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    • 61. 发明授权
    • Array architecture and process flow of nonvolatile memory devices for mass storage applications
    • 用于大容量存储应用的非易失性存储器件的阵列架构和处理流程
    • US06258668B1
    • 2001-07-10
    • US09487501
    • 2000-01-19
    • Peter W. LeeHung-Sheng ChenVei-Han Chan
    • Peter W. LeeHung-Sheng ChenVei-Han Chan
    • H01L21336
    • H01L27/11521G11C16/0425G11C16/0491H01L27/115
    • In this invention a process for a flash memory cell and an architecture for using the flash memory cell is disclosed to provide a nonvolatile memory having a high storage density. Adjacent columns of cells share the same source and the source line connecting these sources runs vertically in the memory layout, connecting to the sources of adjacent columns memory cells. Bit lines connect to drains of cells in adjacent columns and are laid out vertically, alternating with source lines in an every other column scheme. Wordlines made of a second layer of polysilicon form control gates of the flash memory cells and are continuous over the full width of a memory partition. Programming is done in a vertical page using hot electrons to inject charge onto the floating gates. the cells are erased using Fowler-Nordheim tunneling of electrons from the floating gate to the control gate by way of inter polysilicon oxide formed on the walls of the floating gates.
    • 在本发明中,公开了一种用于闪存单元的方法和用于使用闪存单元的架构,以提供具有高存储密度的非易失性存储器。 单元格的相邻列共享相同的源,并且连接这些源的源行在存储器布局中垂直运行,连接到相邻列存储单元的源。 位线连接到相邻列中的单元格的漏极,并且在每个其他列方案中垂直布置,与源极线交替。 由第二层多晶硅制成的字线形成闪存单元的控制栅极,并且在存储器分区的整个宽度上是连续的。 使用热电子在垂直页面中进行编程,以将电荷注入到浮动栅极上。 通过使用Fowler-Nordheim从浮置栅极到控制栅极的隧道,通过在浮栅的壁上形成的多晶硅氧化物来消除电池。
    • 63. 发明授权
    • Flash memory address decoder with novel latch structure
    • 具有新型锁存结构的闪存地址解码器
    • US5848000A
    • 1998-12-08
    • US819323
    • 1997-03-18
    • Peter W. LeeHsing-Ya TsaoFu-Chang Hsu
    • Peter W. LeeHsing-Ya TsaoFu-Chang Hsu
    • G11C8/10G11C8/12G11C11/56G11C16/08G11C16/10G11C16/14G11C16/16G11C16/34H01L27/115G11C16/06
    • G11C16/3418G11C11/5621G11C11/5628G11C11/5635G11C11/5642G11C16/08G11C16/10G11C16/14G11C16/16G11C16/3404G11C16/3409G11C16/3413G11C16/3431G11C8/10G11C8/12H01L27/115G11C16/24G11C2211/5642G11C2216/20G11C7/18G11C8/00
    • A flash memory address decoder includes a plurality of voltage terminals to receive a plurality of voltages, an address terminal to receive a plurality of address signals and a procedure terminal to receive a procedure signal. A block decoder is coupled to the address terminal and configured to decode a portion of the address signals to provide a block select signal. A wordline decoder is coupled to the address terminal and configured to decode a portion of the address signals to provide a wordline select signal. A wordline selector circuit is coupled to the block decoder and the wordline decoder and configured to receive the block select signal and the wordline select signal and to activate addressed wordlines, where the wordline selector is configured to selectively activate addressed wordlines in the flash transistor array and to provide at least two different operational voltages simultaneously on different wordlines in the flash transistor array to accomplish a predetermined procedure responsive to the procedure signal. In one embodiment, a the address decoder includes a latch structure that latches addressed wordlines and provides operational voltages to the wordlines. In another embodiment, the block decoder and wordline decoder include latch structures that latch the block select signal and the wordline select signal to provide operational voltages to the wordline selector. Advantages of the invention include high accuracy and flexibility to read, erase and program the flash memory.
    • 闪存地址解码器包括多个用于接收多个电压的电压端子,用于接收多个地址信号的地址端子和用于接收过程信号的过程终端。 块解码器耦合到地址终端并且被配置为对部分地址信号进行解码以提供块选择信号。 字线解码器耦合到地址终端,并且被配置为对地址信号的一部分进行解码以提供字线选择信号。 字线选择器电路耦合到块解码器和字线解码器并且被配置为接收块选择信号和字线选择信号并激活寻址字线,其中字线选择器被配置为选择性地激活闪存晶体管阵列中的寻址字线, 以在闪光晶体管阵列中的不同字线上同时提供至少两个不同的操作电压,以响应于过程信号来完成预定的过程。 在一个实施例中,地址解码器包括锁存寻址字线并向字线提供工作电压的锁存结构。 在另一个实施例中,块解码器和字线解码器包括锁存块选择信号和字线选择信号以向字线选择器提供工作电压的锁存结构。 本发明的优点包括读取,擦除和编程闪存的高精度和灵活性。
    • 64. 发明授权
    • Flash memory wordline decoder with overerase repair
    • 闪存字幕解码器,过度修复
    • US5822252A
    • 1998-10-13
    • US676066
    • 1996-07-05
    • Peter W. LeeHsing-Ya TsaoFu-Chang Hsu
    • Peter W. LeeHsing-Ya TsaoFu-Chang Hsu
    • G11C8/08G11C8/10G11C11/56G11C16/04G11C16/08G11C16/10G11C16/14G11C16/16G11C16/34H01L27/115G11C16/00
    • G11C16/3413G11C11/56G11C11/5621G11C11/5628G11C11/5635G11C11/5642G11C16/0416G11C16/0491G11C16/08G11C16/10G11C16/14G11C16/16G11C16/3404G11C16/3409G11C16/3418G11C16/3427G11C16/3431G11C8/08G11C8/10H01L27/115G11C16/24G11C2211/5642G11C2211/5644G11C2216/20G11C7/1006G11C7/18G11C8/00G11C8/14
    • The invention provides a flash memory and decoder with overerase repair that can provide three word line voltages to overcome the overerased problems. The wordline decoder includes a wordline latch that provides a high flexibility of erasing size so that single/multiple sub-wordlines, single/multiple wordlines, single/multiple block, and whole array can be erased simultaneously. An exemplary embodiment of a flash memory wordline decoder that can provide three voltages includes a plurality of voltage terminals to receive a plurality of voltages, a plurality of address terminals to receive a plurality of address signals, a procedure terminal to receive a procedure signal, and a plurality of output wordlines adapted to be coupled to a bank of flash transistors. The wordline decoder circuit is configured to decode the address signals and includes a plurality of latches coupled to the wordlines and configured to latch the wordlines and to provide one of a plurality of operational voltages on the wordlines to accomplish a predetermined operation responsive to the procedure signal. The plurality of voltage terminals are configured in a way that the high voltage required for erasure or for programming needs not be discharged in verification. Another exemplary embodiment provides a wordline decoder that provides three wordline voltages for verification and repairing, and also for erasure. Advantages of the invention include available full verifications for erasure, repairing and programming, tight cell threshold distribution, high efficiency repairing, no discharging the high voltage cells in verifications, full range verification voltages.
    • 本发明提供了具有过度修复的闪存和解码器,其可以提供三个字线电压以克服过度存在的问题。 字线解码器包括字线锁存器,其提供擦除大小的高灵活性,使得可以同时擦除单个/多个子字线,单个/多个字线,单个/多个块和整个阵列。 可以提供三个电压的闪存字线解码器的示例性实施例包括多个用于接收多个电压的电压端子,多个地址端子以接收多个地址信号,接收过程信号的过程终端,以及 适于耦合到一组闪存晶体管的多个输出字线。 字线解码器电路被配置为对地址信号进行解码,并且包括耦合到字线的多个锁存器,并被配置为锁存字线并且在字线上提供多个工作电压中的一个,以响应于过程信号来完成预定的操作 。 多个电压端子被配置为在验证中不需要消除擦除或编程所需的高电压。 另一示例性实施例提供一种字线解码器,其提供用于验证和修复的三个字线电压,并且还用于擦除。 本发明的优点包括用于擦除,修复和编程的可用的完整验证,紧密的单元阈值分布,高效率修复,在验证中不排放高电压单元,全范围验证电压。
    • 65. 发明授权
    • Multistate prom and decompressor
    • 多状态和解压缩器
    • US5572462A
    • 1996-11-05
    • US510259
    • 1995-08-02
    • Peter W. Lee
    • Peter W. Lee
    • G11C11/56
    • G11C11/5692G11C11/56G11C7/1006
    • A multistate PROM and decompressor comprises a PROM array including a plurality of cells arranged to have a plurality of wordlines and a plurality of bitlines, where each cell is configured to have one of a plurality of threshold voltages (Vt0-Vtn). A Vt-detector is coupled to the PROM array and configured to receive a high voltage wordline (WLHV) signal that is ramped from a first voltage (e.g. 0V or ground) to a second voltage (e.g. Vtmax). The Vt-detector is configured to compare the WLHV signal to a plurality of predetermined thresholds and to output a detector word in response to the WLHV signal. An addressed memory cell is selected by a wordline select signal and a bitline select signal. A wordline selector is coupled to the PROM array and configured to receive the WLHV signal. The wordline selector communicates the WLHV signal to a selected wordline in response to the wordline select signal. A bitline selector is coupled to the PROM array and configured to select a selected bitline carrying a bitline signal in response to the bitline select signal. A decompressor is coupled to the Vt-detector and the bitline selector and is configured to receive the detector word and the bitline signal. When the WLHV signal voltage meets the addressed cell's voltage threshold, the addressed memory cell is turned on and the selected bitline signal is activated. Then, the detector word is latched into the decompressor and the data stored in the addressed memory cell is delivered to an output terminal. The first embodiment can be combined with a pump generator. A pump generator delivers a relatively high voltage to the WLHV signal input in order to permit a greater expanse among the operational voltage or current levels. This feature increases the range over which the selectable voltages operate. An advantage of this approach is that there is a greater chance of correct interpretation by the Vt-detector and decompressor.
    • 多状态PROM和解压缩器包括PROM阵列,其包括被布置为具有多个字线和多个位线的多个单元,其中每个单元被配置为具有多个阈值电压(Vt0-Vtn)中的一个。 Vt检测器耦合到PROM阵列并且被配置为接收从第一电压(例如0V或接地)斜坡到第二电压(例如Vtmax)的高电压字线(WLHV)信号。 Vt检测器被配置为将WLHV信号与多个预定阈值进行比较,并且响应于WLHV信号输出检测器字。 寻址的存储单元由字线选择信号和位线选择信号选择。 字线选择器耦合到PROM阵列并被配置为接收WLHV信号。 字线选择器响应于字线选择信号将WLHV信号传送到所选择的字线。 位线选择器耦合到PROM阵列并且被配置为响应于位线选择信号来选择携带位线信号的选定位线。 解压缩器耦合到Vt检测器和位线选择器,并被配置为接收检测器字和位线信号。 当WLHV信号电压满足寻址单元的电压阈值时,寻址的存储单元导通,并且所选择的位线信号被激活。 然后,检测器字被锁存到解压缩器中,并且存储在寻址的存储单元中的数据被传送到输出端。 第一实施例可以与泵发生器组合。 泵发生器向WLHV信号输入端提供相对高的电压,以便允许在工作电压或电流水平之间更大的扩展。 该功能增加了可选电压工作的范围。 这种方法的一个优点是Vt检测器和解压缩器有更正确的解释机会。
    • 69. 发明授权
    • Method and apparatus for operation of a NAND-like dual charge retaining transistor NOR flash memory device
    • 用于操作NAND类双电荷保持晶体管NOR闪存器件的方法和装置
    • US08355287B2
    • 2013-01-15
    • US12806848
    • 2010-08-23
    • Fu-Chang HsuPeter W. Lee
    • Fu-Chang HsuPeter W. Lee
    • G11C16/06G11C16/04
    • G11C16/0458G11C11/5628G11C11/5635G11C16/10G11C16/16G11C16/344G11C16/3445G11C16/3454G11C16/3459G11C16/3463G11C16/3477G11C2211/5621
    • A method and apparatus for operation for the NAND-like dual charge retaining transistor NOR flash memory cells begins by erasing, verifying over-erasing the threshold voltage level of the erased charge retaining transistors to an erased threshold voltage level. Then method progresses by programming one of two charge retaining transistors of the NAND-like dual charge retaining transistor NOR flash memory cells to a first programmed threshold voltage level, and programming the other of the two charge retaining transistors of the NAND-like dual charge retaining transistor NOR flash memory cells to the first programmed threshold voltage level or to a second programmed threshold voltage level. Combinations of the erased threshold voltage level and the first and second programmed threshold voltage levels determine an internal data state of the NAND-like dual charge retaining transistor NOR flash memory cells which are then decoded to ascertain the external data logical state.
    • 用于NAND类型的双电荷保持晶体管NOR闪存单元的操作的方法和装置开始于擦除,验证将擦除的电荷保持晶体管的阈值电压电平擦除为已擦除的阈值电压电平。 然后,通过将NAND类双电荷保持晶体管NOR闪存单元的两个电荷保持晶体管中的一个编程为第一编程阈值电压电平,并编程NAND类似的双电荷保持的两个电荷保持晶体管中的另一个来进行方法 晶体管NOR闪存单元到第一编程阈值电压电平或第二编程阈值电压电平。 擦除阈值电压电平和第一和第二编程阈值电压电平的组合确定NAND类似的双电荷保持晶体管NOR闪存单元的内部数据状态,然后对其进行解码以确定外部数据逻辑状态。