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    • 1. 发明授权
    • Low temperature generation process and expansion engine
    • 低温发电过程和膨胀发动机
    • US5319948A
    • 1994-06-14
    • US876273
    • 1992-04-30
    • Arnold BlumManfred Schmidt
    • Arnold BlumManfred Schmidt
    • F25B9/00F03G7/00F25B9/06F25B9/14
    • F03G7/002F25B9/065F25B9/145F02G2243/52F25B2309/1402F25B2309/1408F25B2309/1425
    • In a low temperature generation process, compressed gas (3) at high pressure enters from an inlet nozzle (1) and alternately expands into one of two resonator tubes (A,B) of an expansion engine. The expanding gas excites standing acoustic waves (4) in the resonator tubes (A,B). The acoustic energy of the waves (4) is converted into electrical energy by acoustic/electric power converters and is led away outside the "cold area" of the tubes. The expansion engine contains one or more resonator tubes with a common inlet nozzle (1). Each resonator tube has an acoustic/electric power converter (5) and an exhaust port (6). Together with a compressor, a heat exchanger and a heat sink, the expansion engine provides a very effective cooling system which may be used for the cooling of small electronic devices like chips or modules.
    • 在低温发生过程中,高压下的压缩气体(3)从入口喷嘴(1)进入并交替地膨胀成膨胀发动机的两个谐振管(A,B)之一。 膨胀气体激励谐振器管(A,B)中的驻波(4)。 波浪(4)的声能通过声/电功率转换器转换成电能,并被引导到管的“冷区”之外。 膨胀发动机包含一个或多个具有公共入口喷嘴(1)的谐振管。 每个谐振器管具有声/电功率转换器(5)和排气口(6)。 与压缩机,热交换器和散热器一起,膨胀发动机提供了非常有效的冷却系统,其可用于冷却诸如芯片或模块的小型电子设备。
    • 2. 发明授权
    • Built-in parallel testing circuit for use in a processor
    • 内置并行测试电路,用于处理器
    • US4688222A
    • 1987-08-18
    • US810105
    • 1985-12-17
    • Arnold Blum
    • Arnold Blum
    • G06F11/22G06F11/27G01R31/28
    • G06F11/27
    • The invention concerns arrangements and methods for error testing and diagnosing processors (e.g., 9; FIG. 2), whose logic subsystems (20) are interconnected by storage elements (23, 24) which in the error test and diagnostic mode are connected in the form of shift register means for the shift clock controlled application of test data and for receiving result data, and which comprise means (58) for comparing the actual result data with desired result data, said means setting an error indicator (59) for initiating further actions in the case of a mismatch. For testing the correct implementation of operations and operational secondary functions, a signature generator circuit (30) is provided comprising a test accumulator (51, 52, . . . , 5m) for accumulating the test and result data from the storage elements (23, 24) and a test clock generator and counter (28) for controlling the accumulation, as well as a test memory (29) providing test programs consisting of test data, desired result data and instructions to be tested of the processor instruction set. The signature generator circuit ( 30) is connected to an interface register (11, 12, . . . , 1m) and/or a system bus (8) of the processor, the stages of the interface register being included in the shift register means consisting of the storage elements (23, 24) at positions 21, 22, . . . , nm.
    • 本发明涉及用于对其逻辑子系统(20)由存储元件(23,24)进行互连的处理器(例如,9;图2)进行错误测试和诊断的布置和方法,所述存储元件在故障测试和诊断模式中被连接在 用于移位时钟控制应用测试数据和接收结果数据的移位寄存器装置的形式,其包括用于将实际结果数据与期望结果数据进行比较的装置(58),所述装置设置用于进一步发起的错误指示符(59) 在不匹配的情况下的行为。 为了测试操作和操作次要功能的正确实现,提供了一种签名生成器电路(30),其包括用于累积来自存储元件(23,23)的测试和结果数据的测试累加器(51,52 ...,5m) 24)和用于控制累积的测试时钟发生器和计数器(28)以及提供由测试数据,期望结果数据和待处理指令集的指令组成的测试程序的测试存储器(29)。 签名生成器电路(30)连接到处理器的接口寄存器(11,12,...,1m)和/或系统总线(8),接口寄存器的级包括在移位寄存器装置 由位置21,22上的存储元件(23,24)组成。 。 。 ,nm。
    • 5. 发明授权
    • Clock check circuits using delayed signals
    • 使用延迟信号的时钟检查电路
    • US4295220A
    • 1981-10-13
    • US98587
    • 1979-11-29
    • Arnold BlumHellmuth R. GengHermann Schulze-SchoellingBernd Spaeth
    • Arnold BlumHellmuth R. GengHermann Schulze-SchoellingBernd Spaeth
    • G01R31/28G01R31/3183G04D7/00H03K5/26H04M3/24H03K5/19G06F1/04
    • H04M3/24H03K5/26
    • In a data processing or transmission system which includes at least two synchronized clocks, for example--T-rings A and B which generate timing pulses Tai and Tbi for microinstruction execution, synchronism is checked by logic circuitry which receives pulses from the clocks. At least one of the pulses is delayed by one or more pulse period durations ti. The logic circuit output signal is used as an input to an indicator latch which is periodically set by an independent check oscillator or clock. In a preferred embodiment, the delays are introduced by master-slave flip-flops, which receive predetermined combinations of the T-signals and set by the independent check clock.Several delay latches and associated AND gates may be used for different logical combinations of delayed and undelayed T-signals. This scheme can easily be expanded to accommodate more than two synchronously operating clocks. These circuits check not only the instantaneous synchronism of the clocks, but also the correct sequencing of clock pulses. The check is also feasible if the T-ring counters are operated with a variable number of clock pulses per microinstruction execution.
    • 在包括至少两个同步时钟的数据处理或传输系统中,例如T形环A和B,其产生用于微指令执行的定时脉冲Tai和Tbi,由从时钟接收脉冲的逻辑电路来检查同步。 至少一个脉冲被延迟一个或多个脉冲周期持续时间ti。 逻辑电路输出信号用作由独立的检查振荡器或时钟周期性地设置的指示器锁存器的输入。 在优选实施例中,延迟由主 - 从触发器引入,主 - 从触发器接收T信号的预定组合并由独立检查时钟设置。 延迟锁存器和关联的与门可以用于延迟和未延迟T信号的不同逻辑组合。 该方案可以轻松扩展,以容纳两个以上的同步操作时钟。 这些电路不仅检查时钟的瞬时同步,还检查时钟脉冲的正确排序。 如果每个微指令执行的T形环计数器以可变数量的时钟脉冲操作,则该检查也是可行的。
    • 9. 发明授权
    • Testing and diagnostic device for digital computers
    • 数字电脑测试和诊断设备
    • US4604746A
    • 1986-08-05
    • US602108
    • 1984-04-19
    • Arnold Blum
    • Arnold Blum
    • G06F11/22G06F11/273
    • G06F11/2736
    • For error testing and diagnostics in EDP systems, particular storage elements (e.g., 6) are connected to form an addressable matrix which is coupled to a maintenance and service processor (5) or an external tester through the system bus (9). During normal operation, the logic subsystems (10), of which processors (1) and processing units consist, are connected by the storage elements. Through the system bus, the maintenance and service processor or the tester transfers addresses to the matrix and test data to the addressed storage elements from where they are fed to the logic subsystems which in turn respond to such test data, transferring the (partial) result data thus received to the storage elements. In the next step, the maintenance and service processor or the external tester causes the result data for error analysis and diagnostics to be fetched through the system bus from the storage elements reconnected in the form of a matrix.
    • 对于EDP系统中的错误测试和诊断,特定存储元件(例如6)被连接以形成可寻址矩阵,其通过系统总线(9)耦合到维护和服务处理器(5)或外部测试器。 在正常操作期间,由存储元件连接处理器(1)和处理单元组成的逻辑子系统(10)。 通过系统总线,维护和服务处理器或测试者将地址传送到矩阵,并将数据测试到所寻址的存储元件,从那里它们被馈送到逻辑子系统,逻辑子系统又响应于这样的测试数据,传送(部分)结果 因此将数据接收到存储元件。 在下一步中,维护和维修处理器或外部测试仪通过系统总线从矩阵形式重新连接的存储元件中取出用于错误分析和诊断的结果数据。