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    • 62. 发明授权
    • System technique for detecting soft errors in statically coupled CMOS logic
    • 用于检测静态耦合CMOS逻辑中的软错误的系统技术
    • US06453431B1
    • 2002-09-17
    • US09346509
    • 1999-07-01
    • Kerry BernsteinAndres BryantWilliam A. KlaasenWilbur David Pricer
    • Kerry BernsteinAndres BryantWilliam A. KlaasenWilbur David Pricer
    • G06K504
    • G11C5/005G06F11/00
    • Circuit for detecting error transients in logic circuits due to atomic events or other non-recurring noise sources includes a first circuit coupled to a data line for sensing a first signal on the data line at a first point in time (T1) and a second circuit coupled to the data line for sensing the first signal on the data line at a second point in time (T2) such that a time difference between T1 and T2 is small enough so that the first signal is still present on the data line in the absence of a perturbation event and such that the time difference between T1 and T2 is large enough so that any such perturbation event is resolved. A compare circuit coupled to the first and second circuits compares the sensing of the first signal by the first and second circuits, and generates an error signal in response to a non-compare.
    • 用于检测由于原子事件或其他非循环噪声源引起的逻辑电路中的错误瞬变的电路包括耦合到数据线的第一电路,用于感测在第一时间点(T1)的数据线上的第一信号,以及第二电路 耦合到数据线,用于在第二时间点(T2)感测数据线上的第一信号,使得T1和T2之间的时间差足够小,使得第一信号在不存在的情况下仍然存在于数据线上 的扰动事件,并且使得T1和T2之间的时间差足够大,使得任何这样的扰动事件被解决。 耦合到第一和第二电路的比较电路比较第一和第二电路对第一信号的感测,并且响应于非比较而产生误差信号。