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1. 发明授权

US06660585B1 Stacked gate flash memory cell with reduced disturb conditions 有权
标题翻译：具有减少干扰条件的堆叠式门闪存单元
公开(公告)号：US06660585B1
公开(公告)日：2003-12-09
申请号：US09531787
申请日：2000-03-21
申请人： Peter W. Lee , Hsing-Ya Tsao , Vei-Han Chan , Hung-Sheng Chen , Fu-Chang Hsu
发明人： Peter W. Lee , Hsing-Ya Tsao , Vei-Han Chan , Hung-Sheng Chen , Fu-Chang Hsu
IPC分类号： H01L21336
CPC分类号： H01L29/66825 , G11C16/0416 , H01L21/28273
摘要： In this invention a stacked gate flash memory cell is disclosed which has a lightly doped drain (LDD) on the drain side of the device and uses the source to both program using hot electron generation and erase the floating gate using Fowler-Nordheim-tunneling. Disturb conditions are reduced by taking advantage of the LDD and the biasing of the cell that uses the source for both programming and erasure. The electric field of the drain is greatly reduced as a result of the LDD which reduces hot electron generation. The LDD also helps reduce bit line disturb conditions during programming. A transient bit line disturb condition in a non-selected cell is minimized by preconditioning the bit line to the non-selected cell to Vcc.
摘要翻译：在本发明中，公开了一种堆叠栅极闪存单元，其在器件的漏极侧具有轻掺杂漏极（LDD），并且使用源使用热电子发生进行编程并使用Fowler-Nordheim隧道擦除浮动栅极。通过利用LDD和使用源进行编程和擦除的单元的偏置来减少干扰条件。作为减少热电子产生的LDD的结果，漏极的电场大大减小。 LDD还有助于在编程期间减少位线干扰条件。通过将未选择的单元的位线预处理为Vcc，使未选择的单元中的瞬态位线干扰条件最小化。

2. 发明授权

US06891221B2 Array architecture and process flow of nonvolatile memory devices for mass storage applications 有权
标题翻译：用于大容量存储应用的非易失性存储器件的阵列架构和处理流程
公开(公告)号：US06891221B2
公开(公告)日：2005-05-10
申请号：US10790578
申请日：2004-03-01
申请人： Peter W. Lee , Hung-Sheng Chen , Vei-Han Chan
发明人： Peter W. Lee , Hung-Sheng Chen , Vei-Han Chan
IPC分类号： G11C16/04 , H01L21/8247 , H01L27/115 , H01L29/788
CPC分类号： H01L27/11521 , G11C16/0425 , G11C16/0491 , H01L27/115
摘要： In this invention a process for a flash memory cell and an architecture for using the flash memory cell is disclosed to provide a nonvolatile memory having a high storage density. Adjacent columns of cells share the same source and the source line connecting these sources runs vertically in the memory layout, connecting to the sources of adjacent columns memory cells. Bit lines connect to drains of cells in adjacent columns and are laid out vertically, alternating with source lines in an every other column scheme. Wordlines made of a second layer of polysilicon form control gates of the flash memory cells and are continuous over the full width of a memory partition. Programming is done in a vertical page using hot electrons to inject charge onto the floating gates. the cells are erased using Fowler-Nordheim tunneling of electrons from the floating gate to the control gate by way of inter polysilicon oxide formed on the walls of the floating gates.
摘要翻译：在本发明中，公开了一种用于闪存单元的方法和用于使用闪存单元的架构，以提供具有高存储密度的非易失性存储器。单元格的相邻列共享相同的源，并且连接这些源的源行在存储器布局中垂直运行，连接到相邻列存储单元的源。位线连接到相邻列中的单元格的漏极，并且在每个其他列方案中垂直布置，与源极线交替。由第二层多晶硅制成的字线形成闪存单元的控制栅极，并且在存储器分区的整个宽度上是连续的。使用热电子在垂直页面中进行编程，以将电荷注入到浮动栅极上。通过使用Fowler-Nordheim从浮置栅极到控制栅极的隧道，通过在浮栅的壁上形成的多晶硅氧化物来消除电池。

3. 发明授权

US06717846B1 Non-volatile semiconductor memory having split-gate memory cells mirrored in a virtual ground configuration 有权
标题翻译：具有镜像在虚拟接地配置中的分离门存储器单元的非易失性半导体存储器
公开(公告)号：US06717846B1
公开(公告)日：2004-04-06
申请号：US09696085
申请日：2000-10-26
申请人： Peter W. Lee , Hung-Sheng Chen , Vei-Han Chan
发明人： Peter W. Lee , Hung-Sheng Chen , Vei-Han Chan
IPC分类号： G11C1616
CPC分类号： H01L27/11521 , G11C16/0425 , G11C16/0491 , H01L27/115
摘要： In this invention a process for a flash memory cell and an architecture for using the flash memory cell is disclosed to provide a nonvolatile memory having a high storage density. Adjacent columns of cells share the same source and the source line connecting these sources runs vertically in the memory layout, connecting to the sources of adjacent columns memory cells. Bit lines connect to drains of cells in adjacent columns and are laid out vertically, alternating with source lines in an every other column scheme. Wordlines made of a second layer of polysilicon form control gates of the flash memory cells and are continuous over the full width of a memory partition. Programming is done in a vertical page using hot electrons to inject charge onto the floating gates. The cells are crased using Fowler-Nordheim tunneling of electrons from the floating gate to the control gate by way of inter polysilicon oxide formed on the walls of the floating gates.
摘要翻译：在本发明中，公开了一种用于闪存单元的方法和用于使用闪存单元的架构，以提供具有高存储密度的非易失性存储器。单元格的相邻列共享相同的源，并且连接这些源的源行在存储器布局中垂直运行，连接到相邻列存储单元的源。位线连接到相邻列中的单元格的漏极，并且在每个其他列方案中垂直布置，与源极线交替。由第二层多晶硅制成的字线形成闪存单元的控制栅极，并且在存储器分区的整个宽度上是连续的。使用热电子在垂直页面中进行编程，以将电荷注入到浮动栅极上。使用Fowler-Nordheim，通过在浮栅的壁上形成的多晶硅氧化物，利用Fowler-Nordheim将浮动栅极的电子隧穿到控制栅极进行电池堆积。

4. 发明授权

US06258668B1 Array architecture and process flow of nonvolatile memory devices for mass storage applications 有权
标题翻译：用于大容量存储应用的非易失性存储器件的阵列架构和处理流程
公开(公告)号：US06258668B1
公开(公告)日：2001-07-10
申请号：US09487501
申请日：2000-01-19
申请人： Peter W. Lee , Hung-Sheng Chen , Vei-Han Chan
发明人： Peter W. Lee , Hung-Sheng Chen , Vei-Han Chan
IPC分类号： H01L21336
CPC分类号： H01L27/11521 , G11C16/0425 , G11C16/0491 , H01L27/115
摘要： In this invention a process for a flash memory cell and an architecture for using the flash memory cell is disclosed to provide a nonvolatile memory having a high storage density. Adjacent columns of cells share the same source and the source line connecting these sources runs vertically in the memory layout, connecting to the sources of adjacent columns memory cells. Bit lines connect to drains of cells in adjacent columns and are laid out vertically, alternating with source lines in an every other column scheme. Wordlines made of a second layer of polysilicon form control gates of the flash memory cells and are continuous over the full width of a memory partition. Programming is done in a vertical page using hot electrons to inject charge onto the floating gates. the cells are erased using Fowler-Nordheim tunneling of electrons from the floating gate to the control gate by way of inter polysilicon oxide formed on the walls of the floating gates.
摘要翻译：在本发明中，公开了一种用于闪存单元的方法和用于使用闪存单元的架构，以提供具有高存储密度的非易失性存储器。单元格的相邻列共享相同的源，并且连接这些源的源行在存储器布局中垂直运行，连接到相邻列存储单元的源。位线连接到相邻列中的单元格的漏极，并且在每个其他列方案中垂直布置，与源极线交替。由第二层多晶硅制成的字线形成闪存单元的控制栅极，并且在存储器分区的整个宽度上是连续的。使用热电子在垂直页面中进行编程，以将电荷注入到浮动栅极上。通过使用Fowler-Nordheim从浮置栅极到控制栅极的隧道，通过在浮栅的壁上形成的多晶硅氧化物来消除电池。

5. 发明授权

US6134150A Erase condition for flash memory 有权
标题翻译：擦除闪存的条件
公开(公告)号：US6134150A
公开(公告)日：2000-10-17
申请号：US360315
申请日：1999-07-23
申请人： Fu-Chang Hsu , Hsing-Ya Tsao , Peter W. Lee , Vei-Han Chan , Hung-Sheng Chen
发明人： Fu-Chang Hsu , Hsing-Ya Tsao , Peter W. Lee , Vei-Han Chan , Hung-Sheng Chen
IPC分类号： G11C16/14 , G11C7/00
CPC分类号： G11C16/14
摘要： In the present invention a flash memory configuration is disclosed that eliminates the need for one of two pump circuits that are commonly required to support an erase function of memory cells on a flash memory chip. The flash memory cells are placed into a triple well structure with a P-well contained within a deep N-well that resides on a P-substrate. The bias voltages for erase of the flash memory cells are chosen so as to require only one voltage pump circuit to be included in the flash memory chip. The chip bias, V.sub.DD, is used for the source of the memory cells and a negative gate voltage is raised in magnitude to maintain the efficiency of the erase operation. The P-well is biased with a negative voltage that is sufficient to prevent the high negative voltage connected to the gate from causing breakdown in word line decoder circuits. The deep N-well and the P-substrate are biased such as to back bias the P/N junctions between the triple well structure.
摘要翻译：在本发明中，公开了一种闪存配置，其不需要通常需要两个泵电路之一来支持闪存芯片上的存储器单元的擦除功能。将闪存单元置于三阱结构中，其中P阱包含在驻留在P基底上的深N阱内。选择用于擦除闪存单元的偏置电压，以便仅需要将一个电压泵电路包括在闪存芯片中。芯片偏置VDD用于存储单元的源极，负栅极电压上升幅度以保持擦除操作的效率。 P阱被施加负电压，该负电压足以防止连接到栅极的高负电压引起字线解码器电路中的击穿。深N阱和P衬底被偏置，以便反向偏置三阱结构之间的P / N结。

6. 发明授权

US08996785B2 NAND-based hybrid NVM design that integrates NAND and NOR in 1-die with serial interface 有权
标题翻译：基于NAND的混合NVM设计，将NAND和NOR与1串口串行接口集成
公开(公告)号：US08996785B2
公开(公告)日：2015-03-31
申请号：US12807997
申请日：2010-09-17
申请人： Peter W. Lee , Fu-Chang Hsu , Kesheng Wang
发明人： Peter W. Lee , Fu-Chang Hsu , Kesheng Wang
IPC分类号： G06F12/00 , G11C16/32 , G11C16/04
CPC分类号： G11C16/32 , G11C16/0408
摘要： A nonvolatile memory device includes multiple independent nonvolatile memory arrays that concurrently for parallel reading and writing the nonvolatile memory arrays. A serial interface communicates commands, address, device status, and data between a master device and nonvolatile memory arrays for concurrently reading and writing of the nonvolatile memory arrays and sub-arrays. Data is transferred on the serial interface at the rising edge and the falling edge of the synchronizing clock. The serial interface transmits a command code and an address code from a master device and transfers a data code between the master device and the nonvolatile memory device, wherein the data code has a length that is determined by the command code and a location determined by the address code. Reading one nonvolatile memory array may be interrupted for reading another. One reading operation has two sub-addresses with one transferred prior to a command.
摘要翻译：非易失性存储器件包括多个独立的非易失性存储器阵列，用于并行读写非易失性存储器阵列。串行接口在主设备和非易失性存储器阵列之间传送命令，地址，设备状态和数据，用于同时读写非易失性存储器阵列和子阵列。数据在同步时钟的上升沿和下降沿在串行接口上传输。串行接口从主设备发送命令代码和地址代码，并在主设备和非易失性存储设备之间传送数据代码，其中数据代码具有由命令代码确定的长度和由地址代码读取一个非易失性存储器阵列可能会中断读取另一个。一次读取操作具有两个子地址，一个命令之前传送一个。

7. 发明授权

US08237212B2 Nonvolatile memory with a unified cell structure 有权
标题翻译：具有统一单元结构的非易失性存储器
公开(公告)号：US08237212B2
公开(公告)日：2012-08-07
申请号：US13072281
申请日：2011-03-25
申请人： Peter W. Lee , Fu-Chang Hsu , Hsing-Ya Tsao , Han-Rei Ma , Koucheng Wu
发明人： Peter W. Lee , Fu-Chang Hsu , Hsing-Ya Tsao , Han-Rei Ma , Koucheng Wu
IPC分类号： H01L29/788
CPC分类号： H01L27/115 , G11C11/005 , G11C16/0408 , G11C16/0416 , G11C16/0433 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , H01L27/11519 , H01L27/11521 , H01L27/11524
摘要： A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
摘要翻译：公开了一种新颖的基于FLASH的EEPROM单元，解码器和布局方案，以消除单元阵列中的面积消耗的划分三阱，并允许字节擦除和字节程序用于高P / E周期。此外，用于EEPROM部件的处理兼容FLASH单元可以与FLASH和ROM部件集成，从而实现了优异的组合，单片，非易失性存储器。与所有以前的技术不同，ROM，EEPROM和FLASH本发明的新颖的组合非易失性存储器或任何两个的组合由一个统一的，完全兼容的，高度可扩展的BN +单元和统一过程组成。此外，其单元操作方案在P / E操作期间具有零阵列开销和零扰动。该新颖的组合非易失性存储器旨在满足那些需要灵活的写入大小（以字节，页面和块为单位）以低成本的市场的需求。

8. 发明授权

US07915092B2 Nonvolatile memory with a unified cell structure 有权
标题翻译：具有统一单元结构的非易失性存储器
公开(公告)号：US07915092B2
公开(公告)日：2011-03-29
申请号：US12001647
申请日：2007-12-12
申请人： Peter W. Lee , Fu-Chang Hsu , Hsing-Ya Tsao , Han-Rei Ma , Koucheng Wu
发明人： Peter W. Lee , Fu-Chang Hsu , Hsing-Ya Tsao , Han-Rei Ma , Koucheng Wu
IPC分类号： H01L21/82
CPC分类号： H01L27/115 , G11C11/005 , G11C16/0408 , G11C16/0416 , G11C16/0433 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , H01L27/11519 , H01L27/11521 , H01L27/11524
摘要： A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
摘要翻译：公开了一种新颖的基于FLASH的EEPROM单元，解码器和布局方案，以消除单元阵列中的面积消耗的划分三阱，并允许字节擦除和字节程序用于高P / E周期。此外，用于EEPROM部件的处理兼容FLASH单元可以与FLASH和ROM部件集成，从而实现了优异的组合，单片，非易失性存储器。与所有以前的技术不同，ROM，EEPROM和FLASH本发明的新颖的组合非易失性存储器或任何两个的组合由一个统一的，完全兼容的，高度可扩展的BN +单元和统一过程组成。此外，其单元操作方案在P / E操作期间具有零阵列开销和零扰动。该新颖的组合非易失性存储器旨在满足那些需要灵活的写入大小（以字节，页面和块为单位）以低成本的市场的需求。

9. 发明申请

US20110072201A1 Novel NAND-based hybrid NVM design that integrates NAND and NOR in 1-die with serial interface 有权
标题翻译：新型基于NAND的混合NVM设计，将NAND和NOR集成在1-die与串行接口中
公开(公告)号：US20110072201A1
公开(公告)日：2011-03-24
申请号：US12807997
申请日：2010-09-17
申请人： Peter W. Lee , Fu-Chang Hsu , Kesheng Wang
发明人： Peter W. Lee , Fu-Chang Hsu , Kesheng Wang
IPC分类号： G06F12/02 , G11C16/06
CPC分类号： G11C16/32 , G11C16/0408
摘要： A nonvolatile memory device includes multiple independent nonvolatile memory arrays that concurrently for parallel reading and writing the nonvolatile memory arrays. A serial interface communicates commands, address, device status, and data between a master device and nonvolatile memory arrays for concurrently reading and writing of the nonvolatile memory arrays and sub-arrays. Data is transferred on the serial interface at the rising edge and the falling edge of the synchronizing clock. The serial interface transmits a command code and an address code from a master device and transfers a data code between the master device and the nonvolatile memory device, wherein the data code has a length that is determined by the command code and a location determined by the address code. Reading one nonvolatile memory array may be interrupted for reading another. One reading operation has two sub-addresses with one transferred prior to a command.
摘要翻译：非易失性存储器件包括多个独立的非易失性存储器阵列，用于并行读写非易失性存储器阵列。串行接口在主设备和非易失性存储器阵列之间传送命令，地址，设备状态和数据，用于同时读写非易失性存储器阵列和子阵列。数据在同步时钟的上升沿和下降沿在串行接口上传输。串行接口从主设备发送命令代码和地址代码，并在主设备和非易失性存储设备之间传送数据代码，其中数据代码具有由命令代码确定的长度和由地址代码读取一个非易失性存储器阵列可能会中断读取另一个。一次读取操作具有两个子地址，一个命令之前传送一个。

10. 发明申请

US20080247230A1 Novel monolithic, combo nonvolatile memory allowing byte, page and block write with no disturb and divided-well in the cell array using a unified cell structure and technology with a new scheme of decoder and layout 有权
标题翻译：新颖的单片，组合非易失性存储器允许字节，页和块写入，在单元阵列中没有干扰和分割，使用统一的单元结构和技术与解码器和布局的新方案
公开(公告)号：US20080247230A1
公开(公告)日：2008-10-09
申请号：US11483241
申请日：2006-07-07
申请人： Peter W. Lee , Fu-Chang Hsu , Hsing-Ya Tsao , Han-Rei Ma , Koucheng Wu
发明人： Peter W. Lee , Fu-Chang Hsu , Hsing-Ya Tsao , Han-Rei Ma , Koucheng Wu
IPC分类号： G11C16/06 , H01L21/336
CPC分类号： H01L27/115 , G11C11/005 , G11C16/0408 , G11C16/0416 , G11C16/0433 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , H01L27/11519 , H01L27/11521 , H01L27/11524
摘要： A novel FLASH-based EEPROM cell, decoder, and layout scheme are disclosed to eliminate the area-consuming divided triple-well in cell array and allows byte-erase and byte-program for high P/E cycles. Furthermore, the process-compatible FLASH cell for EEPROM part can be integrated with FLASH and ROM parts so that a superior combo, monolithic, nonvolatile memory is achieved. Unlike all previous arts, the novel combo nonvolatile memory of the present invention of ROM, EEPROM and FLASH or combination of any two is made of one unified, fully compatible, highly-scalable BN+ cell and unified process. In addition, its cell operation schemes have zero array overhead and zero disturbance during P/E operations. The novel combo nonvolatile memory is designed to meet the need in those markets requiring flexible write size in units of bytes, pages and blocks at a lower cost.
摘要翻译：公开了一种新颖的基于FLASH的EEPROM单元，解码器和布局方案，以消除单元阵列中的面积消耗的划分三阱，并允许字节擦除和字节程序用于高P / E周期。此外，用于EEPROM部件的处理兼容FLASH单元可以与FLASH和ROM部件集成，从而实现了优异的组合，单片，非易失性存储器。与所有以前的技术不同，ROM，EEPROM和FLASH本发明的新颖的组合非易失性存储器或任何两个的组合由一个统一的，完全兼容的，高度可扩展的BN +单元和统一过程组成。此外，其单元操作方案在P / E操作期间具有零阵列开销和零扰动。该新颖的组合非易失性存储器旨在满足那些需要灵活的写入大小（以字节，页面和块为单位）以低成本的市场的需求。

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