯片的结构也提供了防止静电荷（ESD）的保护，并且可以在高电压下工作。

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