会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Inspection method
    • 检验方法
    • US08773158B2
    • 2014-07-08
    • US13114039
    • 2011-05-23
    • Chien-Ping WangShih-Chun YangTzung-Te ChenAn-Tse LeeSheng-Bang Huang
    • Chien-Ping WangShih-Chun YangTzung-Te ChenAn-Tse LeeSheng-Bang Huang
    • G01R31/26
    • G01R31/2635G01R31/2642
    • An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails. An inspection method for the inspection system is also provided.
    • 提供一种检查系统,其在发光装置上施加正向或反向电压并分别在升温之前和之后测量其电流,并且根据事件之前和之后的电流差异来确定装置是否失效 上升大于故障电流确定值。 或者,检查系统采用电流施加装置,在发光装置上施加正向和反向电流,并且分别在温升之前和之后测量其电压差,并根据事实是否根据 温升前后的电压差大于故障电压判定值。 或者,检查系统分别采用预定的检查步骤和快速检查步骤来确定发光装置是否发生故障。 还提供了检查系统的检查方法。
    • 7. 发明申请
    • INSPECTION METHOD
    • 检查方法
    • US20120169345A1
    • 2012-07-05
    • US13114039
    • 2011-05-23
    • Chien-Ping WangShih-Chun YangTzung-Te ChenAn-Tse LeeSheng-Bang Huang
    • Chien-Ping WangShih-Chun YangTzung-Te ChenAn-Tse LeeSheng-Bang Huang
    • G01R31/44
    • G01R31/2635G01R31/2642
    • An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails. An inspection method for the inspection system is also provided.
    • 提供一种检查系统,其在发光装置上施加正向或反向电压并分别在升温之前和之后测量其电流,并且根据事件之前和之后的电流差异来确定装置是否失效 上升大于故障电流确定值。 或者,检查系统采用电流施加装置,在发光装置上施加正向和反向电流,并且分别在温升之前和之后测量其电压差,并根据事实是否根据 温升前后的电压差大于故障电压判定值。 或者,检查系统分别采用预定的检查步骤和快速检查步骤来确定发光装置是否发生故障。 还提供了检查系统的检查方法。