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61. 发明申请

US20150276863A1 Handler Apparatus and Test Apparatus 有权
标题翻译：处理器和测试仪器
公开(公告)号：US20150276863A1
公开(公告)日：2015-10-01
申请号：US14472394
申请日：2014-08-29
申请人： ADVANTEST CORPORATION
发明人： Tsuyoshi YAMASHITA , Mitsunori AIZAWA , Hiromitsu HORINO , Yuya YAMADA , Masataka ONOZAWA
IPC分类号： G01R31/28 , G01C11/00 , G01R1/04
CPC分类号： G01R31/2891 , G01C11/00 , G01R1/0441 , G01R31/2893
摘要： Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.
摘要翻译：提供一种处理装置，其将被测设备传送到测试插座，包括：在将被测设备固定到测试插座之前，测试插座装配的插座装配单元; 测试座位置检测部，其在插座接头单元与测试插座配合的状态下，检测插座接头单元相对于测试插座的相对位置; 基于检测到的插座装配单元的相对位置来调节被测设备在设备保持器上的位置的致动器; 以及传送装置保持器的传送带，其中被测设备的位置已被调整，以适应测试插座。

62. 发明申请

US20150276861A1 HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST APPARATUS 有权
标题翻译：操作装置，操纵装置的调整方法和试验装置
公开(公告)号：US20150276861A1
公开(公告)日：2015-10-01
申请号：US14472388
申请日：2014-08-29
申请人： ADVANTEST CORPORATION
发明人： Tsuyoshi YAMASHITA , Mitsunori AIZAWA , Hiromitsu HORINO , Yuya YAMADA , Masataka ONOZAWA
IPC分类号： G01R31/28 , G01R1/04 , G01C11/00
CPC分类号： G01R31/2891 , G01C11/00 , G01R1/0441 , G01R31/2893
摘要： A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.
摘要翻译：处理机设备调节致动器的位置并提高被测设备的位置精度。提供了一种将测试装置传送到测试插座的处理装置，包括：致动器，其在将被测试装置保持在测试插座之前装配到装置支架上，并且调节装置的位置设备支架上的被测装置; 以及致动器调节部，其通过使致动器配合致动器装配单元来调节致动器的驱动量。

63. 发明授权

US09110131B2 Method and device for contacting a row of contact areas with probe tips 有权
标题翻译：用于将一排接触区域与探针接头接触的方法和装置
公开(公告)号：US09110131B2
公开(公告)日：2015-08-18
申请号：US13640432
申请日：2010-04-13
申请人： Claus Dietrich , Stojan Kanev , Frank Fehrmann , Botho Hirschfeld
发明人： Claus Dietrich , Stojan Kanev , Frank Fehrmann , Botho Hirschfeld
IPC分类号： G01R1/067 , G01R31/28
CPC分类号： G01R31/2891
摘要： The invention generally relates to a method and device for contacting contact areas (22) with probe tips (18) in a tester. The contact areas (22), which are arranged on a substrate (6), and the probe tips (18) are positioned relative to each other and then brought in contact with each other by an advancing motion. In order to detect a secure contact for each of the probe tips (18), the contacting between the probe tips (18) and the contact areas (22) is observed from at least two observation directions (34), which include an observation angle α in a range of 0 to 180°.
摘要翻译：本发明总体上涉及用于使接触区域（22）与测试仪中的探针尖端（18）接触的方法和装置。布置在基板（6）上的接触区域（22）和探针尖端（18）相对于彼此定位，然后通过前进运动彼此接触。为了检测每个探针尖端（18）的牢固接触，从至少两个观察方向（34）观察探针尖端（18）和接触区域（22）之间的接触，其中包括观察角 α在0〜180度的范围内。

64. 发明申请

US20150204962A1 METHOD OF OPERATING TESTING SYSTEM 有权
标题翻译：操作测试系统的方法
公开(公告)号：US20150204962A1
公开(公告)日：2015-07-23
申请号：US14557181
申请日：2014-12-01
申请人： MPI CORPORATION
发明人： WEI-CHENG KU , SHAO-WEI LU , HAO WEI , YU-TSE WANG
IPC分类号： G01R35/00 , G01R31/04
CPC分类号： G01R31/2891 , G01R35/005
摘要： A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.
摘要翻译：提供了一种操作测试系统的方法，其中所述测试系统具有测试机器和探针模块，所述测试机器和探针模块具有第一探针组和第二探针组。第一个探针组和第二个探针组之一可以连接到测试机。该方法包括以下步骤：连接测试机和第一个探头组; 校准测试系统; 将第一个探测器对准DUT进行电气测试; 断开第一个探针组和DUT; 断开测试机和第一个探头组; 连接测试机和第二个探头组; 再次校准测试系统; 将第二个探测器对准DUT，进行电气测试。

65. 发明申请

US20150204943A1 TEST HANDLER THAT PICKS UP ELECTRONIC DEVICES FOR TESTING AND AN ORIENTATION-CHANGING APPARATUS FOR USE IN A TEST HANDLER 有权
标题翻译：用于测试的电子设备的测试操作和用于测试处理器的方向改变设备
公开(公告)号：US20150204943A1
公开(公告)日：2015-07-23
申请号：US14603251
申请日：2015-01-22
申请人： Shing Kai YIP , Chi Wah CHENG
发明人： Shing Kai YIP , Chi Wah CHENG
IPC分类号： G01R31/28 , G01R31/26 , G01R1/067
CPC分类号： G01R31/2891 , G01N1/00 , G01N2201/00 , G01R1/00 , G01R1/06705 , G01R31/26 , G01R31/2893
摘要： A test handler comprises an orientation changing device having a device holder for holding electronic devices, the device holder having a vertical rotary axis. A conveying device is operative to convey electronic devices to the device holder, and a rotary motor connected to the device holder is operative to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on it. A rotary turret of the test handler has a plurality of pick heads arranged on the rotary turret, and each pick head is configured to pick up electronic devices from the device holder.
摘要翻译：测试处理器包括具有用于保持电子设备的设备保持器的定向改变设备，该设备保持器具有竖直旋转轴线。传送装置用于将电子装置传送到装置保持器，并且连接到装置保持器的旋转电机可操作以围绕垂直旋转轴线旋转装置保持架以改变保持在其上的电子装置的取向。测试处理器的旋转转台具有设置在旋转转台上的多个拾取头，并且每个拾取头构造成从装置保持器拾取电子装置。

66. 发明授权

US09047671B2 Platelike workpiece with alignment mark 有权
标题翻译：具有对准标记的平板工件
公开(公告)号：US09047671B2
公开(公告)日：2015-06-02
申请号：US14244086
申请日：2014-04-03
申请人： DISCO CORPORATION
发明人： Nobuhide Maeda
IPC分类号： G06T3/00
CPC分类号： G06T3/0068 , G01R31/2891 , G06T2207/30148 , H01L21/681 , H05K1/0269 , H05K3/0008 , H05K2201/09918 , H05K2203/166
摘要： A platelike workpiece having an alignment mark formed on the front side thereof and adapted to be recognized by an imaging unit included in an alignment apparatus for performing alignment. The platelike workpiece includes a plurality of direction indicating marks formed at given intervals so as to surround the alignment mark. Each of the direction indicating marks is pointed toward the alignment mark. The space of the direction indicating marks is set so that at least two of the plural direction indicating marks fall in the visual field of the imaging unit in viewing the platelike workpiece from the imaging unit.
摘要翻译：具有形成在其前侧上的对准标记的板状工件，并且适于由包括在用于进行对准的对准装置中的成像单元识别。板状工件包括以规定间隔形成的多个方向指示标记，以包围对准标记。每个方向指示标记指向对准标记。设定方向指示标记的空间，使得多个方向指示标记中的至少两个在从成像单元观察板状工件时落在成像单元的视野内。

67. 发明授权

US09030223B2 Test carrier 有权
标题翻译：测试载体
公开(公告)号：US09030223B2
公开(公告)日：2015-05-12
申请号：US13502655
申请日：2010-05-10
申请人： Kiyoto Nakamura , Yoshinari Kogure
发明人： Kiyoto Nakamura , Yoshinari Kogure
IPC分类号： G01R31/26 , G01R31/28 , H01L21/683 , H01L23/544 , H01L23/00
CPC分类号： G01R31/2893 , G01R31/2891 , H01L21/6835 , H01L23/544 , H01L24/81 , H01L2223/5442 , H01L2223/54426 , H01L2224/81121 , H01L2224/81801 , H01L2924/01019 , H01L2924/09701 , H01L2924/12042 , H01L2924/14 , Y10T29/4913 , Y10T29/49131 , Y10T29/53174 , Y10T29/53183 , H01L2924/00
摘要： A test carrier includes a base member and a cover member between which a die is interposed. The base film of the base member has: first interconnect patterns which are formed in advance; and a printing region where second interconnect patterns which electrically connect to the first interconnect patterns are to be formed by printing.
摘要翻译：一种测试载体包括一个基底构件和一个盖构件，模具插在其间。基体的基膜具有：预先形成的第一互连图案; 以及通过印刷形成电连接到第一布线图案的第二布线图案的印刷区域。

68. 发明申请

US20150123689A1 Electrically Conductive Pins For Microcircuit Tester 审中-公开
标题翻译：微电路测试仪导电销
公开(公告)号：US20150123689A1
公开(公告)日：2015-05-07
申请号：US14594872
申请日：2015-01-12
申请人： Johnstech International Corporation
发明人： John E. Nelson , Jeffrey C. Sherry , Patrick J. Alladio , Russell F. Oberg , Brian Warwick , Gary W. Michalko
IPC分类号： G01R31/28 , G01R1/073 , G01R3/00 , G01R1/04
CPC分类号： G01R31/2891 , G01R1/0416 , G01R1/06738 , G01R1/06744 , G01R1/0735 , G01R3/00 , G01R31/2887 , G01R31/2889 , H01R43/16 , Y10T29/49204
摘要： The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface.
摘要翻译：被测器件的端子通过一系列导电引脚对临时电连接到负载板上的对应接触焊盘。销对通过插入器膜保持在适当的位置，该插入器膜包括面向被测器件的顶部接触板，面向负载板的底部接触板以及位于顶部和底部接触板之间的垂直弹性的非导电部件。每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。当纵向压缩时，销沿着界面滑动朝向彼此平移。

69. 发明授权

US09007085B2 Test apparatus of semiconductor package and methods of testing the semiconductor package using the same 有权
标题翻译：半导体封装的测试装置和使用其的半导体封装的测试方法
公开(公告)号：US09007085B2
公开(公告)日：2015-04-14
申请号：US13532982
申请日：2012-06-26
申请人： Hunkyo Seo
发明人： Hunkyo Seo
IPC分类号： G01R31/00 , G01R1/04 , G01R31/28
CPC分类号： G01R1/0483 , G01R1/0466 , G01R31/2891
摘要： A semiconductor package testing apparatus and testing a semiconductor package, the apparatus including a test circuit substrate that electrically tests a semiconductor package having connection terminals; a socket electrically connecting the test circuit substrate with the semiconductor package; a socket guide having an open region delimiting the socket; an insert that fixes the semiconductor package and positions the semiconductor package in the open region of the socket guide; a pusher that presses the semiconductor package to make contact between the socket and the semiconductor package; and an alignment part that aligns the semiconductor package with the open region, wherein the alignment part is configured to selectively apply a magnetic force to align keys of the semiconductor package, the align keys being formed of a magnetic material.
摘要翻译：一种半导体封装测试装置和半导体封装的测试，该装置包括：电测试具有连接端子的半导体封装的测试电路基板; 将测试电路基板与半导体封装电连接的插座; 具有限定所述插座的开放区域的插座引导件; 固定所述半导体封装并将所述半导体封装定位在所述插座引导件的开放区域中的插入件; 按压半导体封装以在插座和半导体封装之间接触的推动器; 以及将半导体封装与开放区域对准的对准部件，其中对准部件被配置为选择性地施加磁力以对准半导体封装的键，对准键由磁性材料形成。

70. 发明授权

US08981807B2 Positioner system and method of positioning 有权
标题翻译：定位系统和定位方法
公开(公告)号：US08981807B2
公开(公告)日：2015-03-17
申请号：US13190928
申请日：2011-07-26
申请人： Christopher Leonard West , Charles Paul Nappen
发明人： Christopher Leonard West , Charles Paul Nappen
IPC分类号： G01R31/20 , G01R31/28
CPC分类号： G01R31/2887 , B25J9/023 , B25J9/041 , B25J17/0208 , B25J19/002 , G01R31/2834 , G01R31/2891
摘要： A system for positioning a load including a support column, a drive rail unit coupled to the support column, the drive rail unit moveable relative to the support column, a vertical carriage moveable along the support column, wherein the vertical carriage supports the load, an engagement member which engages the drive rail and which moves along the drive rail, and a motor which applies force to the engagement member, causing the engagement member to move along the drive rail. The motor is coupled to the vertical carriage so that, as the motor applies force to the engagement member, the vertical carriage moves relative to the drive rail unit, the vertical carriage is also moveable with the drive rail unit so that the vertical carriage and the drive rail unit move relative to the support column. A method of positioning a load is also provided.
摘要翻译：一种用于定位负载的系统，包括支撑柱，耦合到支撑柱的驱动轨单元，可相对于支撑柱移动的驱动轨道单元，可沿着支撑柱移动的竖直托架，其中竖直托架支撑负载，接合构件，其与驱动轨道接合并沿着驱动轨道移动;以及电动机，其向接合构件施加力，使得接合构件沿着驱动轨道移动。电动机联接到垂直滑架，使得当电动机对接合构件施加力时，垂直滑架相对于驱动轨道单元移动，垂直滑架也可以与驱动轨道单元一起移动，使得垂直滑架和驱动轨道单元相对于支撑柱移动。还提供了一种定位负载的方法。

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