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    • 83. 发明授权
    • Clock data recovery with selectable phase control
    • 时钟数据恢复,可选择相位控制
    • US07099424B1
    • 2006-08-29
    • US09941079
    • 2001-08-28
    • Kun-Yung K. ChangJason C. WeiDonald V. Perino
    • Kun-Yung K. ChangJason C. WeiDonald V. Perino
    • H04L25/38
    • H03L7/0805H03L7/07H03L7/0814H03L7/089H03L7/091H04L7/0004H04L7/0337H04L7/10
    • A clock data recovery (CDR) circuit to recover a clock signal and data signal from an input signal. The CDR circuit includes a control circuit, a select circuit and a phase adjust circuit. The control circuit generates a first control signal according to a phase relationship between the input signal and a first clock signal. The select circuit is coupled to receive the first control signal from the control circuit and coupled to receive a second control signal. The select circuit is responsive to a select signal to select either the first control signal or the second control signal to be output as a selected control signal. The phase adjust circuit is coupled to receive the selected control signal from the select circuit, the phase adjust circuit being responsive to the selected control signal to adjust the phase of the first clock signal.
    • 一种用于从输入信号恢复时钟信号和数据信号的时钟数据恢复(CDR)电路。 CDR电路包括控制电路,选择电路和相位调整电路。 控制电路根据输入信号和第一时钟信号之间的相位关系产生第一控制信号。 耦合选择电路以从控制电路接收第一控制信号并耦合以接收第二控制信号。 选择电路响应于选择信号来选择要输出的第一控制信号或第二控制信号作为选择的控制信号。 相位调整电路被耦合以从选择电路接收所选择的控制信号,相位调整电路响应所选择的控制信号来调节第一时钟信号的相位。
    • 89. 发明申请
    • Burst mode clock and data recovery frequency calibration
    • 突发模式时钟和数据恢复频率校准
    • US20050218999A1
    • 2005-10-06
    • US10814250
    • 2004-04-01
    • Hrvoje JasaGary PolhemusKenneth Snowdon
    • Hrvoje JasaGary PolhemusKenneth Snowdon
    • H03L7/00H03L7/089H03L7/14H04L7/00H04L7/033
    • H03L7/141H03L7/089H04L7/0004H04L7/0083H04L7/033
    • A direct calibration technique significantly tightens a tolerance band between multiple voltage controlled oscillators (VCOs), to correct for slight frequency mismatch between the multiple VCOs. The tightened tolerance band enhances the bit error rate (BER) and/or lengthens the possible consecutive identical digits (CIDs) length, and is particularly useful in integrated circuit applications. A Frequency Locked Loop (FLL), an accumulator, and a DAC are implemented to form a calibration loop that becomes far more digital in nature than a PLL, permitting greater embedded circuit test coverage and ease of integration in VLSI digital technologies. A frequency calibrated loop with digital accumulator and DAC in lieu of a PLL with associated charge pump integrator eliminates the need for large integrated capacitors, sensitivity to drift due to the leakage currents associated with deep sub-micron technologies, and embedded analog voltages which generally cannot be tested.
    • 直接校准技术显着收紧了多个压控振荡器(VCO)之间的容差带,以纠正多个VCO之间轻微的频率失配。 加密的容限带增强了误码率(BER)和/或延长了可能的连续相同数字(CID)长度,并且在集成电路应用中特别有用。 实现了频率锁定环(FLL),累加器和DAC,以形成一种比PLL更具数字化的校准环路,从而允许更大的嵌入式电路测试覆盖率和易于集成的VLSI数字技术。 具有数字累加器和DAC的频率校准回路代替具有相关电荷泵积分器的PLL,无需大型集成电容器,由于与深亚微米技术相关的漏电流导致的漂移敏感性,以及通常不能使用的嵌入式模拟电压 被测试。