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1. 发明授权

US07961437B2 Magnetic recording head having an extended stripe height and a shortened shield height 有权
标题翻译：磁记录头具有延长的条纹高度和缩短的屏蔽高度
公开(公告)号：US07961437B2
公开(公告)日：2011-06-14
申请号：US11863190
申请日：2007-09-27
申请人： David J Seagle
发明人： David J Seagle
IPC分类号： G11B5/39
CPC分类号： G11B5/3912 , G11B5/112
摘要： Magnetic recording heads and associated methods of fabrication are disclosed. A magnetic recording head has a first shield and a magnetoresistance (MR) read element formed on the first shield. The first shield has a shield height that is defined by a distance between the air bearing surface (ABS) of the recording head and a back edge of the first shield that is opposite the ABS. The MR read element has a stripe height that is defined by a distance between the air bearing surface (ABS) of the recording head and a back edge of the MR read element that is opposite the ABS. The magnetic recording heads as disclosed herein have a stripe height that is greater than the shield height.
摘要翻译：公开了磁记录头和相关的制造方法。磁记录头具有形成在第一屏蔽上的第一屏蔽和磁阻（MR）读取元件。第一屏蔽具有由记录头的空气轴承表面（ABS）与第一屏蔽件的与ABS相对的后边缘之间的距离限定的屏蔽高度。 MR读取元件具有由记录头的空气轴承表面（ABS）与MR读取元件的与ABS相对的后边缘之间的距离限定的条纹高度。如本文所公开的磁记录头具有大于屏蔽高度的条纹高度。

2. 发明授权

US07919967B2 Verification of a fabrication process used to form read elements in magnetic heads 有权
标题翻译：用于在磁头中形成读取元件的制造工艺的验证
公开(公告)号：US07919967B2
公开(公告)日：2011-04-05
申请号：US11965502
申请日：2007-12-27
申请人： Satoru Araki , Robert S. Beach , David J. Seagle
发明人： Satoru Araki , Robert S. Beach , David J. Seagle
IPC分类号： G01R31/08 , G01R27/08
CPC分类号： G01R31/2884 , G01R33/1207 , G11B5/127
摘要： Test methods and components are disclosed for testing the quality of a fabrication process used to form read elements in magnetic heads. A wafer is populated with one or more test components along with magnetic heads. The test components are formed by the same or similar fabrication processes as the read elements, but do not include a conductive MR sensor between the test leads. By measuring the resistance of the test components, the formation of parasitic shunts can be identified in the test components, which may indicate the formation of parasitic shunts in the read elements. Thus, the quality of the fabrication process in forming read elements in magnetic head may be determined.
摘要翻译：公开了用于测试用于在磁头中形成读取元件的制造工艺的质量的测试方法和部件。晶片与磁头一起安装有一个或多个测试部件。测试部件通过与读取元件相同或相似的制造工艺形成，但不包括测试引线之间的导电MR传感器。通过测量测试部件的电阻，可以在测试部件中识别寄生分流器的形成，这可以指示在读取元件中形成寄生分流。因此，可以确定在磁头中形成读取元件的制造工艺的质量。

3. 发明授权

US07855553B2 Test components fabricated with large area sensors used for determining the resistance of an MR sensor 有权
标题翻译：用大面积传感器制造的测试部件用于确定MR传感器的电阻
公开(公告)号：US07855553B2
公开(公告)日：2010-12-21
申请号：US11965587
申请日：2007-12-27
申请人： Robert S. Beach , Mary K. Gutberlet , David J. Seagle
发明人： Robert S. Beach , Mary K. Gutberlet , David J. Seagle
IPC分类号： G01R33/12
CPC分类号： G11B20/1816 , G11B5/3166 , G11B5/3173 , G11B5/3193 , G11B5/3903 , G11B2220/2516
摘要： Test methods and components are disclosed for testing resistances of magnetoresistance (MR) sensors in read elements. Test components are fabricated on a wafer with a first test lead, a test MR sensor, and a second test lead. The test leads and test MR sensor are fabricated with similar processes as first shields, MR sensors, and second shields of read elements on tie wafer. However, the test MR sensor is fabricated with an area that is larger than areas of the MR sensors in the read elements. The larger area of the test MR sensor causes the resistance of the test MR sensor to be insignificant compared to the lead resistance. Thus, a resistance measurement of the test component represents the lead resistance of a read element. An accurate resistance measurement of an MR sensor in a read element may then be determined by subtracting the lead resistance.
摘要翻译：公开了用于测试读取元件中的磁阻（MR）传感器的电阻的测试方法和组件。在具有第一测试导线，测试MR传感器和第二测试导线的晶片上制造测试部件。测试引线和测试MR传感器采用与晶片上的读取元件的第一屏蔽，MR传感器和第二屏蔽类似的工艺制造。然而，测试MR传感器的制造面积大于读取元件中MR传感器的面积。测试MR传感器的较大面积导致测试MR传感器的电阻与引线电阻相比不显着。因此，测试部件的电阻测量表示读取元件的引线电阻。然后可以通过减去引线电阻来确定读取元件中的MR传感器的精确电阻测量。

4. 发明授权

US07564110B2 Electrical lapping guides made from tunneling magnetoresistive (TMR) material 失效
标题翻译：由隧道磁阻（TMR）材料制成的电气研磨导轨
公开(公告)号：US07564110B2
公开(公告)日：2009-07-21
申请号：US11379321
申请日：2006-04-19
申请人： Robert S. Beach , Daniele Mauri , David J. Seagle , Jila Tabib
发明人： Robert S. Beach , Daniele Mauri , David J. Seagle , Jila Tabib
IPC分类号： H01L29/82
CPC分类号： G11B5/3173 , B82Y10/00 , B82Y25/00 , G11B5/3169 , G11B5/3906 , G11B5/3909 , H01L43/12
摘要： Tunneling magnetoresistive (TMR) electrical lapping guides (ELG) are disclosed for use in wafer fabrication of magnetic sensing devices, such as magnetic recording heads using TMR read elements. A TMR ELG includes a TMR stack comprising a first conductive layer, a barrier layer, and a second conductive layer of TMR material. The TMR ELG also includes a first lead and a second lead that connect to conductive pads used for applying a sense current to the TMR ELG in a current in plane (CIP) fashion. The first lead contacts one side of the TMR stack so that the first lead contacts both the first conductive layer and the second conductive layer of the TMR stack. The second lead contacts the other side of the TMR stack so that the second lead contacts both the first conductive layer and the second conductive layer of the TMR stack.
摘要翻译：公开了隧道磁阻（TMR）电研磨引导件（ELG），用于磁感测装置的晶片制造，例如使用TMR读取元件的磁记录头。 TMR ELG包括TMR堆叠，其包括第一导电层，阻挡层和TMR材料的第二导电层。 TMR ELG还包括连接到用于以当前平面（CIP）方式向TMR ELG施加感测电流的导电焊盘的第一引线和第二引线。第一引线接触TMR堆叠的一侧，使得第一引线接触TMR堆叠的第一导电层和第二导电层。第二引线接触TMR堆叠的另一侧，使得第二引线接触TMR堆叠的第一导电层和第二导电层。

5. 发明申请

US20090168268A1 Dedicated noncorrosive smear detector 有权
标题翻译：专用非腐蚀性涂片检测仪
公开(公告)号：US20090168268A1
公开(公告)日：2009-07-02
申请号：US12006296
申请日：2007-12-31
申请人： David P. Druist , David J. Seagle , Jila Tabib
发明人： David P. Druist , David J. Seagle , Jila Tabib
IPC分类号： G11B5/33
CPC分类号： G11B5/455 , B82Y10/00 , B82Y25/00 , G11B5/3169 , G11B5/3173 , G11B5/3909 , G11B2005/3996
摘要： A disk drive head slider for a magnetic disk drive is provided. The head slider includes a tunnel magnetic resistance device for reading data on a magnetic disk and a dedicated noncorrosive smear detector for measuring resistance wherein the resistance corresponds to a level of smear associated with the head slider.
摘要翻译：提供了用于磁盘驱动器的磁盘驱动器磁头滑块。磁头滑块包括用于读取磁盘上的数据的隧道磁阻装置和用于测量电阻的专用非腐蚀性涂片检测器，其中电阻对应于与磁头滑块相关联的拖尾水平。

6. 发明申请

US20090168214A1 VERIFICATION OF A FABRICATION PROCESS USED TO FORM READ ELEMENTS IN MAGNETIC HEADS 有权
标题翻译：用于形成读取磁头元件的制造工艺的验证
公开(公告)号：US20090168214A1
公开(公告)日：2009-07-02
申请号：US11965502
申请日：2007-12-27
申请人： Satoru Araki , Robert S. Beach , David J. Seagle
发明人： Satoru Araki , Robert S. Beach , David J. Seagle
IPC分类号： G11B27/36
CPC分类号： G01R31/2884 , G01R33/1207 , G11B5/127
摘要： Test methods and components are disclosed for testing the quality of a fabrication process used to form read elements in magnetic heads. A wafer is populated with one or more test components along with magnetic heads. The test components are formed by the same or similar fabrication processes as the read elements, but do not include a conductive MR sensor between the test leads. By measuring the resistance of the test components, the formation of parasitic shunts can be identified in the test components, which may indicate the formation of parasitic shunts in the read elements. Thus, the quality of the fabrication process in forming read elements in magnetic head may be determined.
摘要翻译：公开了用于测试用于在磁头中形成读取元件的制造工艺的质量的测试方法和部件。晶片与磁头一起安装有一个或多个测试部件。测试部件通过与读取元件相同或相似的制造工艺形成，但不包括测试引线之间的导电MR传感器。通过测量测试部件的电阻，可以在测试部件中识别寄生分流器的形成，这可以指示在读取元件中形成寄生分流。因此，可以确定在磁头中形成读取元件的制造工艺的质量。

7. 发明授权

US07248449B1 Magnetoresistive read sensor with reduced effective shield-to-shield spacing 有权
标题翻译：磁阻读取传感器具有降低的有效屏蔽间隔距离
公开(公告)号：US07248449B1
公开(公告)日：2007-07-24
申请号：US10816294
申请日：2004-03-31
申请人： David J Seagle
发明人： David J Seagle
IPC分类号： G11B5/33
CPC分类号： G11B5/3932 , B82Y10/00 , B82Y25/00 , G01R33/093 , G11B5/3912 , G11B5/398 , G11B2005/3996 , H01F10/3268 , H01F41/34
摘要： A magnetoresistive read sensor includes a first shield layer and a first gap layer over the first shield layer. The read sensor further includes a spin-valve stack over the first gap layer. The spin-valve stack includes a seed layer over the first gap layer. At least a portion of the seed layer includes a soft-magnetic material. The spin-valve stack further includes an antiferromagnetic layer over the seed layer. The antiferromagnetic layer is magnetically decoupled from the seed layer. The spin-valve stack further includes a free layer over a first portion of the antiferromagnetic layer. The read sensor further includes a bias structure adjacent to the free layer. The bias structure is located over a second portion of the antiferromagnetic layer and is isolated from the seed layer by the second portion.
摘要翻译：磁阻读取传感器包括第一屏蔽层和第一屏蔽层上的第一间隙层。读取传感器还包括位于第一间隙层上的自旋阀叠层。自旋阀堆叠包括在第一间隙层上的种子层。种子层的至少一部分包括软磁性材料。自旋阀堆叠还包括种子层上的反铁磁层。反铁磁性层与种子层磁耦合。自旋阀叠层还包括位于反铁磁性层的第一部分上的自由层。读取传感器还包括与自由层相邻的偏置结构。偏置结构位于反铁磁层的第二部分上，并且通过第二部分与种子层隔离。

8. 发明授权

US5603156A Lapping process for minimizing shorts and element recession at magnetic head air bearing surface 失效
标题翻译：用于最小化磁头空气轴承表面的短路和元件衰退的研磨工艺
公开(公告)号：US5603156A
公开(公告)日：1997-02-18
申请号：US358124
申请日：1994-12-16
申请人： Robert G. Biskeborn , Carol Y. Inouye , David J. Seagle , Albert J. Wallash , Robert O. Barr , Glen A. Garfunkel , Sanford J. Lewis
发明人： Robert G. Biskeborn , Carol Y. Inouye , David J. Seagle , Albert J. Wallash , Robert O. Barr , Glen A. Garfunkel , Sanford J. Lewis
IPC分类号： B24B19/26 , B24B37/00 , G11B5/10 , G11B5/187 , G11B5/31 , G11B5/39 , G11B5/40 , G11B5/60 , G11B5/127
CPC分类号： B82Y25/00 , B24B19/26 , B24B37/00 , B24B37/048 , B82Y10/00 , G11B5/10 , G11B5/1871 , G11B5/3106 , G11B5/3163 , G11B5/3903 , G11B5/6005 , G11B2005/3996 , G11B5/3967 , G11B5/40 , Y10T29/49041 , Y10T29/49046 , Y10T29/49048
摘要： A method of lapping the air bearing surface of a magnetoresistive head which minimizes the likelihood of interelement shorts at the air bearing surface is described. In a final, linear lapping phase, the air bearing surface is lapped back and forth parallel to the longitudinal axis of the head elements in an oscillatory path across a stationary lapping surface. Any scratches or smears of the elements will be along the length of the elements rather than transverse to the elements. Any transverse scratches or smears occurring in earlier lapping phases will be removed during the linear lapping phase.
摘要翻译：描述了一种研磨磁阻头的空气轴承表面的方法，其使在空气轴承表面处的内部短路的可能性最小化。在最终的线性研磨阶段中，空气轴承表面在穿过固定研磨表面的振荡路径中平行于头部元件的纵向轴线平行地前后折叠。元素的任何划痕或污迹将沿着元素的长度而不是横向于元素。在线性研磨阶段期间，在早期研磨阶段发生的任何横向划痕或涂片将被去除。

9. 发明授权

US08804287B2 Material for use in a TMR read gap without adversely affecting the TMR effect 有权
标题翻译：用于TMR读取间隙的材料，不会对TMR影响产生不利影响
公开(公告)号：US08804287B2
公开(公告)日：2014-08-12
申请号：US12916256
申请日：2010-10-29
申请人： Satoru Araki , Diane L. Brown , Hiroaki Chihaya , Dustin W. Erickson , David J. Seagle
发明人： Satoru Araki , Diane L. Brown , Hiroaki Chihaya , Dustin W. Erickson , David J. Seagle
IPC分类号： G11B5/33
CPC分类号： G11B5/255 , B82Y10/00 , B82Y25/00 , C25D5/12 , G11B5/00821 , G11B5/23 , G11B5/3909 , G11B5/3912 , G11B5/3958 , G11B5/3977 , G11B5/398
摘要： Structures and methods for fabrication servo and data heads of tape modules are provided. The servo head may have two shield layers spaced apart by a plurality of gap layers and a sensor. Similarly, the data head may have two shield layers spaced apart by a plurality of gap layers and a sensor. The distance between the shield layers of the servo head may be greater than the distance between the shield layers of the data head. The material of the gap layers may include tantalum or an alloy of nickel and chromium. The material for the gap layers permits deposition of gap layers with sufficiently small surface roughness to prevent distortion of the tape module and increase the stability of the tape module operation.
摘要翻译：提供了用于制造磁带模块的伺服和数据磁头的结构和方法。伺服头可以具有由多个间隙层和传感器隔开的两个屏蔽层。类似地，数据头可以具有由多个间隙层和传感器隔开的两个屏蔽层。伺服头的屏蔽层之间的距离可以大于数据头的屏蔽层之间的距离。间隙层的材料可以包括钽或镍和铬的合金。用于间隙层的材料允许以足够小的表面粗糙度沉积间隙层，以防止带模块的变形并增加带模块操作的稳定性。

10. 发明申请

US20130083430A1 MULTIPLE-SENSE THERMO-RESISTIVE SENSOR FOR CONTACT DETECTION OF READ-WRITE HEADS 有权
标题翻译：用于接触检测读写头的多感测热电阻传感器
公开(公告)号：US20130083430A1
公开(公告)日：2013-04-04
申请号：US13250204
申请日：2011-09-30
申请人： Andrew Chiu , Sujit Kirpekar , Katalin Pentek , Oscar J. Ruiz , David J. Seagle
发明人： Andrew Chiu , Sujit Kirpekar , Katalin Pentek , Oscar J. Ruiz , David J. Seagle
IPC分类号： G11B5/60
CPC分类号： G11B5/6076 , G11B5/607
摘要： Techniques of the present invention include detecting a touchdown between a read/write head of a disk drive and a surface of a magnetic disk using multiple touchdown sensors located at an air-bearing surface (ABS). The multiple sensors increase the likelihood that a touchdown event—i.e., a portion of the ABS of the head contacting the underlying magnetic disk surface—will be detected. During touchdown, the portion of the head contacting the magnetic disk generates frictional heat which changes a characteristic (e.g., the electrical resistance) of at least one of the sensors located at the ABS. When the sensors are connected to a detection circuit, the changing characteristic may be monitored to identify a touchdown event. The touchdown sensors may be, for example, electrically connected in either series or parallel to the detection circuit. Thus, as long as the electrical resistance of one of the sensors is changed, a touchdown event may be detected.
摘要翻译：本发明的技术包括使用位于空气轴承表面（ABS）的多个触地传感器检测磁盘驱动器的读/写磁头与磁盘表面之间的触地。多个传感器增加触发事件 - 即头部的ABS的一部分接触下面的磁盘表面 - 将被检测的可能性。触地时，头部与磁盘接触的部分产生摩擦热，该摩擦热改变位于ABS处的至少一个传感器的特性（例如，电阻）。当传感器连接到检测电路时，可以监视变化特性以识别触地事件。触地传感器可以例如以串联或并联的方式电连接到检测电路。因此，只要传感器之一的电阻改变，就可以检测到触地事件。

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