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    • 52. 发明授权
    • Method and apparatus for utilization of recovered magnesium ammonium phosphate
    • 回收的磷酸镁铵的利用方法和装置
    • US07318896B2
    • 2008-01-15
    • US10564448
    • 2004-07-13
    • Kazuaki ShimamuraToshihiro Tanaka
    • Kazuaki ShimamuraToshihiro Tanaka
    • C02F3/00
    • C02F3/12C02F3/2846C02F3/286C02F2305/06Y02W10/15Y10S210/906
    • A method utilizing inorganic nutrient salts, which are inexpensive and easily usable, for waste water whose aerobic and/or anaerobic biological treatment cannot be established unless inorganic nutrient salts are added, is provided. A method and apparatus are provided for utilizing recovered magnesium ammonium phosphate, characterized by adding the recovered magnesium ammonium phosphate, which has been recovered from a treatment process for organic waste and/or organic waste water treatment, to a biological treatment step comprising an anaerobic treatment step and/or an aerobic treatment step to utilize the recovered magnesium ammonium phosphate as an inorganic nutrient source. Preferably, the recovered magnesium ammonium phosphate is utilized as particles, with its particle size being 0.5 mm or less, and/or the pH of a liquid, to which magnesium ammonium phosphate is added, being 10 or lower.
    • 提供一种利用无机营养盐的方法,该方法是便宜且易于使用的,除非添加有机营养盐,否则无需建立需氧和/或厌氧生物处理的废水。 提供了一种用于利用回收的磷酸镁铵的方法和装置,其特征在于将从有机废物和/或有机废水处理的处理过程中回收的回收的磷酸镁铵添加到包括厌氧处理的生物处理步骤 步骤和/或需氧处理步骤,以利用回收的磷酸镁铵作为无机营养源。 优选地,将回收的磷酸镁铵用作颗粒,其粒度为0.5mm以下,和/或添加了磷酸镁铵的液体的pH为10以下。
    • 60. 发明申请
    • Non-volatil semiconductor memory device and writing method thereof
    • 非挥发性半导体存储器件及其写入方法
    • US20050285181A1
    • 2005-12-29
    • US11147243
    • 2005-06-08
    • Kan YasuiDigh HisamotoToshihiro TanakaTakashi Yamaki
    • Kan YasuiDigh HisamotoToshihiro TanakaTakashi Yamaki
    • G11C16/02G11C16/04G11C16/34H01L21/8247H01L27/10H01L27/115H01L29/423H01L29/788H01L29/792
    • G11C16/3418G11C16/0466G11C16/3427H01L27/115H01L29/4232H01L29/792
    • In a non-volatile semiconductor memory device using a charge storage film, it is intended to prevent a sequence disturb such as an erroneous write or erase of another memory cell on one and same word line which occurs depending on a bias transition path in stand-by state and write state. In connection with rise and fall of a word line bias, the present invention adopts a procedure such that a diffusion region voltage Vs on a memory transistor side is changed, and after the voltage Vs passes a certain intermediate value Vsx, a gate voltage Vmg of the memory transistor is changed. Alternatively, there is adopted a procedure such that the gate voltage Vmg of the memory transistor is changed, and after the voltage Vmg passes a certain intermediate value Vmgx, the diffusion layer voltage Vs on the memory transistor side is changed. The values of Vsx and Vmgx are determined from the magnitude of the electric field in a gate insulating film not causing FN tunneling electron injection that causes a change in threshold voltage and the magnitude of a potential barrier against holes not causing BTBT hot hole injection.
    • 在使用电荷存储膜的非易失性半导体存储器件中,旨在防止在根据独立的偏置过渡路径发生的同一字线上的另一个存储单元的错误写入或擦除的序列干扰, 按状态和写状态。 关于字线偏差的上升和下降,本发明采用使存储晶体管侧的扩散区电压Vs变化的过程,在电压Vs经过一定的中间值Vsx之后,栅极电压Vmg为 存储晶体管被改变。 或者,采用使存储晶体管的栅极电压Vmg改变的过程,并且在电压Vmg经过一定的中间值Vmgx之后,存储晶体管侧的扩散层电压Vs被改变。 Vsx和Vmgx的值由栅极绝缘膜中不引起FN隧穿电子注入的电场的大小确定,导致阈值电压的变化以及针对未引起BTBT热空穴注入的孔的势垒的大小。