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81. 发明申请

US20130008286A1 METHOD FOR PRODUCING NICKEL NANOPARTICLES 有权
标题翻译：生产镍基纳米粒子的方法
公开(公告)号：US20130008286A1
公开(公告)日：2013-01-10
申请号：US13634881
申请日：2011-03-17
申请人： Katsuhiro Yamada , Shuji Inoue , Hiderou Nomoto , Tomohisa Yamauchi , Yuji Wada , Yasunori Tsukahara
发明人： Katsuhiro Yamada , Shuji Inoue , Hiderou Nomoto , Tomohisa Yamauchi , Yuji Wada , Yasunori Tsukahara
IPC分类号： B22F9/18 , B82Y40/00
CPC分类号： B22F9/24 , B22F9/305 , B22F2301/15 , B22F2303/01 , B82Y40/00 , Y10S977/896 , B22F2998/00 , B22F1/0018 , B22F2999/00 , B22F2202/11
摘要： A method for producing nickel nanoparticles is described, including a first step of heating a mixture of a nickel carboxylate with 1-12 carbon atoms in its moiety excluding —COOH and a primary amine to obtain a complexed reaction solution with a nickel complex foiiiied therein, and a second step of heating the complexed reaction solution by a microwave to obtain a Ni-nanoparticle slurry. In the first step, the heating is preferably conducted at a temperature of 105-175° C. for 15 minutes or longer. In the second step, the heating is preferably conducted at a temperature of 180° C. or higher.
摘要翻译：描述了一种制备镍纳米颗粒的方法，其包括第一步骤，在除了-COOH之外的部分中加热具有1-12个碳原子的羧酸镍的混合物和伯胺以获得其中所形成的镍络合物的络合反应溶液，以及通过微波加热配合的反应溶液以获得Ni-纳米颗粒浆料的第二步骤。在第一步骤中，加热优选在105-175℃的温度下进行15分钟或更长时间。在第二步骤中，加热优选在180℃以上的温度下进行。

82. 发明申请

US20120210311A1 UPDATING APPARATUS, UPDATING METHOD AND RECORDING MEDIUM 有权
标题翻译：更新装置，更新方法和记录介质
公开(公告)号：US20120210311A1
公开(公告)日：2012-08-16
申请号：US13329750
申请日：2011-12-19
申请人： Shinji Kikuchi , Yasuhide Matsumoto , Yuji Wada , Atsuji Sekiguchi
发明人： Shinji Kikuchi , Yasuhide Matsumoto , Yuji Wada , Atsuji Sekiguchi
IPC分类号： G06F9/44
CPC分类号： G06F8/65 , G06F8/61 , G06F9/5038 , G06F11/1433 , H04L41/0813
摘要： An update apparatus used in a system that provides service using software and performing update of the software, including a processing apparatus configured to calculate a difference between a possible down time of the service according to a service level and a down time of the service indicated by operation performance stored in storage unit, and when there are a plurality of pieces of software as update targets, to calculate an update order of the plurality of pieces of update target software according to a degree of influence to the difference by service down when update of software fails, and to perform update of the plurality of pieces of update target software according to the update order.
摘要翻译：一种在使用软件提供服务并执行软件更新的系统中使用的更新装置，包括：处理装置，被配置为根据服务级别的可能的停机时间和所述服务的停机时间来计算服务的可能停机时间; 存储在存储单元中的操作性能，并且当存在多条软件作为更新目标时，根据在更新时的服务下降对该差异的影响程度来计算多条更新目标软件的更新顺序软件失败，并且根据更新顺序执行多条更新目标软件的更新。

83. 发明申请

US20120207398A1 IMAGE CODING DEVICE, IMAGE DECODING DEVICE, METHODS THEREOF, AND PROGRAMS 有权
标题翻译：图像编码装置，图像解码装置，其方法和程序
公开(公告)号：US20120207398A1
公开(公告)日：2012-08-16
申请号：US13347982
申请日：2012-01-11
申请人： Kazuhiro SHIMAUCHI , Yuji Wada , Hiroshi Ikeda , Daisuke Tahara
发明人： Kazuhiro SHIMAUCHI , Yuji Wada , Hiroshi Ikeda , Daisuke Tahara
IPC分类号： G06K9/36
CPC分类号： G06T9/007 , G06T9/004 , H04N19/103 , H04N19/119 , H04N19/122 , H04N19/126 , H04N19/14 , H04N19/176 , H04N19/46 , H04N19/61 , H04N19/70
摘要： An image coding device including: an edge detecting section configured to perform edge detection using an image signal of a reference image for a coding object block; a transform block setting section configured to set transform blocks by dividing the coding object block such that a boundary between the blocks after division does not include an edge on a basis of a result of the edge detection; and a coding processing section configured to generate coded data by performing processing including an orthogonal transform of each of the transform blocks.
摘要翻译：一种图像编码装置，包括：边缘检测部，被配置为使用编码对象块的参考图像的图像信号进行边缘检测; 变换块设置部分，被配置为通过划分编码对象块来设置变换块，使得除法之后的块之间的边界基于边缘检测的结果不包括边缘; 以及编码处理部，被配置为通过执行包括每个变换块的正交变换的处理来生成编码数据。

84. 发明申请

US20070218572A1 FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE 有权
标题翻译：半导体集成电路器件的制造方法
公开(公告)号：US20070218572A1
公开(公告)日：2007-09-20
申请号：US11750371
申请日：2007-05-18
申请人： Yuji Wada , Susumu Kasukabe , Takehiko Hasebe , Yasunori Narizuka , Akira Yabushita , Terutaka Mori , Akio Hasebe , Yasuhiro Motoyama , Teruo Shoji , Masakazu Sueyoshi
发明人： Yuji Wada , Susumu Kasukabe , Takehiko Hasebe , Yasunori Narizuka , Akira Yabushita , Terutaka Mori , Akio Hasebe , Yasuhiro Motoyama , Teruo Shoji , Masakazu Sueyoshi
IPC分类号： H01L21/66
CPC分类号： G01R1/07314 , G01R31/2872 , Y10T29/41 , Y10T29/49128 , Y10T29/49147 , Y10T29/49155 , Y10T29/49169 , Y10T29/49798
摘要： The fabrication of a semiconductor integrated circuit device involves testing using a pushing mechanism that is constructed by forming, over the upper surface of a thin film probe, a reinforcing material having a linear expansion coefficient (thermal expansion coefficient) almost equal to that of a wafer to be tested; forming a groove in the reinforcing material above a contact terminal; placing an elastomer in the groove so that a predetermined amount projects out of the groove; and disposing a pusher and another elastomer to sandwich the pusher between the elastomers. With the use of such a probe, it is possible to improve the throughput of wafer-level electrical testing of a semiconductor integrated circuit.
摘要翻译：半导体集成电路器件的制造包括使用推压机构进行测试，所述推压机构通过在薄膜探针的上表面上形成具有几乎等于晶片的线性膨胀系数（热膨胀系数）的增强材料而构成待测在接触端子上方的增强材料中形成凹槽; 将弹性体放置在所述槽中，使得预定量突出到所述凹槽中; 并且设置推进器和另一种弹性体以将推进器夹在弹性体之间。通过使用这样的探针，可以提高半导体集成电路的晶片级电气测试的吞吐量。

85. 发明授权

US07198962B2 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step 失效
标题翻译：半导体器件及其制造方法，包括探针测试步骤和老化测试步骤
公开(公告)号：US07198962B2
公开(公告)日：2007-04-03
申请号：US10411283
申请日：2003-04-11
申请人： Ryuji Kohno , Tetsuo Kumazawa , Makoto Kitano , Akihiko Ariga , Yuji Wada , Naoto Ban , Shuji Shibuya , Yasuhiro Motoyama , Kunio Matsumoto , Susumu Kasukabe , Terutaka Mori , Hidetaka Shigi , Takayoshi Watanabe
发明人： Ryuji Kohno , Tetsuo Kumazawa , Makoto Kitano , Akihiko Ariga , Yuji Wada , Naoto Ban , Shuji Shibuya , Yasuhiro Motoyama , Kunio Matsumoto , Susumu Kasukabe , Terutaka Mori , Hidetaka Shigi , Takayoshi Watanabe
IPC分类号： G01R31/26 , H01L21/66 , H01L21/00 , H01L21/48
CPC分类号： G01R3/00 , G01R1/0735
摘要： Dispersion of load may be kept within an allowance even when a plurality of probes in a large area are pressed in batch by pressing the probes provided in a membrane to a wafer by applying a pressure load to a plurality of places of a plane of pressure members on the side opposite from the wafer in a probe test step/burn-in test step which is one of semiconductor device manufacturing steps. It is then possible to provide semiconductor devices and a manufacturing method thereof which enhance the reliability and productivity of the semiconductor devices by probing a large number of integrated circuits or a large size integrated circuit in the same time.
摘要翻译：即使当大量区域中的多个探针通过将设置在膜中的探针压迫到晶片而将压力负载施加到压力构件的平面的多个位置时，负载的分散也可以保持在容许范围内在作为半导体器件制造步骤之一的探针测试步骤/老化测试步骤中与晶片相对的一侧。因此，可以提供通过同时探测大量集成电路或大尺寸集成电路来提高半导体器件的可靠性和生产率的半导体器件及其制造方法。

86. 发明授权

US07053926B2 Electronic endoscope apparatus enlarging a still image 有权
公开(公告)号：US07053926B2
公开(公告)日：2006-05-30
申请号：US09953175
申请日：2001-09-17
申请人： Yuji Wada , Kazuhiro Yamanaka , Mitsuru Higuchi
发明人： Yuji Wada , Kazuhiro Yamanaka , Mitsuru Higuchi
IPC分类号： H04N7/18
CPC分类号： H04N7/183
摘要： When a first-stage operation or first operation of a freeze switch is performed, a still image is stored in image memory and is displayed on a monitor. When an electronic variable power switch is operated in this state, a still image electronically enlarged is formed on the basis of a signal of the above-described image memory. Then, when a second-stage operation or second operation of the freeze switch is performed, the above-described enlarged still image is recorded in a recording device. Owing to this, it is possible to display and record an arbitrary still image that is enlarged and is positioned on optimum conditions. Moreover, by single operation of an electronic variable power switch, an enlarged still image can be formed and can be also recorded simultaneously. Furthermore, even if continuous recording operation is prohibited, the next recording operation can be performed by operating the electronic variable power switch.

87. 发明授权

US06988272B1 Object collaboration apparatus 失效
标题翻译：对象协作设备
公开(公告)号：US06988272B1
公开(公告)日：2006-01-17
申请号：US09407307
申请日：1999-09-29
申请人： Tadashige Iwao , Makoto Okada , Yuji Wada
发明人： Tadashige Iwao , Makoto Okada , Yuji Wada
IPC分类号： G06F9/46
CPC分类号： G06Q10/10 , G06Q40/04
摘要： An object collaboration apparatus is driven by a message action relation, and can dynamically build a collaboration between objects using a bidding system. A task initiator object circulates a requesting message, indicating the service content that the task initiator object wants to request, on a shared communication channel 504, and this requesting message is received by each service object. If an action that is a reaction to the message is listed in a reaction table 703 stored by the service objects, the service objects create and return a bidding message, which includes a bidding value, for example the CPU load ratio, with the bidding portion 707. An arbitrating portion of the initiator object receives all bidding messages in a certain period of time, and, in consideration of parameters such as the bidding value and the communication time between objects, determines and awards the bid to the bid-winning object. Then, it sends out the requested processing information together with the bid awarding message. The bid-winning object processes the requested task with an action execution portion 704.
摘要翻译：对象协作装置由消息动作关系驱动，并且可以使用出价系统动态地建立对象之间的协作。任务发起者对象在共享通信信道504上循环指示该任务发起者对象想要请求的服务内容的请求消息，并且该请求消息被每个服务对象接收。如果对服务对象存储的反应表703中列出了对消息的反应的动作，则服务对象创建并返回包括投标价值（例如CPU负载率）的投标消息与投标部分 707.启动器对象的仲裁部分在一定时间段内接收所有招标信息，考虑到投标价值和对象之间的通信时间等参数，确定并对投标对象进行投标。然后，发出请求的处理信息和投标授标信息。中标对象用动作执行部分704来处理所请求的任务。

88. 发明申请

US20050193274A1 Method and apparatus for testing a memory device in quasi-operating conditions 失效
标题翻译：用于在准操作条件下测试存储器件的方法和装置
公开(公告)号：US20050193274A1
公开(公告)日：2005-09-01
申请号：US11107896
申请日：2005-04-18
申请人： Hideyuki Aoki , Takeshi Wada , Masaaki Namba , Noboru Uchida , Shigeki Katsumi , Yuji Wada , Masaaki Mochiduki
发明人： Hideyuki Aoki , Takeshi Wada , Masaaki Namba , Noboru Uchida , Shigeki Katsumi , Yuji Wada , Masaaki Mochiduki
IPC分类号： G01R31/28 , G06F12/16 , G11C29/56 , G06F11/00
CPC分类号： G11C29/56
摘要： A memory test system can screen objects of tests accurately at low cost in quasi-operating conditions by utilizing a personal computer. The system utilizes a PC tester comprising a measurement PC unit that carries a memory module to be used as reference; a signal distribution unit for distributing the signal taken out from the measurement PC unit; a plurality of PFBs mounted with respective objected products to be observed simultaneously by using the signals distributed by the signal distribution unit; a display panel for displaying the current status of the test that is being conducted; a power source for producing the operating voltage of the system; and a control PC for controlling the selection of test parameters and various analytical operations. The PC tester is adapted to take out the signal from the chip set LSI on the PC mother board in the measurement PC unit to the individual memories on the memory module or the memory module per se and test them in quasi-operating conditions.
摘要翻译：记忆测试系统可以通过使用个人计算机在准操作条件下以低成本准确地屏蔽测试对象。该系统利用包括测量PC单元的PC测试器，该单元携带用作参考的存储器模块; 信号分配单元，用于分配从测量PC单元取出的信号; 通过使用由信号分配单元分配的信号同时观察安装有相应对象产品的多个PFB; 用于显示正在进行的测试的当前状态的显示面板; 用于产生系统的工作电压的电源; 以及用于控制测试参数和各种分析操作的选择的控制PC。 PC测试器适于将测量PC单元中的PC母板上的芯片组LSI的信号从存储器模块或存储器模块本身的各个存储器中取出，并在准工作条件下进行测试。

89. 发明授权

US06566150B2 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step 失效
公开(公告)号：US06566150B2
公开(公告)日：2003-05-20
申请号：US10171695
申请日：2002-06-17
申请人： Ryuji Kohno , Tetsuo Kumazawa , Makoto Kitano , Akihiko Ariga , Yuji Wada , Naoto Ban , Shuji Shibuya , Yasuhiro Motoyama , Kunio Matsumoto , Susumu Kasukabe , Terutaka Mori , Hidetaka Shigi , Takayoshi Watanabe
发明人： Ryuji Kohno , Tetsuo Kumazawa , Makoto Kitano , Akihiko Ariga , Yuji Wada , Naoto Ban , Shuji Shibuya , Yasuhiro Motoyama , Kunio Matsumoto , Susumu Kasukabe , Terutaka Mori , Hidetaka Shigi , Takayoshi Watanabe
IPC分类号： G01R3126
CPC分类号： G01R3/00 , G01R1/0735
摘要： Dispersion of load may be kept within an allowance even when a plurality of probes in a large area are pressed in batch by pressing the probes provided in a membrane to a wafer by applying a pressure load to a plurality of places of a plane of pressure members on the side opposite from the wafer in a probe test step/burn-in test step which is one of semiconductor device manufacturing steps. It is then possible to provide semiconductor devices and a manufacturing method thereof which enhance the reliability and productivity of the semiconductor devices by probing a large number of integrated circuits or a large size integrated circuit in the same time.

90. 发明授权

US5448694A Figure displaying system and figure displaying method using same 失效
标题翻译：图显示系统和图显示方法使用相同
公开(公告)号：US5448694A
公开(公告)日：1995-09-05
申请号：US109265
申请日：1993-08-20
申请人： Yuji Wada , Munenori Maeda
发明人： Yuji Wada , Munenori Maeda
IPC分类号： G06F3/153 , G06T11/20 , G06T11/80 , G09G5/20 , G06F15/66
CPC分类号： G06T13/00
摘要： A device, for managing rendering information of a figure included in a display instruction of the figure by an identifier of the figure, is provided separately from an application processor. The application processor supplies an instruction to a figure display processor by using a figure operation instruction part executing the operation of the figure including a metamorphosis. By a special request for a metamorphosis instruction, a shape information in the rendering information is updated to the shape information after metamorphosing, and thus, the shape of an objective figure to be displayed can be changed easily.
摘要翻译：用于通过图形的标识符管理包括在图形的显示指令中的图形的显示信息的设备与应用处理器分离地提供。应用处理器通过使用执行包括变形的图的操作的图形操作指令部分向图形显示处理器提供指令。通过对变形指令的特殊要求，将变形信息中的形状信息更新为变形后的形状信息，因此可以容易地改变要显示的客观图形的形状。

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