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51. 发明申请

US20090278926A1 CALIBRATION METHOD OF ELECTRONIC DEVICE TEST APPARATUS 有权
标题翻译：电子装置测试装置的校准方法
公开(公告)号：US20090278926A1
公开(公告)日：2009-11-12
申请号：US12305075
申请日：2006-12-11
申请人： Aritomo Kikuchi , Hiroto Nakamura , Jinji Tokita , katsuhiko Ikeda
发明人： Aritomo Kikuchi , Hiroto Nakamura , Jinji Tokita , katsuhiko Ikeda
IPC分类号： H04N7/18 , G01R31/02
CPC分类号： G01R31/2891 , G01R35/005
摘要： In an electronic device test apparatus using image processing technology to position an IC device relative to a socket, a calibration method of an electronic device test apparatus of calibrating a relative position of a device camera with respect to a socket, the method comprising: calculating an offset amount of a socket guide with respect to the socket on the basis of a relative position of the socket camera with respect to the socket guide and a relative position of a socket camera with respect to the socket; and adding this offset amount to the relative position of the device camera with respect to the socket guide so as to calculate the relative position of the device camera with respect to the socket.
摘要翻译：在使用图像处理技术将IC器件相对于插座定位的电子设备测试装置中，一种用于校准相机相对于插座的相对位置的电子设备测试设备的校准方法，所述方法包括：基于插座照相机相对于插座引导件的相对位置和插座相机相对于插座的相对位置，插座引导件相对于插座的偏移量; 并将该偏移量加到装置照相机相对于插座引导件的相对位置，以便计算装置相机相对于插座的相对位置。

52. 发明授权

US07459902B2 Electronic device testing apparatus 失效
标题翻译：电子设备检测仪器
公开(公告)号：US07459902B2
公开(公告)日：2008-12-02
申请号：US10512065
申请日：2002-04-25
申请人： Hiroto Nakamura
发明人： Hiroto Nakamura
IPC分类号： G01R31/28 , G01R31/02
CPC分类号： G01R31/2893
摘要： An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested (20) against contact portions (110a) of a test head (110) while holding the electronic devices to be tested (20) on electronic device conveying media (11, 12, 13): wherein the electronic device testing apparatus comprises a test head (100) provided with a plurality of contact groups (111, 112, 113) made by sets of contact portions (100a), and a plurality of moving means capable of controlling independently from each other; and the respective moving means move the electronic device conveying media (11, 12, 13) loaded with the electronic devices to be tested (20) to corresponding contact groups (111, 112, 113) to conduct a test.
摘要翻译：一种电子设备测试设备，用于通过将待测试的电子设备（20）的输入/输出端子抵抗测试头（110）的接触部分（110a）进行测试，同时将待测试的电子设备（20）保持在电子装置输送介质（11,12,13）：其中所述电子装置测试装置包括设置有由一组接触部分（100a）制成的多个接触组（111,112,113）的测试头（100），以及多个移动装置能够彼此独立地进行控制; 并且相应的移动装置将装载有待测试的电子设备（20）的电子设备传送介质（11,12,13）移动到相应的接触组（111,112,113）以进行测试。

53. 发明申请

US20080136864A1 Waste Liquid Recovery Apparatus, Relay and Liquid Jetting Apparatus 有权
标题翻译：废液回收设备，继电器和液体喷射设备
公开(公告)号：US20080136864A1
公开(公告)日：2008-06-12
申请号：US11722430
申请日：2005-12-20
申请人： Hiroto Nakamura , Takahiro Naka
发明人： Hiroto Nakamura , Takahiro Naka
IPC分类号： B41J2/165
CPC分类号： B41J2/16523 , B41J2/1721
摘要： A waste liquid tank is arranged outside a printer. A connection port arranged at an upstream end of a duct extending from the waste liquid tank is connected to a transfer device. The transfer device is connected to a discharge side of a suction pump for drawing in ink from a nozzle of a recording head of the printer through a duct.
摘要翻译：废液箱布置在打印机外部。布置在从废液罐延伸的管道的上游端的连接端口连接到传送装置。传送装置连接到抽吸泵的排出侧，用于通过管道从打印机的记录头的喷嘴吸入墨水。

54. 发明授权

US07371078B2 Insert attachable to an insert magazine of a tray for holding an area array type electronic component to be tested 有权
标题翻译：可插入到用于保持要测试的区域阵列型电子部件的托盘的插入盒中的插入件
公开(公告)号：US07371078B2
公开(公告)日：2008-05-13
申请号：US10780893
申请日：2004-02-19
申请人： Akihiko Ito , Hiroto Nakamura
发明人： Akihiko Ito , Hiroto Nakamura
IPC分类号： H01R12/00
CPC分类号： G01R31/2886 , G01R1/0433 , G01R1/07314 , G01R31/2893
摘要： To attain an object of providing an insert for holding wide-ranging kinds of area array type electronic components and realizing certain connection between external terminals of an area array type electronic component and connection terminals of a socket, and an electronic component testing apparatus and an electronic component testing method using the same, a thin plate 163 for supporting an IC device 2 is positioned between an external terminal face 23 of the IC device 2 and a connection terminal face 42 of a socket 40, and a thickness of the thin plate 163 is made to be approximately equal to or less than a distance between a tip portion of the external terminals 22 and the external terminal face 23.
摘要翻译：为了实现提供用于保持广泛种类的区域阵列型电子部件的插入物并实现区域阵列型电子部件的外部端子和插座的连接端子之间的一定连接的目的，以及电子部件测试装置和电子使用它们的部件测试方法，用于支撑IC器件2的薄板163位于IC器件2的外部端子面23和插座40的连接端子面42之间，薄板163的厚度为被制成大致等于或小于外部端子22的端部与外部端子面23之间的距离。

55. 发明申请

US20060255822A1 Cooling fin connected to a cooling unit and a pusher of the testing apparatus 有权
标题翻译：冷却翅片连接到测试装置的冷却单元和推动器
公开(公告)号：US20060255822A1
公开(公告)日：2006-11-16
申请号：US11483075
申请日：2006-07-10
申请人： Noboru Saito , Hiroyuki Takahashi , Noriyuki Igarashi , Keiichi Fukumoto , Hiroto Nakamura , Yutaka Watanabe , Kenichi Shimada
发明人： Noboru Saito , Hiroyuki Takahashi , Noriyuki Igarashi , Keiichi Fukumoto , Hiroto Nakamura , Yutaka Watanabe , Kenichi Shimada
IPC分类号： G01R31/02
CPC分类号： G01R31/01 , G01R1/0458 , G01R31/2806 , G01R31/2862 , G01R31/2863 , G01R31/2868 , G01R31/2877
摘要： A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the connection terminal so as to connect the electronic device to the connection terminal, and a cooling unit for cooling the electronic device. As the cooling unit, an element cooling the device using electricity is for example used. The cooling unit includes a cooling medium blower for blowing a cooling medium around the electronic device and heat exchange projections or depressions for raising the cooling efficiency by blowing a cooling medium. In the device testing apparatus, even if the electronic device generates heat on its own during testing, the electronic device is cooled through the pusher, connection terminals, or socket, so the effect of the heat generated by the electronic device is canceled out and the electronic device can be tested at the predetermined temperature as prescribed in the specification.
摘要翻译：一种装置测试装置，包括可拆卸地安装有被测试的电子设备的连接端子，用于沿着连接端子的方向推动电子设备以将电子设备连接到连接端子的推动器，以及用于冷却电子设备。作为冷却单元，例如使用电力冷却装置的元件。冷却单元包括用于吹送电子设备周围的冷却介质的冷却介质鼓风机和通过吹送冷却介质而提高冷却效率的热交换突起或凹部。在设备测试装置中，即使电子设备在测试期间自身产生热量，电子设备通过推动器，连接端子或插座被冷却，因此电子设备产生的热量的影响被消除，并且电子设备可以按照说明书中规定的预定温度进行测试。

56. 发明申请

US20050237071A1 Electronic component test apparatus 审中-公开
标题翻译：电子元件测试仪器
公开(公告)号：US20050237071A1
公开(公告)日：2005-10-27
申请号：US10512051
申请日：2002-04-25
申请人： Akihiko Ito , Hiroto Nakamura
发明人： Akihiko Ito , Hiroto Nakamura
IPC分类号： G01R31/28 , H01L21/66 , G01R31/02
CPC分类号： G01R31/2886
摘要： An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested against contact portions of a test head portion (100) while loading the electronic devices to be tested on electronic device conveying media (11, 12, 13, 14) by a moving means: wherein two electronic device conveying media (11, 12) loaded with electronic devices to be tested are gripped by one moving means and two electronic device conveying media (13, 14) loaded with electronic devices to be tested are gripped by the other moving means at a time, and the respective moving means independently conveys to and from the contact groups.
摘要翻译：一种电子设备测试装置，用于在将要测试的电子设备加载到电子设备传送介质（11,12,13）上的同时，将待测试的电子设备的输入/输出端子按压在测试头部分（100）的接触部分上，移动装置：其中装载有待测试的电子装置的两个电子装置输送介质（11,12）由一个移动装置和装载有电子装置的两个电子装置传送介质（13,14）夹持一次测试被其他移动装置夹住，并且相应的移动装置独立地传送到接触组和从接触组传送。

57. 发明申请

US20050162150A1 Electronic device testing apparatus 失效
标题翻译：电子设备检测仪器
公开(公告)号：US20050162150A1
公开(公告)日：2005-07-28
申请号：US10512065
申请日：2002-04-25
申请人： Hiroto Nakamura
发明人： Hiroto Nakamura
IPC分类号： G01R31/28 , H01L21/66 , G01R1/00
CPC分类号： G01R31/2893
摘要： An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested (20) against contact portions (110a) of a test head (110) while holding the electronic devices to be tested (20) on electronic device conveying media (11, 12, 13): wherein the electronic device testing apparatus comprises a test head (100) provided with a plurality of contact groups (111, 112, 113) made by sets of contact portions (100a), and a plurality of moving means capable of controlling independently from each other; and the respective moving means move the electronic device conveying media (11, 12, 13) loaded with the electronic devices to be tested (20) to corresponding contact groups (111, 112, 113) to conduct a test.
摘要翻译：一种用于通过将待测试的电子设备（20）的输入/输出端子抵抗测试头（110）的接触部分（110a）同时保持被测试的电子设备（20）而进行测试的电子设备测试设备电子设备传送介质（11,12,13）：其中电子设备测试设备包括设置有由一组接触部分（100A）制成的多个接触组（111,112,113）的测试头（100）以及能够彼此独立地控制的多个移动装置; 并且相应的移动装置将装载有待测试的电子设备（20）的电子设备传送介质（11,12,13）移动到相应的接触组（111,112,113）以进行测试。

58. 发明申请

US20050036275A1 Insert and electronic component handling apparatus comprising the same 有权
标题翻译：插入物和电子部件处理装置
公开(公告)号：US20050036275A1
公开(公告)日：2005-02-17
申请号：US10780893
申请日：2004-02-19
申请人： Akihiko Ito , Hiroto Nakamura
发明人： Akihiko Ito , Hiroto Nakamura
IPC分类号： G01R31/26 , G01R1/04 , G01R1/073 , G01R31/28 , H02B1/00
CPC分类号： G01R31/2886 , G01R1/0433 , G01R1/07314 , G01R31/2893
摘要： To attain an object of providing an insert for holding wide-ranging kinds of area array type electronic components and realizing certain connection between external terminals of an area array type electronic component and connection terminals of a socket, and an electronic component testing apparatus and an electronic component testing method using the same, a thin plate 163 for supporting an IC device 2 is positioned between an external terminal face 23 of the IC device 2 and a connection terminal face 42 of a socket 40, and a thickness of the thin plate 163 is made to be approximately equal to or less than a distance between a tip portion of the external terminals 22 and the external terminal face 23.
摘要翻译：为了实现提供用于保持广泛种类的区域阵列型电子部件的插入物并实现区域阵列型电子部件的外部端子和插座的连接端子之间的一定连接的目的，以及电子部件测试装置和电子使用它们的部件测试方法，用于支撑IC器件2的薄板163位于IC器件2的外部端子面23和插座40的连接端子面42之间，薄板163的厚度为被制成大致等于或小于外部端子22的端部与外部端子面23之间的距离。

59. 发明授权

US06339321B1 Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatus 失效
标题翻译：电子装置托盘电子装置托盘，输送装置和电子装置试验装置
公开(公告)号：US06339321B1
公开(公告)日：2002-01-15
申请号：US09320691
申请日：1999-05-27
申请人： Kazuyuki Yamashita , Hiroto Nakamura , Shin Nemoto
发明人： Kazuyuki Yamashita , Hiroto Nakamura , Shin Nemoto
IPC分类号： G01R104
CPC分类号： G01R31/2893 , G01R31/01 , G01R31/2851
摘要： An electronic device tray 110 having a plurality of IC holders 14 in which IC chips are held and having a shutter 15 for opening and closing openings of the IC holders 14, the shutter 15 being opened and closed by fluid pressure cylinders etc. provided at an IC tester. Further, a tray vertical carrier 350 for conveying a tray 110 holding IC chips in a substantially vertical direction, including a tray end holding member 310 able to detachably hold an end of the lowermost level tray 110 positioned at the lowermost level among stacked trays 110, a tray elevating member 310 for conveying the lowermost level tray 110 downward or upward, an actuator member 312 for driving the tray end holding member 310 so as to release the hold on the lowermost level tray and then hold the end of another tray 110 next arriving at the lowermost level position when the lowermost level tray 110 is in a state where it can be supported by the tray elevating member 314, and a tray horizontal carrier 320 receiving the lowermost level tray 110 when the tray elevating member 314 descends and able to move in the substantially horizontal direction, the tray horizontal carrier 320 being moved by a drive wire 330.
摘要翻译：具有多个IC保持器14的电子设备托盘110，其中IC芯片被保持在其中，并且具有用于打开和关闭IC保持器14的开口的挡板15，闸门15由流体压力缸等打开和关闭 IC测试仪。此外，托盘垂直托架350用于输送托盘110，托盘110在大致垂直的方向上保持IC芯片，包括托盘端保持构件310，托盘端保持构件310能够可拆卸地保持位于堆叠的托盘110中的最低层的最下层托盘110的端部，用于向下或向上传送最低级托盘110的托盘升降构件310，用于驱动托盘端保持构件310的致动器构件312，以便将保持在最下层托盘上，然后保持另一托盘110的一端到达下一个到达当最低级托盘110处于可由托盘升降构件314支撑的状态下的最低位置处，以及当托盘升降构件314下降并能够移动时托架水平托架320接收最低级托盘110的托盘水平托架320 在大致水平方向上，托盘水平托架320由驱动线330移动。

60. 发明授权

US5973493A Test tray positioning stopper mechanism for automatic handler 失效
标题翻译：测试盘定位止动机构，用于自动处理
公开(公告)号：US5973493A
公开(公告)日：1999-10-26
申请号：US725377
申请日：1996-10-03
申请人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
发明人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
IPC分类号： G01R31/26 , B23Q7/14 , B23Q16/00 , B65G47/88 , G01R31/02 , G01R31/28
CPC分类号： B23Q7/1447 , B23Q16/001 , G01R31/2851 , G01R31/2893
摘要： A mechanism for positioning IC devices to be tested aligned in a test tray of an automatic handler for an IC test system capable of reducing a time for transferring the test tray from a supply area to a test head area which has a plurality of test contactors and from a test head area to a discharge area is disclosed. The mechanism includes a stopper which determines the first stop position of the test tray when said test tray contacts with the outer surface of the test tray and the second stop position of the test tray when said stopper contacts with the end surface of a groove being provided with on its side portion of the test tray to receive and engage with the projection of the stopper. The distance between the adjacent test contactors is adjusted to be equal to two times or integer multiple of the distance between the adjacent IC devices to be tested aligned in the test tray and the distance between the first position and the second position is adjusted to be equal to the distance between the adjacent IC devices to be tested so that minimizing the index time for transferring the test tray becomes possible.
摘要翻译：一种用于将待测试的IC器件定位在用于IC测试系统的自动处理器的测试盘中的机构，其能够减少用于将测试托盘从供应区域传送到具有多个测试接触器的测试头区域的时间，以及从测试头区域到放电区域被公开。所述机构包括：当所述止动件与所述槽的端面接触时，所述止动件确定所述测试托盘与所述测试托盘的外表面和所述测试托盘的第二停止位置接触时所述测试托盘的第一停止位置其在其测试托盘的侧部接收并接合止动器的突起。将相邻的测试接触器之间的距离调整为等于测试托盘中待测试的相邻IC器件之间距离的两倍或整数倍，并将第一位置与第二位置之间的距离调整为相等到待测试的相邻IC器件之间的距离，使得最小化传送测试托盘的索引时间成为可能。

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