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    • 75. 发明授权
    • Method of manufacturing semiconductor device
    • 制造半导体器件的方法
    • US07465668B2
    • 2008-12-16
    • US11296483
    • 2005-12-08
    • Dai FukushimaGaku MinamihabaHiroyuki Yano
    • Dai FukushimaGaku MinamihabaHiroyuki Yano
    • H01L21/302
    • B24B37/042H01L21/3212H01L21/7684
    • A method for manufacturing a semiconductor device is provided, which includes depositing a conductive film above an insulating film formed above a semiconductor substrate and having a recess, thereby forming a treating film, polishing the treating film while feeding a first chemical solution containing abrasive particles and a second chemical solution containing an oxidizing agent over a polishing pad, the treating film being contacted with the polishing pad at a first load, and subsequent to the polishing, subjecting a surface of the treating film to a chemical-polishing by continuing the feeding of the first chemical solution over the polishing pad while suspending the feeding of the second chemical solution, the treating film being contacted with the polishing pad at a second load which is smaller than the first load.
    • 提供了一种制造半导体器件的方法,其包括在半导体衬底上形成的绝缘膜上方形成导电膜并具有凹陷,从而形成处理膜,同时在加入含有磨料颗粒的第一化学溶液的同时抛光处理膜, 在抛光垫上含有氧化剂的第二化学溶液,所述处理膜在第一次负载下与抛光垫接触,并且在抛光之后,通过继续进行抛光来对处理膜的表面进行化学抛光 在悬浮第二化学溶液的进料的同时在抛光垫上方的第一化学溶液,处理膜以小于第一载荷的第二载荷与抛光垫接触。
    • 77. 发明授权
    • Slurry for CMP, polishing method and method of manufacturing semiconductor device
    • 用于CMP的浆料,抛光方法和制造半导体器件的方法
    • US07332104B2
    • 2008-02-19
    • US11407945
    • 2006-04-21
    • Gaku MinamihabaYukiteru MatsuiHiroyuki Yano
    • Gaku MinamihabaYukiteru MatsuiHiroyuki Yano
    • C09K13/00
    • H01L21/3212C09G1/02
    • Disclosed is a CMP slurry comprising a first colloidal particle having a primary particle diameter ranging from 5 nm to 30 nm and an average particle diameter of d1, the first colloidal particle being incorporated in an amount of w1 by weight and a second colloidal particle having a primary particle diameter larger than that of the first colloidal particle and an average particle diameter of d2, the second colloidal particle being formed of the same material as that of the first colloidal particle and incorporated in an amount of w2 by weight, wherein d1, d2, w1 and w2 are selected to concurrently meet following conditions (A) and (B) excluding situations where d1, d2, w1 and w2 concurrently meet following conditions (C) and (D): 3≦d2/d1≦8  (A) 0.7≦w1/(w1+w2)≦0.97  (B) 3≦d2/d1≦5  (C) 0.7≦w1/(w1+w2)≦0.9.  (D)
    • 公开了一种CMP浆料,其包含一次粒径为5nm〜30nm,平均粒径为d1的第一胶体粒子,第一胶体粒子的重量为w1,第二胶体粒子具有 一次粒径大于第一胶体粒子的粒径,平均粒径为d2,第二胶体粒子由与第一胶体粒子相同的材料形成,w 2的重量比为d 2,d2 选择w1和w2同时满足以下条件(A)和(B),不包括d1,d2,w1和w2同时符合以下条件(C)和(D)的情况:<?在线公式描述=“ 在线公式“end =”lead“?> 3 <= d2 / d1 <= 8(A)<?in-line-formula description =”In-line Formulas“end =”tail“?> line-formula description =“In-line Formulas”end =“lead”?> 0.7 <= w1 /(w1 + w2)<= 0.97(B)<?in-line-formula description =“I 3线=公式“end =”tail“?> <?in-line-formula description =”In-line Formulas“end =”lead“?> 3 <= d2 / d1 <= 5(C) line-formula description =“In-line Formulas”end =“tail”?> <?in-line-formula description =“In-line Formulas”end =“lead”?> 0.7 <= w1 /(w1 + w2) <= 0.9。 (D)<?in-line-formula description =“In-line Formulas”end =“tail”?>