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    • 3. 发明授权
    • Memory device with fail search and redundancy
    • 具有故障搜索和冗余的内存设备
    • US07646655B2
    • 2010-01-12
    • US11780581
    • 2007-07-20
    • Antonino MondelloAlessandro TumminiaLuigi Buono
    • Antonino MondelloAlessandro TumminiaLuigi Buono
    • G11C7/00
    • G11C29/48G11C16/04G11C29/16G11C29/4401G11C29/82
    • An automatic redundancy system may exploit an existing microprocessor management system on chip for carrying out autonomously, without communicating with an external testing machine, the operations of: writing data in the memory array according to one or more pre-established test patterns, verifying data successively read from the memory array, and substituting failed elements of the memory array with equivalent redundancy structures. A logic structure may detect and store memory array failures upstream of the output data path. Thereby, data collection relating to failures may be accomplished more quickly and without any interaction with the testing machine apart from communicating the end of the execution of the redundancy process.
    • 自动冗余系统可以利用现有的芯片上的微处理器管理系统来自主地执行,而不与外部测试机通信,操作:根据一个或多个预先建立的测试模式将数据写入存储器阵列,连续验证数据 从存储器阵列读取,并用等效的冗余结构代替存储器阵列的故障元件。 逻辑结构可以检测并存储在输出数据路径上游的存储器阵列故障。 因此,与故障相关的数据收集可以更快地完成,并且除了传达冗余处理的执行结束之外,还不与测试机进行任何交互。