专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US4254337A Infrared interference type film thickness measuring method and instrument therefor 失效
标题翻译：红外干涉型膜厚测量方法及仪器
公开(公告)号：US4254337A
公开(公告)日：1981-03-03
申请号：US70555
申请日：1979-08-29
申请人： Akitaka Yasujima , Shingo Ishikawa
发明人： Akitaka Yasujima , Shingo Ishikawa
IPC分类号： G01B11/06 , G01J1/00
CPC分类号： G01B11/06
摘要： An infrared light is applied to a polymer film having a thickness of less than 30.mu., and the infrared light is spectroscopically separated before or after being applied to the polymer film to obtain an infrared interference fringe spectrum based on the polymer film, and then the extreme points of the infrared interference fringe spectrum are detected by processing, whereby to measure the thickness of the polymer film.
摘要翻译：将红外光施加到厚度小于30μm的聚合物膜上，并且在施加到聚合物膜之前或之后将红外光分光分离以获得基于聚合物膜的红外干涉条纹光谱，然后通过处理检测红外干涉条纹光谱的极值点，从而测量聚合物膜的厚度。

2. 发明授权

US4444860A Layered persistent photoconductive element comprises pigment layer and polymer layer containing polyvinyl carbazole 失效
标题翻译：层状永久性光电导元件包括颜料层和含有聚乙烯咔唑的聚合物层
公开(公告)号：US4444860A
公开(公告)日：1984-04-24
申请号：US446668
申请日：1982-12-03
申请人： Akitaka Yasujima , Sumitaka Nogami , Yoshiharu Kitahama , Isamu Iwami
发明人： Akitaka Yasujima , Sumitaka Nogami , Yoshiharu Kitahama , Isamu Iwami
IPC分类号： G03G5/06 , G03G5/024 , G03G5/07
CPC分类号： G03G5/0696 , G03G5/0638 , G03G5/0664
摘要： A persistent photoconductive element comprising an electroconductive support, a pigment layer formed on said support and composed mainly of a phthalocyanine pigment or Indanthrene Blue GCD and a polymer layer formed on said pigment layer and composed mainly of a polyvinyl carbazole, said polymer layer containing at least one member selected from the group consisting of aliphatic halogenated hydrocarbons, halogenated acyl compounds, halogenated keto compounds and hydrogen donor compounds. This element exhibits an improved photoconductive sensitivity and prolonged photoconductivity over the prior art, whereby it is highly useful in electrophotographic processes requiring persistent photoconductivity. Additives, such as plasticizer and binding agent, may be incorporated in the polymer and pigment layers to improve the flexibility and mechanical durability of the persistent photoconductive element.
摘要翻译：一种持续的光电导元件，包括导电载体，形成在所述载体上并主要由酞菁颜料或阴丹士林蓝GCD组成的颜料层和形成在所述颜料层上并且主要由聚乙烯咔唑组成的聚合物层，所述聚合物层至少包含一种选自脂族卤代烃，卤代酰基化合物，卤代酮化合物和氢供体化合物的成员。与现有技术相比，该元件具有改善的光导灵敏度和延长的光电导率，由此其在需要持续的光电导性的电子照相方法中是非常有用的。添加剂如增塑剂和结合剂可以并入聚合物和颜料层中以改善持久性光电导元件的柔性和机械耐久性。

3. 发明授权

US4243882A Infrared multilayer film thickness measuring method and apparatus 失效
标题翻译：红外多层膜厚度测量方法和装置
公开(公告)号：US4243882A
公开(公告)日：1981-01-06
申请号：US16754
申请日：1979-03-02
申请人： Akitaka Yasujima , Naoyuki Shiratori , Shingo Ishikawa
发明人： Akitaka Yasujima , Naoyuki Shiratori , Shingo Ishikawa
IPC分类号： G01B11/06 , G01N21/31 , G01J1/00
CPC分类号： G01B11/0625 , G01B11/0633 , G01N21/314
摘要： A method and an apparatus for measuring the thicknesses of film layers of different synthetic resins forming a composite multilayer film or sheet by utilizing infrared rays. Infrared rays of sample wavelengths, each equal to the infrared absorption wavelength of each film layer, and at least one reference wavelength different from the infrared absorption wavelength of each film layer are projected onto the multilayer film to be measured. Ratios are obtained between the amounts of infrared lights of the sample and reference wavelengths transmitted through the multilayer film. An operation is achieved for solving a simultaneous equation including the ratios and the infrared absorption coefficients of the film layers at the sample and reference wavelengths as coefficients and the thicknesses of the film layers as unknowns, thereby obtaining the thicknesses of the film layers.
摘要翻译：一种用于通过利用红外线测量形成复合多层膜或片的不同合成树脂的膜层的厚度的方法和装置。每个等于每个膜层的红外吸收波长的样品波长的红外线和与每个膜层的红外吸收波长不同的至少一个参考波长投射到要测量的多层膜上。在样品的红外光量和通过多层膜透射的参考波长的量之间获得比率。实现了用于解决包括样品和参考波长处的膜层的比率和红外吸收系数的共同方程的操作，作为未知值的膜层的系数和厚度，从而获得膜层的厚度。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式