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    • 83. 发明授权
    • Apparatus for measuring beam characteristics and a method thereof
    • 用于测量光束特性的装置及其方法
    • US08097866B2
    • 2012-01-17
    • US12031643
    • 2008-02-14
    • Joseph C. OlsonAtul Gupta
    • Joseph C. OlsonAtul Gupta
    • G01T1/00
    • H01J37/3171H01J37/304H01J2237/2446H01J2237/24507H01J2237/24528H01J2237/24542
    • An apparatus and a method for detecting particle beam characteristics are disclosed. In one embodiment, the apparatus may have a body including a first end and second end and at least one detector between the first and second ends. The apparatus may have a transparent state where a portion of the particles entering the apparatus may pass through the apparatus. The apparatus may also have a minimum transparency state where substantially all of the particles entering the apparatus may be prevented from passing through the apparatus and detected. Different transparency state may be achieved by rotating the apparatus or the detector contained therein. With the apparatus, it is possible to detect the beam properties such as the beam intensity, angle, parallelism, and a distribution of the particles in a particle beam.
    • 公开了一种用于检测粒子束特性的装置和方法。 在一个实施例中,设备可以具有包括第一端和第二端的主体以及在第一端和第二端之间的至少一个检测器。 该设备可以具有透明状态,其中进入设备的一部分颗粒可以通过设备。 该装置还可以具有最小的透明度状态,其中可以防止进入装置的基本上所有的颗粒通过装置并被检测。 可以通过旋转装置或其中包含的检测器来实现不同的透明度状态。 利用该装置,可以检测诸如光束强度,角度,平行度以及颗粒束中颗粒分布的光束特性。