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1. 发明申请

US20110038032A1 TERAHERTZ WAVE GENERATING METHOD AND APPARATUS 失效
标题翻译： TERAHERTZ波形发生方法和装置
公开(公告)号：US20110038032A1
公开(公告)日：2011-02-17
申请号：US12989382
申请日：2009-04-21
申请人： Ken-ichiro Maki , Chiko Otani
发明人： Ken-ichiro Maki , Chiko Otani
IPC分类号： G02F2/02
CPC分类号： G02F2/002 , G02F1/3534 , G02F2203/13
摘要： A first laser beam 1a and a second laser beam 1b are incident on a difference frequency mixing unit, and the two laser beams are overlapped in the difference frequency mixing unit, thereby generating a terahertz wave whose frequency is a frequency difference between the two laser beams. Each laser beam has a spatial spread in a frequency gradient direction, and a spatial frequency distribution of each laser beam is a distribution in which a magnitude of a frequency gradually increases in the frequency gradient direction. Accordingly, a frequency difference between the two laser beams is equal in each position in an overlapping region of the two laser beams. A terahertz wave of a single frequency is generated from this overlapping region. By spatially shifting the first laser beam and the second laser beam with respect to each other in the frequency gradient direction, the frequency difference in the overlapping region is changed, so that the single frequency is changed.
摘要翻译：第一激光束1a和第二激光束1b入射在差分混频单元上，并且两个激光束在差分混频单元中重叠，从而产生频率为两个激光束之间的频率差的太赫兹波。每个激光束在频率梯度方向上具有空间扩展，并且每个激光束的空间频率分布是其频率幅度在频率梯度方向上逐渐增加的分布。因此，两个激光束之间的频率差在两个激光束的重叠区域中的每个位置相等。从该重叠区域产生单个频率的太赫兹波。通过在频率梯度方向上相对于彼此空间移动第一激光束和第二激光束，改变重叠区域中的频率差，从而改变单个频率。

2. 发明申请

US20070009085A1 Enclosure inspection method and apparatus thereof 有权
标题翻译：外壳检查方法及其装置
公开(公告)号：US20070009085A1
公开(公告)日：2007-01-11
申请号：US11452525
申请日：2006-06-14
申请人： Chiko Otani , Yoshiaki Sasaki , Gosei Okazaki , Kazunori Ninomiya , Masahiro Yamashita , Kengo Takahashi , Atsushi Takasuka , Toru Kitaguchi
发明人： Chiko Otani , Yoshiaki Sasaki , Gosei Okazaki , Kazunori Ninomiya , Masahiro Yamashita , Kengo Takahashi , Atsushi Takasuka , Toru Kitaguchi
IPC分类号： G01N23/04
CPC分类号： G01N21/3581 , G01N21/3563 , G01N22/00 , G01T1/1603 , G01V5/0033
摘要： In an enclosure inspection apparatus 11, when a sealed letter 2 is inputted into a sealed letter loading station A, visual inspecting means 27 and X-ray inspecting means 33 determine thickness of the sealed letter and whether an enclosure in the sealed letter is a predetermined suspected object. The sealed letter not less than a predetermined thickness is rejected in first sorting station D, and the sealed letter which is not thicker than the predetermined thickness and in which the suspected object is not detected is conveyed as it is to second sorting station G. As for the sealed letter which is not thicker than the predetermined thickness and in which the suspected object is detected, after the suspected object in the sealed letter is positioned in a positioning station E, a suspected object inspecting station F determines whether the above-described suspected object is a predetermined object, such as an explosive or a narcotic drug, using a terahertz wave. It is possible to detect promptly the presence of the objects even if there are a large number of sealed letters.
摘要翻译：在外壳检查装置11中，当将密封字母2输入到密封信函装载站A中时，目视检查装置27和X射线检查装置33确定密封字母的厚度以及密封字母中的外壳是否是预定的怀疑对象。在第一分拣站D中拒绝不小于预定厚度的密封字母，并且将未被检测到可疑物体的不厚于预定厚度的密封字母原样传送到第二分拣站G. 对于不厚于预定厚度并且其中检测到可疑物体的密封字母，在密封字母中的可疑物体位于定位站E中之后，疑似物体检查站F确定上述可疑物体物体是使用太赫兹波的预定物体，例如爆炸物或麻醉药物。即使有大量的密封字母，也可以及时检测物体的存在。

3. 发明申请

US20050122603A1 Broadband telescope 失效
标题翻译：宽带望远镜
公开(公告)号：US20050122603A1
公开(公告)日：2005-06-09
申请号：US10499968
申请日：2002-12-25
申请人： Yoshiyuki Takizawa , Yoshiyuki Takahashi , Hirohiko Shimizu , Chiko Otani , Toshikazu Ebisuzaki
发明人： Yoshiyuki Takizawa , Yoshiyuki Takahashi , Hirohiko Shimizu , Chiko Otani , Toshikazu Ebisuzaki
IPC分类号： G02B23/00 , G02B5/26 , G02B5/28 , G02B17/00 , G02B23/02 , G02B23/06 , G02B5/08
CPC分类号： B82Y10/00 , G02B23/02 , G02B23/06 , G21K2201/061
摘要： The light of a broad energy band can be observed by reflecting the light of the broad energy band, for example, the light from the visible light region to the x-ray region at a high reflectance respectively, by a composite telescope including a normal incidence optical system and an oblique incidence optical system. A broadband telescope comprise an oblique incidence optical system unit in which the light is obliquely incident on a surface part for reflecting the incident light, a normal incidence optical system unit in which the light is substantially vertically incident on a surface part for reflecting the incident light, and an analyzer for spectrum analysis of the light reflected by the surface part of the obliquely incidence optical system unit and the light reflected by the surface part of the normal incidence optical system unit.
摘要翻译：通过复合望远镜，通过将包括正常入射的宽能带的光例如以可见光区域的光反射到高反射率的X射线区域，能够观察到宽能带的光光学系统和倾斜入射光学系统。宽带望远镜包括倾斜入射光学系统单元，其中光倾斜地入射在用于反射入射光的表面部分上;法线入射光学系统单元，其中光基本垂直地入射在表面部分上以反射入射光以及用于对由倾斜入射光学系统单元的表面部分反射的光和由入射光学系统单元的表面部分反射的光进行光谱分析的分析仪。

4. 发明申请

US20110037001A1 TERAHERTZ BEAM SCANNING APPARATUS AND METHOD THEREOF 失效
标题翻译： TERAHERTZ光束扫描装置及其方法
公开(公告)号：US20110037001A1
公开(公告)日：2011-02-17
申请号：US12989368
申请日：2009-04-21
申请人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
发明人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
IPC分类号： G02B26/10 , G02F1/35 , G02F1/29
CPC分类号： H01Q3/42 , G02F2203/13 , H01Q19/06 , H01Q19/062
摘要： To provide a terahertz beam scanning apparatus and method that can scan a terahertz beam at high speed over a wide angle. The terahertz beam scanning apparatus includes: a laser device 12 that generates a first laser beam 1 and a second laser beam 2 having different wavelengths; a laser optical system 14 that focuses the first laser beam 1 and the second laser beam 2 on a same common focal point 14b; and a terahertz generator 16 that is located at the common focal point and generates a terahertz beam 4 by difference frequency mixing. The laser optical system 14 is configured to be capable of changing a relative incidence θi between the first laser beam and the second laser beam to the terahertz generator.
摘要翻译：提供一种太赫兹波束扫描装置和方法，可以在广角上高速扫描太赫波束。太赫兹光束扫描装置包括：激光装置12，其产生具有不同波长的第一激光束1和第二激光束2; 将第一激光束1和第二激光束2聚焦在同一公共焦点14b上的激光光学系统14; 以及位于公共焦点处的太赫兹发生器16，通过差频混频产生太赫兹波束4。激光光学系统14被配置为能够将第一激光束和第二激光束之间的相对入射角与i之间的距离改变为太赫兹发生器。

5. 发明授权

US07450299B2 Broadband telescope 失效
标题翻译：宽带望远镜
公开(公告)号：US07450299B2
公开(公告)日：2008-11-11
申请号：US10499968
申请日：2002-12-25
申请人： Yoshiyuki Takizawa , Yoshiyuki Takahashi , Hirohiko Shimizu , Chiko Otani , Toshikazu Ebisuzaki
发明人： Yoshiyuki Takizawa , Yoshiyuki Takahashi , Hirohiko Shimizu , Chiko Otani , Toshikazu Ebisuzaki
IPC分类号： G02B23/06
CPC分类号： B82Y10/00 , G02B23/02 , G02B23/06 , G21K2201/061
摘要： The light of a broad energy band can be observed by reflecting the light of the broad energy band, for example, the light from the visible light region to the x-ray region at a high reflectance respectively, by a composite telescope including a normal incidence optical system and an oblique incidence optical system. A broadband telescope comprise an oblique incidence optical system unit in which the light is obliquely incident on a surface part for reflecting the incident light, a normal incidence optical system unit in which the light is substantially vertically incident on a surface part for reflecting the incident light, and an analyzer for spectrum analysis of the light reflected by the surface part of the obliquely incidence optical system unit and the light reflected by the surface part of the normal incidence optical system unit.
摘要翻译：通过复合望远镜，通过将包括正常入射的宽能带的光例如以可见光区域的光反射到高反射率的X射线区域，能够观察到宽能带的光光学系统和倾斜入射光学系统。宽带望远镜包括倾斜入射光学系统单元，其中光倾斜地入射在用于反射入射光的表面部分上;法线入射光学系统单元，其中光基本垂直地入射在表面部分上以反射入射光以及用于对由倾斜入射光学系统单元的表面部分反射的光和由入射光学系统单元的表面部分反射的光进行光谱分析的分析仪。

6. 发明授权

US08369002B2 Terahertz wave generating method and apparatus 失效
标题翻译：太赫波产生方法及装置
公开(公告)号：US08369002B2
公开(公告)日：2013-02-05
申请号：US12989382
申请日：2009-04-21
申请人： Ken-ichiro Maki , Chiko Otani
发明人： Ken-ichiro Maki , Chiko Otani
IPC分类号： G02F2/02 , H01S3/10
CPC分类号： G02F2/002 , G02F1/3534 , G02F2203/13
摘要： First and second laser beams are incident on a difference frequency mixing unit, and the two laser beams overlap in the difference frequency mixing unit, thereby generating a terahertz wave whose frequency is a frequency difference between the two laser beams. Each laser beam has a spatial spread in a frequency gradient direction, and a spatial frequency distribution of each laser beam is a distribution in which a magnitude of a frequency gradually increases in the frequency gradient direction. A frequency difference between the two laser beams is equal in each position in an overlapping region of the two laser beams. A terahertz wave of a single frequency is generated from this overlapping region. By spatially shifting the first laser beam and the second laser beam with respect to each other in the frequency gradient direction, the frequency difference in the overlapping region is changed, which changes the single frequency.
摘要翻译：第一和第二激光束入射在差分混频单元上，并且两个激光束在差分混频单元中重叠，从而产生频率为两个激光束之间的频率差的太赫兹波。每个激光束在频率梯度方向上具有空间扩展，并且每个激光束的空间频率分布是其频率幅度在频率梯度方向上逐渐增加的分布。在两个激光束的重叠区域中，两个激光束之间的频率差在每个位置相等。从该重叠区域产生单个频率的太赫兹波。通过在频率梯度方向上相对于彼此空间移动第一激光束和第二激光束，改变重叠区域中的频率差，从而改变单个频率。

7. 发明授权

US08121157B2 Terahertz beam scanning apparatus and method thereof 失效
标题翻译：太赫兹光束扫描装置及其方法
公开(公告)号：US08121157B2
公开(公告)日：2012-02-21
申请号：US12989368
申请日：2009-04-21
申请人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
发明人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
IPC分类号： H01S3/10
CPC分类号： H01Q3/42 , G02F2203/13 , H01Q19/06 , H01Q19/062
摘要： To provide a terahertz beam scanning apparatus and method that can scan a terahertz beam at high speed over a wide angle. The terahertz beam scanning apparatus includes: a laser device 12 that generates a first laser beam 1 and a second laser beam 2 having different wavelengths; a laser optical system 14 that focuses the first laser beam 1 and the second laser beam 2 on a same common focal point 14b; and a terahertz generator 16 that is located at the common focal point and generates a terahertz beam 4 by difference frequency mixing. The laser optical system 14 is configured to be capable of changing a relative incidence θi between the first laser beam and the second laser beam to the terahertz generator.
摘要翻译：提供一种太赫兹波束扫描装置和方法，可以在广角上高速扫描太赫波束。太赫兹光束扫描装置包括：激光装置12，其产生具有不同波长的第一激光束1和第二激光束2; 将第一激光束1和第二激光束2聚焦在同一公共焦点14b上的激光光学系统14; 以及位于公共焦点处的太赫兹发生器16，通过差频混频产生太赫兹波束4。激光光学系统14被配置为能够将第一激光束和第二激光束之间的相对入射角与i之间的距离改变为太赫兹发生器。

8. 发明申请

US20110216312A1 SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD 审中-公开
标题翻译：半导体检测装置和检测方法
公开(公告)号：US20110216312A1
公开(公告)日：2011-09-08
申请号：US13061363
申请日：2009-08-27
申请人： Toru Matsumoto , Yoshimitsu Aoki , Masayoshi Tonouchi , Hironaru Murakami , Sunmi Kim , Masatsugu Yamashita , Chiko Otani
发明人： Toru Matsumoto , Yoshimitsu Aoki , Masayoshi Tonouchi , Hironaru Murakami , Sunmi Kim , Masatsugu Yamashita , Chiko Otani
IPC分类号： G01N21/00
CPC分类号： G01R31/307 , G01N21/3581 , G01N21/9501 , G01R31/308 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： For a semiconductor device S, an inspection is performed in a zero-bias state by use of electromagnetic waves generated by irradiation of pulsed laser light, and an inspection range is set with reference to layout information of the semiconductor device S to perform two-dimensional scanning by inspection light L1 of the pulsed laser light within the range. Moreover, with the inspection range of the semiconductor device S arranged at a predetermined position with respect to an optical axis of an optical system, and with a solid immersion lens 36 disposed for the semiconductor device S, by a galvanometer scanner 30 being scanning means, the inspection range of the semiconductor device S is two-dimensionally scanned by the inspection light L1 via the solid immersion lens 36, and an electromagnetic wave emitted from the semiconductor device S is detected by a photoconductive element 40. Accordingly, a semiconductor inspection apparatus and inspection method capable of preferably performing an inspection in a zero-bias state for a semiconductor device is realized.
摘要翻译：对于半导体器件S，通过使用由脉冲激光的照射产生的电磁波在零偏置状态下进行检查，并且参考半导体器件S的布局信息设置检查范围，以执行二维通过脉冲激光的检查光L1扫描该范围内。此外，由于半导体器件S的检查范围相对于光学系统的光轴布置在预定位置，并且对于半导体器件S设置的固体浸没透镜36，作为扫描装置的电流计扫描器30，半导体器件S的检查范围通过固体浸没透镜36被检查光L1二维扫描，并且由光电导元件40检测从半导体器件S发射的电磁波。因此，半导体检查设备和实现了能够优选在半偏置状态下对半导体器件进行检查的检查方法。

9. 发明授权

US07697745B2 Enclosure inspection method and apparatus thereof 有权
标题翻译：外壳检查方法及其装置
公开(公告)号：US07697745B2
公开(公告)日：2010-04-13
申请号：US11452525
申请日：2006-06-14
申请人： Chiko Otani , Yoshiaki Sasaki , Gosei Okazaki , Kazunori Ninomiya , Masahiro Yamashita , Kengo Takahashi , Atsushi Takasuka , Toru Kitaguchi
发明人： Chiko Otani , Yoshiaki Sasaki , Gosei Okazaki , Kazunori Ninomiya , Masahiro Yamashita , Kengo Takahashi , Atsushi Takasuka , Toru Kitaguchi
IPC分类号： G06K9/00 , G01N23/04 , G01J5/00
CPC分类号： G01N21/3581 , G01N21/3563 , G01N22/00 , G01T1/1603 , G01V5/0033
摘要： In an enclosure inspection apparatus 11, when a sealed letter 2 is inputted into a sealed letter loading station A, visual inspecting means 27 and X-ray inspecting means 33 determine thickness of the sealed letter and whether an enclosure in the sealed letter is a predetermined suspected object. The sealed letter not less than a predetermined thickness is rejected in first sorting station D, and the sealed letter which is not thicker than the predetermined thickness and in which the suspected object is not detected is conveyed as it is to second sorting station G. As for the sealed letter which is not thicker than the predetermined thickness and in which the suspected object is detected, after the suspected object in the sealed letter is positioned in a positioning station E, a suspected object inspecting station F determines whether the above-described suspected object is a predetermined object, such as an explosive or a narcotic drug, using a terahertz wave.It is possible to detect promptly the presence of the objects even if there are a large number of sealed letters.
摘要翻译：在外壳检查装置11中，当将密封字母2输入到密封信函装载站A中时，目视检查装置27和X射线检查装置33确定密封字母的厚度以及密封字母中的外壳是否是预定的怀疑对象。在第一分拣站D中拒绝不小于预定厚度的密封字母，并且将未被检测到可疑物体的不厚于预定厚度的密封字母原样传送到第二分拣站G. 对于不厚于预定厚度并且其中检测到可疑物体的密封字母，在密封字母中的可疑物体位于定位站E中之后，疑似物体检查站F确定上述可疑物体物体是使用太赫兹波的预定物体，例如爆炸物或麻醉药物。即使有大量的密封字母，也可以及时检测物体的存在。

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