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1. 发明授权

US07690325B2 Method and apparatus for depositing material onto a surface 失效
标题翻译：用于将材料沉积到表面上的方法和设备
公开(公告)号：US07690325B2
公开(公告)日：2010-04-06
申请号：US11120042
申请日：2005-04-29
申请人： Eric R. Henderson , Juntao Xu , Michael P. Lynch , Curtis L. Mosher , Janice Lillian Huff , Saju Rappai Nettikadan
发明人： Eric R. Henderson , Juntao Xu , Michael P. Lynch , Curtis L. Mosher , Janice Lillian Huff , Saju Rappai Nettikadan
IPC分类号： B05C5/00 , B05B7/06 , B05C3/00
CPC分类号： B01L3/0244 , B01J2219/00387 , B01J2219/00659 , B01L3/0248 , B01L2200/12 , B01L2200/143 , B01L2300/0816 , B01L2300/0838 , B01L2300/10 , B01L2400/02 , B01L2400/0406
摘要： Some embodiments of the present invention provide an apparatus and method in which material is deposited upon a surface from an elongated beam having an aperture defined therein through which the material is moved by passive adsorption. The elongated beam can be substantially planar along substantially its entire length, can be oriented at an acute angle with respect to the surface during deposition processes, and can have a length no greater than about 2 mm. In some embodiments, the aperture can be elongated, can extend from a material reservoir to a location short of the terminal end of the elongated beam or through the terminal end of the elongated beam, and can have a portion extending through the thickness of the elongated beam.
摘要翻译：本发明的一些实施例提供了一种装置和方法，其中材料从具有限定在其中的孔的细长梁沉积在表面上，通过该孔通过被动吸附来移动材料。细长梁基本上可以在其整个长度上基本上是平面的，在沉积过程中可以相对于表面以锐角定向，并且可以具有不大于约2mm的长度。在一些实施例中，孔可以是细长的，可以从材料储存器延伸到短于细长梁的终端的位置或者通过细长梁的终端，并且可以具有延伸穿过细长梁的厚度的部分光束。

2. 发明申请

US20060157873A1 Topographically indexed support substrates 失效
标题翻译：地形索引支撑基板
公开(公告)号：US20060157873A1
公开(公告)日：2006-07-20
申请号：US11328783
申请日：2006-01-10
申请人： Juntao Xu , Curtis Mosher , Michael Lynch
发明人： Juntao Xu , Curtis Mosher , Michael Lynch
IPC分类号： H01L23/544 , H01L21/76
CPC分类号： H01L23/544 , B01J2219/00527 , B01J2219/00536 , B01J2219/00542 , B01J2219/00554 , B01J2219/0056 , B01J2219/00563 , B01L3/5085 , B01L9/50 , B01L2300/0819 , B82Y30/00 , H01L2924/0002 , H01L2924/09701 , H01L2924/00
摘要： The present invention provides an indexed support substrate. The support substrate comprises at least one set of indexing features that are distinguishable from one another and from the surrounding substrate. The support substrate also comprises a set of useful domains. The indexing features are positioned on the substrate in such a way as to correspond to the useful domains in an identifying fashion.
摘要翻译：本发明提供了一种索引支撑衬底。所述支撑基底包括至少一组彼此可区分并与周围基底相分离的分度特征。支撑衬底还包括一组有用的结构域。索引特征以这样的方式定位在基板上，以便以识别方式对应于有用的域。

3. 发明授权

US07344832B2 Method and apparatus for molecular analysis in small sample volumes 失效
标题翻译：小样本量的分子分析方法和装置
公开(公告)号：US07344832B2
公开(公告)日：2008-03-18
申请号：US10541013
申请日：2003-12-30
申请人： Eric Henderson , Curtis Mosher , Janice Huff
发明人： Eric Henderson , Curtis Mosher , Janice Huff
IPC分类号： C12Q1/68
CPC分类号： G01N33/54373 , B01J2219/00387 , B01J2219/00605 , B01J2219/00626 , B01J2219/00637 , B01J2219/00659 , B01J2219/00722 , B01J2219/00725 , C40B40/06 , C40B40/10 , C40B60/14 , G01N2035/00158 , G01Q60/42
摘要： The interrogation of extremely small sample volumes can be accomplished with the present invention. Provided are probes having disposed thereon a plurality of domains forming an array, which is suitably a nanoarray. Also provided are methods of detecting molecules and molecular interaction events, retrieving and analyzing analytes, and delivering substances to cells or tissues using probes of the invention.
摘要翻译：通过本发明可以实现极小样品体积的询问。提供了在其上设置有形成阵列的多个区域的探针，其适当地是纳米阵列。还提供了使用本发明的探针检测分子和分子相互作用事件，检索和分析分析物以及将物质递送至细胞或组织的方法。

4. 发明申请

US20100154086A1 NOVEL ENHANCED PROCESSES FOR MOLECULAR SCREENING AND CHARACTERIZATION 审中-公开
标题翻译：用于分子筛选和表征的新型增强方法
公开(公告)号：US20100154086A1
公开(公告)日：2010-06-17
申请号：US11776511
申请日：2007-07-11
申请人： Eric Henderson , Curtis Mosher
发明人： Eric Henderson , Curtis Mosher
IPC分类号： G01Q60/24
CPC分类号： G01Q60/42
摘要： A general high-throughput screening (HTS) process using an atomic force microscope (AFM) to detect and measure molecular recognition events. The AFM is used to measure changes in molecular complex height, friction, shape, elasticity or any other relevant parameters that report a molecular recognition event. In addition, the force involved in molecular recognition and bonding is directly measured using the technique of force spectroscopy. In one embodiment, a flow chamber is used to introduce molecules and assay their effect on a molecular interaction occurring between molecules on the AFM probe and a surface. In some cases the surface may be an introduced microparticle. In a second embodiment, the sample is a solid phase array of molecules that is interrogated by a functionalized AFM probe, and the effects of introduced agents at each molecular address in the array is measured by force spectroscopy.
摘要翻译：使用原子力显微镜（AFM）检测和测量分子识别事件的通用高通量筛选（HTS）过程。 AFM用于测量分子复合物高度，摩擦，形状，弹性或报告分子识别事件的任何其他相关参数的变化。此外，使用力光谱技术直接测量参与分子识别和结合的力。在一个实施方案中，流动室用于引入分子并测定它们对在AFM探针和表面上的分子之间发生的分子相互作用的影响。在一些情况下，表面可以是引入的微粒。在第二个实施方案中，样品是由功能化的AFM探针询问的分子的固相阵列，并且通过力谱测量在阵列中的每个分子地址处引入的试剂的影响。

5. 发明授权

US07339282B2 Topographically indexed support substrates 失效
标题翻译：地形索引支撑基板
公开(公告)号：US07339282B2
公开(公告)日：2008-03-04
申请号：US11328783
申请日：2006-01-10
申请人： Juntao Xu , Curtis Mosher , Michael P. Lynch
发明人： Juntao Xu , Curtis Mosher , Michael P. Lynch
IPC分类号： G03F9/00 , G03F7/20 , H01L23/544 , H01L21/76 , H01L21/70
CPC分类号： H01L23/544 , B01J2219/00527 , B01J2219/00536 , B01J2219/00542 , B01J2219/00554 , B01J2219/0056 , B01J2219/00563 , B01L3/5085 , B01L9/50 , B01L2300/0819 , B82Y30/00 , H01L2924/0002 , H01L2924/09701 , H01L2924/00
摘要： The present invention provides an indexed support substrate. The support substrate comprises at least one set of indexing features that are distinguishable from one another and from the surrounding substrate. The support substrate also comprises a set of useful domains. The indexing features are positioned on the substrate in such a way as to correspond to the useful domains in an identifying fashion.
摘要翻译：本发明提供了一种索引支撑衬底。所述支撑基底包括至少一组彼此可区分并与周围基底相分离的分度特征。支撑衬底还包括一组有用的结构域。索引特征以这样的方式定位在基板上，以便以识别方式对应于有用的域。

6. 发明授权

US07060448B2 Evaluating binding affinities by force stratification and force panning 失效
公开(公告)号：US07060448B2
公开(公告)日：2006-06-13
申请号：US10958092
申请日：2004-10-04
申请人： Eric Henderson , Curtis Mosher
发明人： Eric Henderson , Curtis Mosher
IPC分类号： G01N33/53
CPC分类号： C07K16/065 , Y10S436/807
摘要： The present invention is a method for selectively removing objects from a surface utilizing a probe. The probe is scanned over the surface utilizing a greater and greater relative amount of force so that a certain number of the objects are removed from the surface. The force required to remove the objects from the surface can be calculated utilizing Hook's law and the spring constant of the probe. After removal of the objects that have a relatively weaker binding affinity with the surface, the remaining objects can be harvested, characterized, and subjected to further study.

7. 发明授权

US07008769B2 Nanoscale molecular arrayer 失效
公开(公告)号：US07008769B2
公开(公告)日：2006-03-07
申请号：US09929865
申请日：2001-08-14
申请人： Eric Henderson , Curtis Mosher
发明人： Eric Henderson , Curtis Mosher
IPC分类号： C12Q1/68 , C12M1/36 , G01N15/06
CPC分类号： B01J19/0046 , B01J2219/00378 , B01J2219/00387 , B01J2219/00527 , B01J2219/00585 , B01J2219/0059 , B01J2219/00596 , B01J2219/00605 , B01J2219/00612 , B01J2219/00659 , B01J2219/00675 , B01J2219/00677 , B01J2219/00689 , B01J2219/00691 , B01J2219/00698 , B01J2219/00704 , B01J2219/00711 , B01J2219/00722 , B01L3/0244 , B82B3/00 , C40B40/06 , C40B50/14 , Y10S977/924
摘要： The present invention is a dedicated apparatus for the formation of array that includes one or more deposition domains comprised of one or more deposition materials. The present invention may include an X, Y controller, an X, Y translation stage, a loading substrate, a deposition substrate, a Z controller, and a deposition probe. A computer controls all of the relative positions of each of the components. Furthermore, the present invention utilizes a humidity control system to create a capillary bridge between the probe and the substrate for transferring the deposition material between the loading substrate, the deposition probe, and the deposition substrate.

8. 发明申请

US20050059091A1 Evaluating binding affinities by force stratification and force panning 失效
标题翻译：通过强制分层和强制平移来评估约束力
公开(公告)号：US20050059091A1
公开(公告)日：2005-03-17
申请号：US10958092
申请日：2004-10-04
申请人： Eric Henderson , Curtis Mosher
发明人： Eric Henderson , Curtis Mosher
IPC分类号： G01N33/53 , G01Q60/00 , C07K16/06 , G01N33/566 , G01Q80/00 , C12M1/34
CPC分类号： C07K16/065 , Y10S436/807
摘要： The present invention is a method for selectively removing objects from a surface utilizing a probe. The probe is scanned over the surface utilizing a greater and greater relative amount of force so that a certain number of the objects are removed from the surface. The force required to remove the objects from the surface can be calculated utilizing Hook's law and the spring constant of the probe. After removal of the objects that have a relatively weaker binding affinity with the surface, the remaining objects can be harvested, characterized, and subjected to further study.
摘要翻译：本发明是利用探针从表面选择性地去除物体的方法。使用更大和更大的相对的力量将探头扫描在表面上，使得一定数量的物体从表面移除。可以使用钩定律和探头的弹簧常数来计算从表面去除物体所需的力。在去除与表面具有相对较弱的结合亲和力的物体之后，可以收集，表征和进一步研究剩余的物体。

9. 发明申请

US20070152351A9 Topographically indexed support substrates 失效
标题翻译：地形索引支撑基板
公开(公告)号：US20070152351A9
公开(公告)日：2007-07-05
申请号：US11328783
申请日：2006-01-10
申请人： Juntao Xu , Curtis Mosher , Michael Lynch
发明人： Juntao Xu , Curtis Mosher , Michael Lynch
IPC分类号： H01L23/544 , H01L21/76
CPC分类号： H01L23/544 , B01J2219/00527 , B01J2219/00536 , B01J2219/00542 , B01J2219/00554 , B01J2219/0056 , B01J2219/00563 , B01L3/5085 , B01L9/50 , B01L2300/0819 , B82Y30/00 , H01L2924/0002 , H01L2924/09701 , H01L2924/00
摘要： The present invention provides an indexed support substrate. The support substrate comprises at least one set of indexing features that are distinguishable from one another and from the surrounding substrate. The support substrate also comprises a set of useful domains. The indexing features are positioned on the substrate in such a way as to correspond to the useful domains in an identifying fashion.
摘要翻译：本发明提供了一种索引支撑衬底。所述支撑基底包括至少一组彼此可区分并与周围基底相分离的分度特征。支撑衬底还包括一组有用的结构域。索引特征以这样的方式定位在基板上，以便以识别方式对应于有用的域。

10. 发明申请

US20050266149A1 Method and apparatus for depositing material onto a surface 失效
标题翻译：用于将材料沉积到表面上的方法和设备
公开(公告)号：US20050266149A1
公开(公告)日：2005-12-01
申请号：US11120042
申请日：2005-04-29
申请人： Eric Henderson , Juntao Xu , Michael Lynch , Curtis Mosher , Janice Huff , Saju Nettikadan
发明人： Eric Henderson , Juntao Xu , Michael Lynch , Curtis Mosher , Janice Huff , Saju Nettikadan
IPC分类号： A61L2/00 , B01L3/02 , B05B7/06 , B05C1/00 , B05D3/00
CPC分类号： B01L3/0244 , B01J2219/00387 , B01J2219/00659 , B01L3/0248 , B01L2200/12 , B01L2200/143 , B01L2300/0816 , B01L2300/0838 , B01L2300/10 , B01L2400/02 , B01L2400/0406
摘要： Some embodiments of the present invention provide an apparatus and method in which material is deposited upon a surface from an elongated beam having an aperture defined therein through which the material is moved by passive adsorption. The elongated beam can be substantially planar along substantially its entire length, can be oriented at an acute angle with respect to the surface during deposition processes, and can have a length no greater than about 2 mm. In some embodiments, the aperture can be elongated, can extend from a material reservoir to a location short of the terminal end of the elongated beam or through the terminal end of the elongated beam, and can have a portion extending through the thickness of the elongated beam.
摘要翻译：本发明的一些实施例提供了一种装置和方法，其中材料从具有限定在其中的孔的细长梁沉积在表面上，通过该孔通过被动吸附来移动材料。细长梁基本上可以在其整个长度上基本上是平面的，可以在沉积过程中相对于表面以锐角定向，并且可以具有不大于约2mm的长度。在一些实施例中，孔可以是细长的，可以从材料储存器延伸到短于细长梁的终端的位置或者通过细长梁的终端，并且可以具有延伸穿过细长梁的厚度的部分光束。

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