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    • 61. 发明授权
    • Low-activation energy silicon-containing resist system
    • 低活化能含硅抗蚀剂体系
    • US06939664B2
    • 2005-09-06
    • US10693199
    • 2003-10-24
    • Wu-Song HuangRobert D. AllenMarie AngelopoulosRanee W. KwongRatnam Sooriyakumaran
    • Wu-Song HuangRobert D. AllenMarie AngelopoulosRanee W. KwongRatnam Sooriyakumaran
    • G03C1/76G03F20060101G03F7/004G03F7/075G03E7/004
    • G03F7/0757G03F7/0045G03F7/0046
    • Inventive silsesquioxane polymers are provided, and resist compositions that contain such silsesquioxane polymers are provided in which at least a portion of the silsesquioxane polymer contains fluorinated moieties, and at least a portion of the silisesquioxane polymer contains pendant solubility inhibiting acid-labile moieties that have low activation energy for acid-catalyzed cleaving, and the presence of high optical density moieties are minimized or avoided. The inventive polymer also contains pendant polar moieties that promote alkaline solubility of the resist in aqueous alkaline solutions. The inventive polymers are particularly useful in positive resist compositions. The invention encompasses methods of using such resist compositions in forming a patterned structure on a substrate, and particularly multilayer (e.g. bilayer) photolithographic methods, which methods are capable of producing high resolution images at wavelengths such as 193 nm and 157 nm.
    • 提供了本发明的倍半硅氧烷聚合物,并且提供了含有这种倍半硅氧烷聚合物的抗蚀剂组合物,其中至少一部分倍半硅氧烷聚合物含有氟化部分,并且至少一部分硅烷倍半硅氧烷聚合物含有侧链溶解性抑制酸不稳定部分, 用于酸催化裂解的活化能和高光密度部分的存在被最小化或避免。 本发明的聚合物还含有侧链极性部分,其促进抗蚀剂在碱性水溶液中的碱溶性。 本发明的聚合物在正性抗蚀剂组合物中特别有用。 本发明包括使用这种抗蚀剂组合物在基底上形成图案化结构的方法,特别是多层(例如双层)光刻方法,该方法能够在诸如193nm和157nm的波长下产生高分辨率图像。
    • 70. 发明授权
    • Solid state extension method
    • 固态扩展方法
    • US6017682A
    • 2000-01-25
    • US979382
    • 1997-11-26
    • Marie AngelopoulosClaudius FegerJeffrey Donald GelormeJane Margaret Shaw
    • Marie AngelopoulosClaudius FegerJeffrey Donald GelormeJane Margaret Shaw
    • G03F7/004G03F7/038G03F7/40
    • G03F7/0387G03F7/0045Y10S430/143Y10S430/167
    • A solid state chain extension method provides for the formation of a solid state film comprised of a high molecular weight polymer by chain extending a deblocked Lewis base with Lewis acid oligomers while the reactants are in a solid state form. In one embodiment, a negative resist is prepared by selectively exposing regions of the solid state film. The Lewis base is deblocked at the exposed regions by a suitable deblocking means. The Lewis acid oligomers and the deblocked Lewis base chain extend at the exposed regions. Development of the film removes the non-polymerized reactants. Optionally, the Lewis acid oligomers, when radiation-cross-linking, are cross-linked with one another prior to deblocking the Lewis base to form a negative resist. The cross-linked oligomers polymerize with the subsequently deblocked base to provide a high molecular weight polymer film. In an alternative embodiment, a positive resist is used by degrading and removing photo-sensitive Lewis acid oligomers using selective exposure lithography techniques and, subsequently, deblocking the Lewis base and chain extending the remaining oligomers with the deblocked Lewis base at the unexposed regions.
    • 固态链延伸方法提供了通过将路易斯酸低聚物链路延伸解链路易斯碱同时反应物呈固态形式形成由高分子量聚合物构成的固态膜。 在一个实施方案中,通过选择性地暴露固态膜的区域来制备负性抗蚀剂。 路易斯碱通过合适的去块装置在暴露区域解封。 路易斯酸低聚物和解封的路易斯碱基链在暴露的区域延伸。 膜的开发除去未聚合的反应物。 任选地,当辐射交联时,路易斯酸低聚物在将路易斯碱解封以形成负性抗蚀剂之前彼此交联。 交联的低聚物与随后的解封底物聚合以提供高分子量聚合物膜。 在替代实施方案中,通过使用选择性曝光光刻技术降解和除去光敏路易斯酸低聚物,然后使路易斯碱和链在未曝光区域上与解封的路易斯碱扩展剩余的低聚物链,使用正性抗蚀剂。