专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

71. 发明授权

US5301117A Method for creating a three-dimensional corporeal model from a very small original 失效
标题翻译：从非常小的原创创建三维体系模型的方法
公开(公告)号：US5301117A
公开(公告)日：1994-04-05
申请号：US790329
申请日：1991-11-12
申请人： Giorgio Riga
发明人： Giorgio Riga
IPC分类号： G01Q30/02 , G01Q30/04 , G01Q60/00 , G01Q80/00 , G05B19/42 , G06F15/46
CPC分类号： G05B19/4207 , G05B2219/35016 , G05B2219/49011 , Y10S623/901
摘要： A method to construct an accurate scaled model from an original too small to allow for physical measurement is disclosed, said method generally comprising the steps of determining the initial geometry of the original, analyzing the original to determine its internal structure, establishing a reference useful for quantitative measurement of the object, physically dissecting the original, recording the results of the physical dissection, and constructing the model at a desired scale based on quantitative measurements obtained from the dissection of the original.
摘要翻译：公开了一种从原始太小构建准确缩放模型以允许物理测量的方法，所述方法通常包括以下步骤：确定原件的初始几何，分析原件以确定其内部结构，建立用于对物体的定量测量，物理剖析原始物质，记录物理解剖结果，并根据从原始解剖获得的定量测量以期望的尺度构建模型。

72. 发明授权

US5278704A Information processing apparatus including magnetic material having a predetermined magnetization pattern with respect to a recording medium 失效
标题翻译：信息处理设备包括相对于记录介质具有预定磁化模式的磁性材料
公开(公告)号：US5278704A
公开(公告)日：1994-01-11
申请号：US755579
申请日：1991-09-05
申请人： Hiroshi Matsuda , Hisaaki Kawade , Ken Eguchi , Etsuro Kishi , Hideyuki Kawagishi , Kiyoshi Takimoto , Yuji Kasanuki , Yoshihiro Yanagisawa , Toshihiko Takeda
发明人： Hiroshi Matsuda , Hisaaki Kawade , Ken Eguchi , Etsuro Kishi , Hideyuki Kawagishi , Kiyoshi Takimoto , Yuji Kasanuki , Yoshihiro Yanagisawa , Toshihiko Takeda
IPC分类号： G01Q30/04 , G01Q60/10 , G01Q60/50 , G01Q80/00 , G11B9/00 , G11B9/04 , G11B9/14 , G11B21/08 , G11B23/34 , H01L21/68 , G11B5/02
CPC分类号： H01L21/682 , G11B21/08 , G11B23/34 , G11B9/1454 , G11B9/1481 , B82Y10/00 , G01Q80/00
摘要： An information processing apparatus including a recording medium, a magnetic material having a predetermined magnetization pattern with respect to the recording medium, a first device for detecting the magnetization pattern of the magnetic material, a second device for detecting a change of the recording medium and a third device for driving the recording medium and the second device relative to each other, based on a signal from the first device.
摘要翻译：一种信息处理装置，包括记录介质，相对于记录介质具有预定磁化模式的磁性材料，用于检测磁性材料的磁化模式的第一装置，用于检测记录介质变化的第二装置和第三装置，用于根据来自第一装置的信号相对于彼此驱动记录介质和第二装置。

73. 发明授权

US5266897A Magnetic field observation with tunneling microscopy 失效
标题翻译：用隧道显微镜观察磁场
公开(公告)号：US5266897A
公开(公告)日：1993-11-30
申请号：US23750
申请日：1993-02-24
申请人： Osaaki Watanuki , Fuminori Sai , Kuniaki Sueoka
发明人： Osaaki Watanuki , Fuminori Sai , Kuniaki Sueoka
IPC分类号： G01B7/34 , G01N27/82 , G01Q30/04 , G01R33/02 , G01R33/10
CPC分类号： G01Q60/16 , B82Y35/00 , G01N27/82 , G01Q60/54 , G01R33/10 , Y10S977/838 , Y10S977/84 , Y10S977/849 , Y10S977/861 , Y10S977/865 , Y10S977/873 , Y10S977/881 , Y10S977/901
摘要： Tunneling microscopy can be used to observe simultaneously the topography of a sample surface that is conductive and data related to the magnetic field near the surface. A tunneling microscope apparatus has a cantilever supporting a tip which has a magnetic moment. To use the apparatus according to a first preferred method, a magnetic field alternating at a predetermined frequency is produced by the sample near the sample surface to vibrate the tip by a magnetic interaction with the magnetic moment. To use the apparatus according to a second preferred method, the direction of the magnetic moment of the tip is switched at a predetermined frequency to vibrate the tip by creating an interaction between the magnetic moment and a magnetic field of the sample. For both preferred methods, the tip is maintained at a distance from the sample surface so as to permit a tunneling current to flow. A component of the predetermined frequency of the tunneling current is extracted to obtain a signal for observing the magnetic field.
摘要翻译：隧道显微镜可用于同时观察导电的样品表面的形貌和与表面附近的磁场有关的数据。隧道显微镜装置具有支撑具有磁矩的尖端的悬臂。为了使用根据第一优选方法的装置，通过样品表面附近的样品产生以预定频率交替的磁场，以通过与磁矩的磁相互作用来振动尖端。为了使用根据第二优选方法的装置，以预定频率切换尖端的磁矩的方向，以通过产生磁矩和样品的磁场之间的相互作用来振动尖端。对于两种优选的方法，尖端保持与样品表面一定距离，以允许隧道电流流动。提取隧道电流的预定频率的分量以获得用于观察磁场的信号。

74. 发明授权

US5260926A Atomic force microscope with a plurality of cantilevers for recording/reproducing information 失效
标题翻译：具有用于记录/再现信息的多个悬臂的原子力显微镜
公开(公告)号：US5260926A
公开(公告)日：1993-11-09
申请号：US870335
申请日：1992-04-17
申请人： Ryo Kuroda , Toshihiko Miyazaki , Kunihiro Sakai , Kiyoshi Takimoto
发明人： Ryo Kuroda , Toshihiko Miyazaki , Kunihiro Sakai , Kiyoshi Takimoto
IPC分类号： G01B11/00 , G01B11/30 , G01B21/30 , G01Q20/02 , G01Q20/04 , G01Q30/04 , G01Q30/10 , G01Q60/24 , G01Q60/40 , G01Q70/06 , G01Q70/14 , G01Q80/00 , G11B9/00 , G11B9/14 , G11B7/00
CPC分类号： G11B9/1427 , G11B9/14 , B82Y10/00 , Y10S977/874 , Y10S977/947
摘要： An information processor comprises a plurality of probes disposed so as to face to a recording medium containing an information, and a plurality of elastic members such as cantilevers supporting the respective probes. The processor reads the information by detecting each displacement of the elastic members. For the detection of displacement, the processor has an optical system for radiating a scanning light beam to the elastic members together with an optical system for detecting a reflected light from the elastic members, or alternatively has a means for detecting each displacement individually such as optically integrated optical members or piezoelectric layers provided to the elastic members.

75. 发明授权

US5224376A Atomic force microscope 失效
公开(公告)号：US5224376A
公开(公告)日：1993-07-06
申请号：US831876
申请日：1992-02-06
申请人： Virgil B. Elings , John A. Gurley , Peter Maivald
发明人： Virgil B. Elings , John A. Gurley , Peter Maivald
IPC分类号： G01B7/34 , G01B21/30 , G01Q20/00 , G01Q30/04 , G01Q60/00
CPC分类号： G01Q10/065 , B82Y35/00 , G01Q60/363 , Y10S977/851
摘要： This invention is an atomic force microscope having a digitally calculated feedback system which can perform force spectroscopy on a sample in order to map out the local stiffness of the sample in addition to providing the topography of the sample. It consists of a three-dimensional piezoelectric scanner, scanning either the sample or a force sensor. The force sensor is a contact type with a tip mounted on a cantilever and a sensor to detect the deflection of the lever at the tip. The signal from the sensor goes to an A-D convertor and is then processed by high-speed digital electronics to control the vertical motion of the sample or sensor. In operation, the digital electronics raise and lower the piezoelectric scanner during the scan to increase and decrease the force of the tip on the sample and to use the sensor signal to indicate the change in height of the tip to measure the which is the spring constant of the sample. This constant can be determined with nanometer spatial resolution. At the same time, the instrument can determine the topography of the sample with nanometer resolution. In an alternate embodiment, the lever is connected to a separate piezoelectric driver to vary the force on the tip. This improved AFM can also be used to periodically reset the force at which the tip contacts the sample and quickly replace the tip on the sample in the event that the tip loses contact with the surface.

76. 发明授权

US5132533A Method for forming probe and apparatus therefor 失效
标题翻译：形成探针及其装置的方法
公开(公告)号：US5132533A
公开(公告)日：1992-07-21
申请号：US621886
申请日：1990-12-05
申请人： Toshimitsu Kawase , Akihiko Yamano , Hiroyasu Nose , Toshihiko Miyazaki , Takahiro Oguchi , Ryo Kuroda
发明人： Toshimitsu Kawase , Akihiko Yamano , Hiroyasu Nose , Toshihiko Miyazaki , Takahiro Oguchi , Ryo Kuroda
IPC分类号： B82B3/00 , G01Q10/00 , G01Q30/04 , G01Q60/16 , G11B9/00
CPC分类号： G11B9/1409 , B82Y10/00 , B82Y30/00
摘要： A probe closely positioned to an information carrier in apparatus to effect information reading and/or input on the information carrier is formed by opposing an electrode to an end portion of the probe to be formed. The distance between probe end portion and the electrode is detected to control the position of the electrode with respect to the probe. A voltage is applied to the probe end portion through the electrode under positioning control to form the probe end portion. The probe end portion is formed and may be reformed to maintain reliable performance of the information reading and/or input apparatus.

77. 发明授权

US5129132A Method of making an integrated scanning tunneling microscope 失效
标题翻译：制作集成扫描隧道显微镜的方法
公开(公告)号：US5129132A
公开(公告)日：1992-07-14
申请号：US463108
申请日：1990-01-10
申请人： Mark Zdeblick , Thomas R. Albrecht
发明人： Mark Zdeblick , Thomas R. Albrecht
IPC分类号： G01B7/34 , B44C1/22 , G01N23/00 , G01N23/225 , G01N27/00 , G01N37/00 , G01Q10/06 , G01Q20/04 , G01Q30/04 , G01Q60/10 , G01Q60/16 , G01Q70/16 , G01Q80/00 , G11B9/00 , G11B9/04 , G11B9/14 , G11C13/00 , G11C13/04 , H01J37/20 , H01J37/28 , H01L41/09 , H01L41/22 , H02N2/00
CPC分类号： H01L41/0966 , B82Y35/00 , G01Q10/045 , G01Q60/16 , G11B9/14 , G11B9/1418 , G11B9/1436 , G11B9/1472 , H01J37/20 , H01L41/316 , B82Y10/00 , G01Q80/00 , Y10S977/837 , Y10S977/861 , Y10S977/872 , Y10S977/873 , Y10S977/943 , Y10S977/947 , Y10T29/42
摘要： An integrated scanning tunneling microscope and an integrated piezoelectric transducer and methods for making both. The device consists of one or two arm piezoelectric bimorph cantilevers formed by micromachining using standard integrated circuit processing steps. These cantilevers are attached to the substrate at one area and are free to move under the influence of piezoelectric forces which are caused by the application of appropriate voltages generated by control circuitry and applied to pairs of electrodes formed as an integral part of the bimorph cantilever structure. The electric fields caused by the control voltages cause the piezoelectric bimorphs to move in any desired fashion within ranges determined by the design. The bimorph cantilevers have tips with very sharp points formed thereon which are moved by the action of the control circuit and the piezoelectric bimorphs so to stay within a very small distance of a conducting surface. The movements of the tip can be tracked to yield an image of the surface at atomic resolution.
摘要翻译：集成扫描隧道显微镜和集成压电换能器及其制造方法。该器件由使用标准集成电路处理步骤的微加工形成的一个或两个臂压电双压电晶片悬臂组成。这些悬臂在一个区域附接到基板，并且在由施加由控制电路产生的适当电压引起的压电力的影响下自由移动并施加到形成为双压电晶片悬臂结构的组成部分的电极对。由控制电压引起的电场导致压电双晶片以任何期望的方式在由设计确定的范围内移动。双压电晶片悬臂具有形成在其上的非常锋利点的尖端，其通过控制电路和压电双压电晶片的作用移动以保持在导电表面的非常小的距离内。可以跟踪尖端的运动以在原子分辨率下产生表面的图像。

78. 发明授权

US5128545A Method and apparatus for background correction in analysis of a specimen surface 失效
标题翻译：用于样本表面分析的背景校正的方法和装置
公开(公告)号：US5128545A
公开(公告)日：1992-07-07
申请号：US680427
申请日：1991-04-04
申请人： Hideto Komi
发明人： Hideto Komi
IPC分类号： G01N23/22 , G01N23/225 , G01Q30/02 , G01Q30/04 , H01J37/256
CPC分类号： H01J37/256 , G01N23/2252
摘要： A method and apparatus for background correction of the measured data in analysis of a specimen surface by scanning the surface with an electron beam, wherein a signal occurring from an element to be analyzed contained in the specimen is detected to obtain a two-dimensional distribution data of the level of the signal in a predetermined area of the specimen surface; a specimen current induced in the specimen by the scanning is detected to obtain a two-dimensional distribution data of the specimen current in the predetermined specimen surface area; a relation between the background intensity and specimen current of the specimen is calculated from the background intensity and specimen current measured on at least two points in the specimen surface area; a two-dimensional distribution data of the background intensity is calculated from the two-dimensional distribution data of the specimen current by using the calculated relation; and the calculated two-dimensional distribution data of the background intensity is subtracted from the two-dimensional distribution data of the signal level thereby to make a background correction of the distribution data of the signal level.

79. 发明授权

US5065103A Scanning capacitance - voltage microscopy 失效
标题翻译：扫描电容 - 电压显微镜
公开(公告)号：US5065103A
公开(公告)日：1991-11-12
申请号：US499857
申请日：1990-03-27
申请人： James A. Slinkman , Hemantha K. Wickramasinghe , Clayton C. Williams
发明人： James A. Slinkman , Hemantha K. Wickramasinghe , Clayton C. Williams
IPC分类号： G01N27/22 , G01N27/24 , G01Q10/00 , G01Q30/04 , G01Q60/46 , H01L21/66
CPC分类号： G01Q60/46 , B82Y35/00 , G01N27/24
摘要： An apparatus and method for generating microscopic scan data of C-V and/or dC/dV over a scan area. A scanning microscope, for example a scanning force microscope, is provided with a voltage biased tip, for example, of tungsten, which is scanned across an area to derive the data. The data can be used to derive a plot of semiconductor dopant level across the scan area. Other material properties can be derived, for example, carrier generation and recombination rates and subsurface defects.

80. 发明授权

US5008537A Composite apparatus with secondary ion mass spectrometry instrument and scanning electron microscope 失效
标题翻译：具有二次离子质谱仪和扫描电子显微镜的复合装置
公开(公告)号：US5008537A
公开(公告)日：1991-04-16
申请号：US409761
申请日：1989-09-20
申请人： Hiroshi Toita , Hifumi Tamura , Issei Tobita , Hiroshi Iwamoto
发明人： Hiroshi Toita , Hifumi Tamura , Issei Tobita , Hiroshi Iwamoto
IPC分类号： H01J37/08 , G01Q10/00 , G01Q30/04 , G01Q30/14 , H01J27/26 , H01J37/147 , H01J37/252 , H01J37/256 , H01J49/26
CPC分类号： H01J27/26 , H01J37/256
摘要： A composite apparatus is disclosed which includes in combination a secondary ion mass spectrometry instrument and a scanning electron microscope. A liquid metal ion source and an ion source other than the liquid metal ion source are installed in the same apparatus so that an ion beam emitted from the liquid metal ion source and an ion beam emitted from the ion source other than the liquid metal ion source are aligned with each other on a primary beam axis which is an optical axis of an irradiating system. The liquid metal ion source is disposed in rear of a primary ion separating device which mass-separates the ion beam emitted from the ion source other than the liquid metal ion source. Further, an electron gun is installed in the same apparatus so that an electron beam emitted from the electron gun is aligned with the ion beam on the primary beam axis.
摘要翻译：公开了一种复合装置，其包括二次离子质谱仪和扫描电子显微镜。液体金属离子源和液体金属离子源以外的离子源安装在同一装置中，使得从液体金属离子源发射的离子束和离子源（液体金属离子源以外）发射的离子束在作为照射系统的光轴的主光束轴上彼此对准。液体金属离子源设置在主离子分离装置的后方，该离子分离装置对离子源发射的液体金属离子源以外的离子束进行质量分离。此外，电子枪安装在相同的装置中，使得从电子枪发射的电子束与主光束轴上的离子束对准。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式