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1. 发明授权

US08294759B2 Calibration method of electronic device test apparatus 有权
标题翻译：电子设备测试仪器的校准方法
公开(公告)号：US08294759B2
公开(公告)日：2012-10-23
申请号：US12305075
申请日：2006-12-11
申请人： Aritomo Kikuchi , Hiroto Nakamura , Jinji Tokita , Katsuhiko Ikeda
发明人： Aritomo Kikuchi , Hiroto Nakamura , Jinji Tokita , Katsuhiko Ikeda
IPC分类号： H04N7/18 , H04N9/47
CPC分类号： G01R31/2891 , G01R35/005
摘要： In an electronic device test apparatus using image processing technology to position an IC device relative to a socket, a calibration method of an electronic device test apparatus of calibrating a relative position of a device camera with respect to a socket, the method comprising: calculating an offset amount of a socket guide with respect to the socket on the basis of a relative position of the socket camera with respect to the socket guide and a relative position of a socket camera with respect to the socket; and adding this offset amount to the relative position of the device camera with respect to the socket guide so as to calculate the relative position of the device camera with respect to the socket.
摘要翻译：在使用图像处理技术将IC器件相对于插座定位的电子设备测试装置中，一种用于校准相机相对于插座的相对位置的电子设备测试装置的校准方法，所述方法包括：基于插座照相机相对于插座引导件的相对位置和插座相机相对于插座的相对位置，插座引导件相对于插座的偏移量; 并将该偏移量加到装置照相机相对于插座引导件的相对位置，以便计算装置相机相对于插座的相对位置。

2. 发明申请

US20090278926A1 CALIBRATION METHOD OF ELECTRONIC DEVICE TEST APPARATUS 有权
标题翻译：电子装置测试装置的校准方法
公开(公告)号：US20090278926A1
公开(公告)日：2009-11-12
申请号：US12305075
申请日：2006-12-11
申请人： Aritomo Kikuchi , Hiroto Nakamura , Jinji Tokita , katsuhiko Ikeda
发明人： Aritomo Kikuchi , Hiroto Nakamura , Jinji Tokita , katsuhiko Ikeda
IPC分类号： H04N7/18 , G01R31/02
CPC分类号： G01R31/2891 , G01R35/005
摘要： In an electronic device test apparatus using image processing technology to position an IC device relative to a socket, a calibration method of an electronic device test apparatus of calibrating a relative position of a device camera with respect to a socket, the method comprising: calculating an offset amount of a socket guide with respect to the socket on the basis of a relative position of the socket camera with respect to the socket guide and a relative position of a socket camera with respect to the socket; and adding this offset amount to the relative position of the device camera with respect to the socket guide so as to calculate the relative position of the device camera with respect to the socket.
摘要翻译：在使用图像处理技术将IC器件相对于插座定位的电子设备测试装置中，一种用于校准相机相对于插座的相对位置的电子设备测试设备的校准方法，所述方法包括：基于插座照相机相对于插座引导件的相对位置和插座相机相对于插座的相对位置，插座引导件相对于插座的偏移量; 并将该偏移量加到装置照相机相对于插座引导件的相对位置，以便计算装置相机相对于插座的相对位置。

3. 发明授权

US08941729B2 Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method 有权
标题翻译：电子部件处理装置，电子部件检测装置以及电子部件检测方法
公开(公告)号：US08941729B2
公开(公告)日：2015-01-27
申请号：US13082668
申请日：2011-04-08
申请人： Aritomo Kikuchi , Hiroto Nakamura
发明人： Aritomo Kikuchi , Hiroto Nakamura
IPC分类号： H04N7/18 , G01R31/28
CPC分类号： G01R31/2893 , G01R31/2891
摘要： An electronic device handling apparatus, which handles an electronic device under test having a first main surface provided thereon with first device terminals and a second main surface provided thereon with second device terminals, includes: a contact arm having a holding-side contact arm to which a first socket is attached and a suction pad which holds the electronic device under test; an alignment apparatus which positions the first socket and the electronic device under test; and the alignment apparatus which positions, with respect to a second socket, the electronic device under test being held by the suction pad and contacting the first socket, wherein the contact arm presses the second device terminals of the electronic device under test to the second socket.
摘要翻译：一种电子设备处理装置，其处理被测试的电子设备，其具有设置有第一设备端子的第一主表面和在其上设置有第二设备端子的第二主表面，所述电子设备处理设备包括：接触臂，具有保持侧接触臂，连接第一插座和保持被测电子设备的吸盘; 对准装置，其将第一插座和被测电子装置定位; 以及对准装置，其相对于第二插座定位被测试的电子设备由吸盘保持并接触第一插座，其中接触臂将被测试的电子设备的第二设备端子按压到第二插座。

4. 发明授权

US07471819B2 Position detecting apparatus, a position detecting method and an electronic component carrying apparatus 有权
标题翻译：位置检测装置，位置检测方法和电子部件传送装置
公开(公告)号：US07471819B2
公开(公告)日：2008-12-30
申请号：US11134229
申请日：2005-05-20
申请人： Masayoshi Ichikawa , Aritomo Kikuchi
发明人： Masayoshi Ichikawa , Aritomo Kikuchi
IPC分类号： G06K9/00
CPC分类号： G01R31/2887
摘要： A position detecting apparatus for detecting a position of an electronic component, which includes a terminal, includes an image acquiring unit for acquiring an image of the terminal, a terminal area detecting unit for detecting an area of the terminal from the image acquired by the image acquiring unit and an electronic component position detecting unit for detecting a position of the electronic component based on the area of the terminal detected by the terminal area detecting unit and predetermined terminal information of the electronic component.
摘要翻译：一种用于检测包括终端的电子部件的位置的位置检测装置，包括用于获取终端的图像的图像获取单元，用于从由图像获取的图像中检测终端区域的终端区域检测单元获取单元和电子部件位置检测单元，用于基于由终端区域检测单元检测到的终端的区域和电子部件的预定终端信息来检测电子部件的位置。

5. 发明申请

US20050249397A1 Position detecting apparatus, a position detecting method and an electronic component carrying apparatus 有权
标题翻译：位置检测装置，位置检测方法和电子部件传送装置
公开(公告)号：US20050249397A1
公开(公告)日：2005-11-10
申请号：US11134229
申请日：2005-05-20
申请人： Masayoshi Ichikawa , Aritomo Kikuchi
发明人： Masayoshi Ichikawa , Aritomo Kikuchi
IPC分类号： G01R31/28 , G06K9/00
CPC分类号： G01R31/2887
摘要： A position detecting apparatus for detecting a position of an electronic component, which includes a terminal, includes an image acquiring unit for acquiring an image of the terminal, a terminal area detecting unit for detecting an area of the terminal from the image acquired by the image acquiring unit and an electronic component position detecting unit for detecting a position of the electronic component based on the area of the terminal detected by the terminal area detecting unit and predetermined terminal information of the electronic component.
摘要翻译：一种用于检测包括终端的电子部件的位置的位置检测装置，包括用于获取终端的图像的图像获取单元，用于从由图像获取的图像中检测终端区域的终端区域检测单元获取单元和电子部件位置检测单元，用于基于由终端区域检测单元检测到的终端的区域和电子部件的预定终端信息来检测电子部件的位置。

6. 发明申请

US20100310151A1 ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE POSITION DETECTION METHOD 审中-公开
标题翻译：电子设备处理设备和电子设备位置检测方法
公开(公告)号：US20100310151A1
公开(公告)日：2010-12-09
申请号：US12864742
申请日：2008-12-22
申请人： Aritomo Kikuchi , Tatsumi Koike
发明人： Aritomo Kikuchi , Tatsumi Koike
IPC分类号： G06K9/48 , G06K9/00
CPC分类号： G01R31/2893 , G01R31/2891
摘要： An electronic device handling apparatus, wherein an image of terminals of an electronic device to be tested having the terminals at its end edge portions held by a conveyor device is taken, edges of terminals arranged in the X-axis direction are extracted from data of an taken image and binarization processing is performed on the data, while edges of terminals arranged in the Y-axis direction are extracted from data of the taken image and binarization processing is performed on the data, so that positions of edges of respective terminals are located from the obtained two binary images. Then, a positional deviation amount of the electronic device is calculated by comparing with reference positional information of edges of terminals of a reference electronic device and, based thereon, a posture of the electronic device to be tested is corrected.
摘要翻译：一种电子装置处理装置，其特征在于，在被传送装置保持的末端部分具有端子的待测试电子装置的端子的图像被取出，沿着X轴方向排列的端子的边缘从对数据执行拍摄图像和二值化处理，同时从拍摄图像的数据中提取沿Y轴方向布置的终端的边缘，并对数据执行二值化处理，从而使各个终端的边缘位置从获得两个二进制图像。然后，通过与参考电子设备的端子的参考位置信息进行比较来计算电子设备的位置偏差量，并且基于此来校正待测试的电子设备的姿势。

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