会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 63. 发明授权
    • Volatile memory device and method of refreshing same
    • 易失性存储器件及刷新方法
    • US5742554A
    • 1998-04-21
    • US685859
    • 1996-07-24
    • Shinya Fujioka
    • Shinya Fujioka
    • G11C11/406G11C11/407G11C7/00G11C8/00
    • G11C11/406
    • A volatile memory device or a refreshing method for refreshing information stored in a plurality of memory cells, comprises: a plurality of banks each having a plurality of cell array blocks each of which have a plurality of memory cells and a decoder portion for selecting the memory cells; an address buffer being supplied with an address signal; and a plurality of predecoders associated respectively with the banks, for being supplied with an output signal from the address buffer and supplying predecoded signals to the associated banks. When the volatile memory device is refreshed, the predecoder associated with one of the banks which is selected is activated, and a plurality of cell array blocks in the selected bank are simultaneously selected, and the predecoders associated with the banks which are unselected are inactivated. According to the present invention, the high speed refresh and low power consumption can be realized.
    • 一种用于刷新存储在多个存储器单元中的信息的易失性存储器件或刷新方法,包括:多个存储体,每个存储体具有多个单元阵列块,每个单元阵列块具有多个存储单元;以及解码器部分,用于选择存储器 细胞; 地址缓冲器被提供有地址信号; 以及分别与存储体相关联的多个预解码器,用于从地址缓冲器提供输出信号,并向相关联的存储体提供预解码信号。 当易失性存储器件被刷新时,与所选择的一个存储体相关联的预解码器被激活,并且同时选择所选存储体中的多个单元阵列块,并且与未被选择的存储体相关联的预解码器被去激活。 根据本发明,可以实现高速刷新和低功耗。
    • 65. 发明授权
    • Memory system and method that changes voltage and frequency
    • 改变电压和频率的存储器系统和方法
    • US08149644B2
    • 2012-04-03
    • US12257799
    • 2008-10-24
    • Shinya FujiokaYasuyuki Eguchi
    • Shinya FujiokaYasuyuki Eguchi
    • G11C8/00
    • G11C11/4076G11C7/1051G11C7/1057G11C7/1066G11C11/4074G11C2207/2227
    • The memory system includes a semiconductor memory that has an internal circuit, which operates according to a first power supply voltage, and a memory input/output circuit coupled to the internal circuit and operates according to a second power supply voltage, a first control unit that includes a control input/output circuit, coupled to the memory input/output circuit and operates according to the second power supply voltage, a voltage generating unit that generates the second power supply voltage and changes the second power supply voltage according to a voltage adjustment signal, a clock generating unit that generates the clock signal and changes the frequency of the clock signal according to a clock adjustment signal, and a second control unit that generates the voltage adjustment signal and the clock adjustment signal according to an access state of the semiconductor memory by the first control unit.
    • 存储器系统包括具有根据第一电源电压工作的内部电路的半导体存储器和耦合到内部电路并根据第二电源电压进行操作的存储器输入/输出电路,第一控制单元, 包括耦合到存储器输入/输出电路并根据第二电源电压进行操作的控制输入/输出电路,产生第二电源电压并根据电压调节信号改变第二电源电压的电压产生单元 时钟发生单元,其产生时钟信号并根据时钟调整信号改变时钟信号的频率;以及第二控制单元,其根据半导体存储器的访问状态产生电压调整信号和时钟调整信号 由第一控制单元。
    • 67. 发明授权
    • Semiconductor integrated circuit and method for testing the same
    • 半导体集成电路及其测试方法
    • US06971052B2
    • 2005-11-29
    • US10255671
    • 2002-09-27
    • Hiroyoshi TsuboiShinya Fujioka
    • Hiroyoshi TsuboiShinya Fujioka
    • G01R31/28G01R31/3181G01R31/3185G11C29/00G11C29/46H01L21/822H01L27/04
    • G11C29/46G01R31/3181
    • When a test command is received n times, any one of a plurality of tests is started. After the first test is started, any one of the tests is started or terminated every time the test command is received a predetermined number of times which is less than the n times. The number of times of the test command supplied to start or terminate the second and subsequent tests can be less than that of the first test. Accordingly, the time of the second and subsequent tests can be shortened. Since the first test is started only when the test command is received n times, the test is not started accidentally due to noise or the like in normal operation. Namely, the test time can be shortened without decreasing the operation reliability of an integrated circuit. Particularly, when a plurality of tests is executed successively, great benefit can be obtained.
    • 当接收到n次测试命令时,开始多个测试中的任何一个。 在第一次测试开始之后,每次接收到测试命令的预定次数小于n次时,任何一个测试都被启动或终止。 提供用于开始或终止第二次和后续测试的测试命令的次数可以小于第一次测试的次数。 因此,可以缩短第二次和随后的测试的时间。 由于仅在接收到n次测试命令时开始第一次测试,因此在正常操作中由于噪音等原因而不会意外启动测试。 也就是说,可以缩短测试时间而不降低集成电路的操作可靠性。 特别地,当连续执行多个测试时,可以获得很大的益处。
    • 69. 发明授权
    • Semiconductor memory
    • 半导体存储器
    • US06324111B1
    • 2001-11-27
    • US09561217
    • 2000-04-28
    • Yasuharu SatoShinya Fujioka
    • Yasuharu SatoShinya Fujioka
    • G11C702
    • G11C11/4091G11C7/06G11C7/065
    • A semiconductor memory includes p-type MOS transistors (11) dispersed in one-to-one correspondence with sense amplifiers (4−1-4−n) to activate their corresponding sense amplifiers, and a p-type MOS transistor (12) to activate the sense amplifiers (4−1-4−n). After the p-type MOS transistors (11) are overdriven by an external voltage (VCC) higher than a memory stored voltage, the p-type MOS transistor (12) is driven by an internal step-down voltage (VII) that is the memory stored voltage. This increases the driving capability per sense amplifier in comparison with a conventional method and further increases the speed of sense operation in comparison with a simple overdriving method.
    • 半导体存储器包括与读出放大器(4-1-4-n)一一对应地分散以激活其对应的读出放大器的p型MOS晶体管(11),以及p型MOS晶体管(12), 激活读出放大器(4-1-4-n)。 在p型MOS晶体管(11)被高于存储器存储电压的外部电压(VCC)驱动之后,p型MOS晶体管(12)由内部降压电压(VII)驱动, 存储电压。 与传统方法相比,这增加了每个读出放大器的驱动能力,并且与简单的过驱动方法相比进一步增加了感测操作的速度。
    • 70. 发明授权
    • Integrated circuit device with input buffer capable of correspondence with highspeed clock
    • 具有与高速时钟对应的输入缓冲器的集成电路器件
    • US06239631B1
    • 2001-05-29
    • US09377104
    • 1999-08-19
    • Shinya FujiokaHiroyoshi Tomita
    • Shinya FujiokaHiroyoshi Tomita
    • H03L700
    • G11C7/1093G06F5/06G11C7/1087G11C7/222H03L7/00
    • One aspect of the present invention is characterized in that an input buffer circuit constitutes either 2 sets, or a plurality of sets relative to 1 input signal, either a pair of complementary internal clocks, or a plurality of internal clocks are generated by frequency-dividing a supplied clock inside the integrated circuit device, and input signals are received and latched either in synchronization with a pair of complementary clocks, or in synchronization with a plurality of clocks in accordance with an input buffer of either 2 sets or a plurality of sets. The output of input buffers of either 2 sets or a plurality of sets are combined by a combining circuit, and supplied internally. An H level or an L level period is set for the internally-generated internal clock so that outputs from the various input buffers are not in contention with one another. According to the present invention, the operation of input buffers of a plurality of sets are synchronized with internal clocks of a slower speed than a supplied clock, thus enabling the reliable receive of input signals.
    • 本发明的一个方面的特征在于,输入缓冲电路构成2组或相对于1个输入信号的多组,一对互补的内部时钟或多个内部时钟通过分频产生 集成电路器件内的提供的时钟和输入信号可以与一对互补时钟同步地接收和锁存,或者根据两组或多组的输入缓冲器与多个时钟同步地被接收和锁存。 2组或多组的输入缓冲器的输出由组合电路组合,并在内部提供。 为内部产生的内部时钟设置一个H电平或一个L电平周期,使得各种输入缓冲器的输出不会相互竞争。 根据本发明,多个组的输入缓冲器的操作与比所提供的时钟慢的内部时钟同步,因此能够可靠地接收输入信号。