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    • 65. 发明授权
    • Method for determining the recombination rate of minority carriers at
boundary surfaces between semiconductors and other substances
    • 用于确定少数载体在半导体与其他物质之间的边界表面的重组速率的方法
    • US5130643A
    • 1992-07-14
    • US617588
    • 1990-11-26
    • Helmut FoellVolker Lehmann
    • Helmut FoellVolker Lehmann
    • G01N21/00G01R31/265H01L21/66
    • G01R31/2656
    • For a two-stage measuring method, a respective cell having an electrode therein is applied to the front surface and to the rear surface of a semiconductor wafer, whereby only the cell as the rear surface is filled with an electrolyte in the first measuring step. The minority carrier photo current I.sub.2 ' flowing between the electrode and the semiconductor surface in the rear cell, given illumination of the front cell of the semiconductor crystal wafer, is dependent on the recombination speed S at the front surface. In the second measuring step, the front cell is also filled with electrolyte and both the rear surface photo current I.sub.2, given what is now a negligible influence of the value S as well as the front surface photo current I.sub.1 are measured. The recombination speed S can be calculated from the measure photo currents with the assistance of a mathematical equation. Given point-by-point illumination and scanning over the crystal wafer, the topical distribution of the recombination speed is obtained.
    • 对于两级测量方法,其中具有电极的各个单元被施加到半导体晶片的前表面和后表面,由此在第一测量步骤中仅仅将电池作为后表面填充有电解质。 在半导体晶体晶片的正面单元的照明下,在电池中的电极和半导体表面之间流动的少数载流子光电流I2'取决于前表面的复合速度S. 在第二测量步骤中,前电池还充满电解质,并且测量了现在对值S以及前表面光电流I1可忽略的影响的背面光电流I2。 可以借助于数学方程式从测量光电流计算复合速度S. 通过逐点照明和晶片上的扫描,可获得复合速度的局部分布。