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    • 86. 发明授权
    • Optical recording medium
    • 在连续帧之间改变跟踪凹坑位置的光记录介质
    • US06510130B2
    • 2003-01-21
    • US09940693
    • 2001-08-29
    • Hideki HayashiToshio Goto
    • Hideki HayashiToshio Goto
    • G11B700
    • G11B7/0901G11B7/00745G11B7/0938
    • An optical recording medium that enables a recording or reproduction apparatus to perform accurate tracking servo control even if intersymbol interference occurs. An optical recording medium includes a plurality of frames continuously extending in an information reading direction. Each frame is defined by a servo region for recording tracking pits used in tracking servo control and a data region for recording information data. A position of each of the respective tracking pits in each respective servo region is changed in the information reading direction between successive frames.
    • 即使发生符号间干扰,也能够使记录再现装置执行精确的跟踪伺服控制的光记录介质。 光记录介质包括在信息读取方向上连续延伸的多个帧。 每个帧由用于记录用于跟踪伺服控制的跟踪凹坑的伺服区域和用于记录信息数据的数据区域定义。 每个相应伺服区域中的每个跟踪凹坑中的每一个的位置在连续帧之间的信息读取方向上改变。
    • 89. 发明授权
    • Semiconductor device testing apparatus
    • 半导体器件测试仪器
    • US5969537A
    • 1999-10-19
    • US21369
    • 1998-02-10
    • Yukio KannoToshio Goto
    • Yukio KannoToshio Goto
    • G01R31/26B65G49/07G01R31/28H05K13/02
    • G01R31/2877G01R31/2867H05K13/021
    • In an IC tester of the type in which ICs to be tested are heated by a planar heater plate 50 prior to being tested, a plate-like shutter 70 having windows 71 formed therethrough to expose IC receiving recesses 51 formed in the heater plate 50 is disposed movably over the top face of the heater plate. The arrangement is such that the shutter 70 is shifted by a linear drive source 74 between a position in which the shutter closes the top of the IC receiving recesses 51 and a position in which the shutter exposes the recesses. A controller is provided for actuating the drive source to move the shutter so as to open the IC receiving recesses, whenever a Z-axis drive unit 60 enters into either the operation of dropping off an IC grasped thereby into one of the IC receiving recesses or the operation of picking up an IC from one of the IC receiving recesses.
    • 在被测试中的IC被加热的平面加热板50的IC测试器中,具有通过其形成的窗口71露出以形成加热板50中的IC接收凹部51的板状挡板70是 可移动地设置在加热器板的顶面上。 该装置使得闸门70在其中快门关闭IC接收凹部51的顶部的位置和快门暴露凹部的位置之间通过线性驱动源74移动。 只要Z轴驱动单元60进入将IC所抓取的IC掉入到IC接收凹槽中的一个的操作中,则提供控制器用于致动驱动源以移动闸门以便打开IC接收凹部,或者 从IC接收凹部中的一个拾取IC的操作。